NL1007343A1 - Nieuw fotoresist-copolymeer. - Google Patents

Nieuw fotoresist-copolymeer.

Info

Publication number
NL1007343A1
NL1007343A1 NL1007343A NL1007343A NL1007343A1 NL 1007343 A1 NL1007343 A1 NL 1007343A1 NL 1007343 A NL1007343 A NL 1007343A NL 1007343 A NL1007343 A NL 1007343A NL 1007343 A1 NL1007343 A1 NL 1007343A1
Authority
NL
Netherlands
Prior art keywords
new photoresist
photoresist copolymer
copolymer
new
photoresist
Prior art date
Application number
NL1007343A
Other languages
English (en)
Other versions
NL1007343C2 (nl
Inventor
Jae Chang Jung
Cheol Kyu Bok
Hyung Gi Kim
Original Assignee
Hyundai Electronics Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hyundai Electronics Ind filed Critical Hyundai Electronics Ind
Publication of NL1007343A1 publication Critical patent/NL1007343A1/nl
Application granted granted Critical
Publication of NL1007343C2 publication Critical patent/NL1007343C2/nl

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F8/00—Chemical modification by after-treatment
    • C08F8/30—Introducing nitrogen atoms or nitrogen-containing groups
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
    • Y10S430/1055—Radiation sensitive composition or product or process of making
    • Y10S430/106—Binder containing
    • Y10S430/111—Polymer of unsaturated acid or ester

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Materials For Photolithography (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
NL1007343A 1996-10-24 1997-10-23 Nieuw fotoresist-copolymeer. NL1007343C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1019960047901A KR100211546B1 (ko) 1996-10-24 1996-10-24 신규한 포토레지스트용 공중합체
KR19960047901 1996-10-24

Publications (2)

Publication Number Publication Date
NL1007343A1 true NL1007343A1 (nl) 1998-04-27
NL1007343C2 NL1007343C2 (nl) 1998-06-08

Family

ID=19478680

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1007343A NL1007343C2 (nl) 1996-10-24 1997-10-23 Nieuw fotoresist-copolymeer.

Country Status (9)

Country Link
US (1) US5981142A (nl)
JP (1) JP3147059B2 (nl)
KR (1) KR100211546B1 (nl)
CN (1) CN1099052C (nl)
DE (1) DE19746932B4 (nl)
FR (1) FR2755137B1 (nl)
GB (1) GB2318579B (nl)
NL (1) NL1007343C2 (nl)
TW (1) TW449673B (nl)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5380337A (en) * 1994-01-24 1995-01-10 Romaine; Richard A. Mesh-type skin biopsy appliance
KR100200305B1 (ko) * 1996-06-29 1999-06-15 김영환 원자외선용 감광막 및 이를 이용한 감광막패턴형성방법
KR100263906B1 (ko) * 1998-06-02 2000-09-01 윤종용 백본이 환상구조를 가지는 감광성 폴리머 및 이를 포함하는 레지스트 조성물
KR100642830B1 (ko) * 2004-08-25 2006-11-10 주식회사 삼양이엠에스 양성 레지스트 조성물
KR100597715B1 (ko) * 2004-08-25 2006-07-10 주식회사 삼양이엠에스 음성 레지스트 조성물
US7873058B2 (en) * 2004-11-08 2011-01-18 Mosaid Technologies Incorporated Outlet with analog signal adapter, a method for use thereof and a network using said outlet
KR20080020605A (ko) * 2005-05-30 2008-03-05 가부시키가이샤 가네카 수지 조성물
TWI510372B (zh) * 2010-12-30 2015-12-01 Lg Chemical Ltd 電極、含其之電子裝置及其製造方法
KR102450804B1 (ko) * 2018-02-28 2022-10-06 후지필름 가부시키가이샤 감활성광선성 또는 감방사선성 수지 조성물, 레지스트막, 패턴 형성 방법, 전자 디바이스의 제조 방법, 수지

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3964908A (en) * 1975-09-22 1976-06-22 International Business Machines Corporation Positive resists containing dimethylglutarimide units
US4246374A (en) * 1979-04-23 1981-01-20 Rohm And Haas Company Imidized acrylic polymers
US4524121A (en) * 1983-11-21 1985-06-18 Rohm And Haas Company Positive photoresists containing preformed polyglutarimide polymer
US4569897A (en) * 1984-01-16 1986-02-11 Rohm And Haas Company Negative photoresist compositions with polyglutarimide polymer
US4837124A (en) * 1986-02-24 1989-06-06 Hoechst Celanese Corporation High resolution photoresist of imide containing polymers
US5019488A (en) * 1988-09-29 1991-05-28 Hoechst Celanese Corporation Method of producing an image reversal negative photoresist having a photo-labile blocked imide
JP2875556B2 (ja) * 1989-10-11 1999-03-31 沖電気工業株式会社 半導体素子の製造方法
JPH0459864A (ja) * 1990-06-29 1992-02-26 Sumitomo Chem Co Ltd 熱可塑性樹脂組成物
US5227280A (en) * 1991-09-04 1993-07-13 International Business Machines Corporation Resists with enhanced sensitivity and contrast
FR2696469B1 (fr) * 1992-10-02 1994-12-02 Atochem Elf Sa Procédé de préparation de copolymères glutarimides et composés intermédiaires utiles.
JPH08286384A (ja) * 1995-04-14 1996-11-01 Hitachi Ltd パタン形成方法及びそれに用いるフォトレジスト材料
US5879853A (en) * 1996-01-18 1999-03-09 Kabushiki Kaisha Toshiba Top antireflective coating material and its process for DUV and VUV lithography systems

Also Published As

Publication number Publication date
JP3147059B2 (ja) 2001-03-19
GB9722438D0 (en) 1997-12-24
US5981142A (en) 1999-11-09
DE19746932B4 (de) 2006-05-18
GB2318579B (en) 2000-09-13
NL1007343C2 (nl) 1998-06-08
FR2755137B1 (fr) 1999-07-16
KR19980028733A (ko) 1998-07-15
GB2318579A (en) 1998-04-29
CN1180848A (zh) 1998-05-06
KR100211546B1 (ko) 1999-08-02
DE19746932A1 (de) 1998-04-30
JPH10133380A (ja) 1998-05-22
CN1099052C (zh) 2003-01-15
TW449673B (en) 2001-08-11
FR2755137A1 (fr) 1998-04-30

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Legal Events

Date Code Title Description
AD1B A search report has been drawn up
PD2B A search report has been drawn up
VD1 Lapsed due to non-payment of the annual fee

Effective date: 20080501

V1 Lapsed because of non-payment of the annual fee

Effective date: 20100501