MY156014A - Method and equipment for exposing the surface of an integrated circuit - Google Patents
Method and equipment for exposing the surface of an integrated circuitInfo
- Publication number
- MY156014A MY156014A MYPI20092729A MYPI20092729A MY156014A MY 156014 A MY156014 A MY 156014A MY PI20092729 A MYPI20092729 A MY PI20092729A MY PI20092729 A MYPI20092729 A MY PI20092729A MY 156014 A MY156014 A MY 156014A
- Authority
- MY
- Malaysia
- Prior art keywords
- integrated circuit
- exposing
- equipment
- coating initially
- initially covering
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/346—Working by laser beam, e.g. welding, cutting or boring in combination with welding or cutting covered by groups B23K5/00 - B23K25/00, e.g. in combination with resistance welding
- B23K26/348—Working by laser beam, e.g. welding, cutting or boring in combination with welding or cutting covered by groups B23K5/00 - B23K25/00, e.g. in combination with resistance welding in combination with arc heating, e.g. TIG [tungsten inert gas], MIG [metal inert gas] or plasma welding
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
- G03F7/427—Stripping or agents therefor using plasma means only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32816—Pressure
- H01J37/32825—Working under atmospheric pressure or higher
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Analytical Chemistry (AREA)
- Computer Hardware Design (AREA)
- Mechanical Engineering (AREA)
- Drying Of Semiconductors (AREA)
- Laser Beam Processing (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Treatments Of Macromolecular Shaped Articles (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0611489A FR2911003B1 (fr) | 2006-12-28 | 2006-12-28 | Procede et installation de mise a nu de la surface d'un circuit integre |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MY156014A true MY156014A (en) | 2015-12-31 |
Family
ID=38222717
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MYPI20092729A MY156014A (en) | 2006-12-28 | 2007-12-12 | Method and equipment for exposing the surface of an integrated circuit |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US8555728B2 (enExample) |
| EP (1) | EP2095410B1 (enExample) |
| JP (1) | JP2010515251A (enExample) |
| KR (1) | KR101348971B1 (enExample) |
| CN (1) | CN101611482B (enExample) |
| ES (1) | ES2405745T3 (enExample) |
| FR (1) | FR2911003B1 (enExample) |
| MY (1) | MY156014A (enExample) |
| RU (1) | RU2450386C2 (enExample) |
| WO (1) | WO2008090281A1 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8844793B2 (en) * | 2010-11-05 | 2014-09-30 | Raytheon Company | Reducing formation of oxide on solder |
| US8796151B2 (en) * | 2012-04-04 | 2014-08-05 | Ultratech, Inc. | Systems for and methods of laser-enhanced plasma processing of semiconductor materials |
| US9543225B2 (en) * | 2014-04-29 | 2017-01-10 | Lam Research Corporation | Systems and methods for detecting endpoint for through-silicon via reveal applications |
| RU2572290C1 (ru) * | 2014-12-01 | 2016-01-10 | Открытое акционерное общество "Объединенная ракетно-космическая корпорация" (ОАО "ОРКК") | Способ декорпусирования интегральных микросхем |
| KR102065012B1 (ko) * | 2016-07-26 | 2020-01-10 | 에이피시스템 주식회사 | 레이저 처리장치 및 레이저 처리방법 |
| US20210333711A1 (en) * | 2018-08-14 | 2021-10-28 | The Board Of Trustees Of The University Of Illinois | Photoresist-free photolithography, photoprocessing tools, and methods with vuv or deep-uv lamps |
| CN111495880A (zh) * | 2020-04-01 | 2020-08-07 | 武汉大学 | Movcd中的激光等离子复合清洗装置 |
| GB2612360B (en) * | 2021-11-01 | 2025-04-30 | Aquasium Tech Limited | Laser welding apparatus |
| CN116013817B (zh) * | 2023-01-17 | 2024-03-19 | 上海季丰电子股份有限公司 | 芯片封装破除装置及方法 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4689467A (en) * | 1982-12-17 | 1987-08-25 | Inoue-Japax Research Incorporated | Laser machining apparatus |
| US4611919A (en) * | 1984-03-09 | 1986-09-16 | Tegal Corporation | Process monitor and method thereof |
| US4714516A (en) * | 1986-09-26 | 1987-12-22 | General Electric Company | Method to produce via holes in polymer dielectrics for multiple electronic circuit chip packaging |
| JPH01179153A (ja) * | 1988-01-08 | 1989-07-17 | Seiko Instr & Electron Ltd | フォーカスイオンビーム加工装置 |
| JP2854963B2 (ja) * | 1990-11-28 | 1999-02-10 | 株式会社日立製作所 | 固相接合方法および装置 |
| JP4513973B2 (ja) * | 1996-12-04 | 2010-07-28 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
| US6071009A (en) * | 1997-10-03 | 2000-06-06 | Micron Technology, Inc. | Semiconductor wirebond machine leadframe thermal map system |
| JP2001049014A (ja) | 1999-08-10 | 2001-02-20 | Sharp Corp | 有機高分子膜の加工方法およびそれを用いて加工された構造体 |
| JP2002110613A (ja) * | 2000-09-26 | 2002-04-12 | Matsushita Electric Works Ltd | プラズマ洗浄装置及びプラズマ洗浄方法 |
| US6699780B1 (en) * | 2000-10-13 | 2004-03-02 | Bridge Semiconductor Corporation | Method of connecting a conductive trace to a semiconductor chip using plasma undercut etching |
| JP2002222835A (ja) * | 2001-01-25 | 2002-08-09 | Nec Corp | 銅張り樹脂基板の加工方法 |
| US7000313B2 (en) * | 2001-03-08 | 2006-02-21 | Ppg Industries Ohio, Inc. | Process for fabricating circuit assemblies using electrodepositable dielectric coating compositions |
| ATE488614T1 (de) * | 2002-08-28 | 2010-12-15 | Moxtronics Inc | Hybridstrahl-beschichtungssystem und verfahren zur herstellung von zno-schichten |
| US20040150096A1 (en) * | 2003-02-03 | 2004-08-05 | International Business Machines Corporation | Capping coating for 3D integration applications |
| JP2004273771A (ja) * | 2003-03-10 | 2004-09-30 | Fuji Electric Device Technology Co Ltd | 半導体装置の製造方法 |
| RU2272335C2 (ru) * | 2003-11-14 | 2006-03-20 | Юрий Дмитриевич Сасов | Способ испытаний и контроля электронных компонентов |
| US20050221586A1 (en) * | 2003-12-18 | 2005-10-06 | Mulligan Rose A | Methods and apparatus for laser dicing |
| US20060257074A1 (en) * | 2004-09-21 | 2006-11-16 | The Furukawa Electric Co., Ltd. | Semiconductor device, display device and device fabricating method |
-
2006
- 2006-12-28 FR FR0611489A patent/FR2911003B1/fr not_active Expired - Fee Related
-
2007
- 2007-12-12 EP EP07871849.1A patent/EP2095410B1/fr active Active
- 2007-12-12 CN CN200780050958XA patent/CN101611482B/zh not_active Expired - Fee Related
- 2007-12-12 ES ES07871849T patent/ES2405745T3/es active Active
- 2007-12-12 RU RU2009128992/28A patent/RU2450386C2/ru active
- 2007-12-12 JP JP2009543493A patent/JP2010515251A/ja active Pending
- 2007-12-12 MY MYPI20092729A patent/MY156014A/en unknown
- 2007-12-12 US US12/521,444 patent/US8555728B2/en not_active Expired - Fee Related
- 2007-12-12 WO PCT/FR2007/002056 patent/WO2008090281A1/fr not_active Ceased
- 2007-12-12 KR KR1020097015599A patent/KR101348971B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR101348971B1 (ko) | 2014-01-10 |
| FR2911003B1 (fr) | 2009-10-02 |
| WO2008090281A1 (fr) | 2008-07-31 |
| CN101611482B (zh) | 2012-07-25 |
| JP2010515251A (ja) | 2010-05-06 |
| US20100154558A1 (en) | 2010-06-24 |
| CN101611482A (zh) | 2009-12-23 |
| FR2911003A1 (fr) | 2008-07-04 |
| KR20090106549A (ko) | 2009-10-09 |
| EP2095410B1 (fr) | 2013-04-10 |
| ES2405745T3 (es) | 2013-06-03 |
| US8555728B2 (en) | 2013-10-15 |
| RU2009128992A (ru) | 2011-02-10 |
| RU2450386C2 (ru) | 2012-05-10 |
| EP2095410A1 (fr) | 2009-09-02 |
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