MXPA02004628A - Metodo de inspeccion utilizando una imagen en seccion vertical. - Google Patents
Metodo de inspeccion utilizando una imagen en seccion vertical.Info
- Publication number
- MXPA02004628A MXPA02004628A MXPA02004628A MXPA02004628A MXPA02004628A MX PA02004628 A MXPA02004628 A MX PA02004628A MX PA02004628 A MXPA02004628 A MX PA02004628A MX PA02004628 A MXPA02004628 A MX PA02004628A MX PA02004628 A MXPA02004628 A MX PA02004628A
- Authority
- MX
- Mexico
- Prior art keywords
- vertical
- bga
- grid array
- interest
- ball grid
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/044—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
- G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Geometry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Image Processing (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Lubricants (AREA)
- Temperature-Responsive Valves (AREA)
- Pretreatment Of Seeds And Plants (AREA)
- Image Analysis (AREA)
Abstract
Es un metodo de inspeccion utilizando una imagen en seccion vertical. Se adquieren varias imagenes en seccion horizontal, que se extienden a traves de un objeto de interes. Se define una region vertical de interes a partir de los datos, representando las imagenes en seccion horizontal. Se construye una imagen en seccion vertical en base a los datos de la imagen en seccion horizontal dentro de la region vertical de interes. Los datos de la imagen en seccion vertical pueden analizarse para detectar defectos. Ademas se proporciona un metodo para detectar defectos en una union BGA. El metodo incluye localizar un centro de la union. El metodo puede incluir ademas la medicion de varios diametros a traves del centro de la union y aplicar una regla para comparar los diametros medidos con un diametro esperado.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16393299P | 1999-11-08 | 1999-11-08 | |
PCT/US2000/041931 WO2001035051A2 (en) | 1999-11-08 | 2000-11-07 | X-ray tomography bga (ball grid array) inspections |
Publications (1)
Publication Number | Publication Date |
---|---|
MXPA02004628A true MXPA02004628A (es) | 2004-09-10 |
Family
ID=22592245
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MXPA02004628A MXPA02004628A (es) | 1999-11-08 | 2000-11-07 | Metodo de inspeccion utilizando una imagen en seccion vertical. |
Country Status (10)
Country | Link |
---|---|
EP (1) | EP1236017B1 (es) |
JP (3) | JP3665294B2 (es) |
KR (1) | KR100522560B1 (es) |
CN (1) | CN1409816A (es) |
AT (1) | ATE304695T1 (es) |
AU (1) | AU3792801A (es) |
CA (1) | CA2390068A1 (es) |
DE (1) | DE60022672T2 (es) |
MX (1) | MXPA02004628A (es) |
WO (1) | WO2001035051A2 (es) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6847900B2 (en) * | 2001-12-17 | 2005-01-25 | Agilent Technologies, Inc. | System and method for identifying solder joint defects |
DE102004031130A1 (de) | 2004-06-28 | 2006-01-19 | Yxlon International Security Gmbh | Verfahren zur Überprüfung eines Gepäckstücks mittels eines Röntgenbeugungsverfahrens |
JP4910378B2 (ja) | 2005-03-01 | 2012-04-04 | 株式会社デンソー | X線検査装置及びx線検査方法 |
JP5271514B2 (ja) * | 2007-07-09 | 2013-08-21 | 名古屋電機工業株式会社 | 多層配線基板の放射線検査方法および放射線検査装置ならびに放射線検査方法を実現する放射線検査プログラム |
KR101043612B1 (ko) * | 2009-10-23 | 2011-06-24 | 주식회사 쎄크 | X선 검사시스템 및 이를 이용한 검사방법 |
JP2011169788A (ja) * | 2010-02-19 | 2011-09-01 | Mitsubishi Electric Corp | X線検査方法及びx線検査装置 |
JP5246187B2 (ja) * | 2010-03-15 | 2013-07-24 | オムロン株式会社 | X線検査装置、x線検査方法およびプログラム |
CN101846601B (zh) * | 2010-03-31 | 2011-08-31 | 伟创力电子科技(上海)有限公司 | 球栅阵列封装切片试块的制作方法 |
CN102854287A (zh) * | 2011-06-28 | 2013-01-02 | 上海华碧检测技术有限公司 | Bga器件翘曲导致焊点开裂的检测方法 |
CN103890570B (zh) | 2011-11-09 | 2016-02-24 | 雅马哈发动机株式会社 | X射线检查方法及装置 |
JP6360674B2 (ja) * | 2013-11-15 | 2018-07-18 | 国立大学法人大阪大学 | ハンダ内のボイドの評価装置及びハンダ内のボイドの評価方法 |
US9841387B2 (en) * | 2015-07-22 | 2017-12-12 | Test Research, Inc. | Inspection method and device |
JP6676023B2 (ja) * | 2017-09-28 | 2020-04-08 | 株式会社サキコーポレーション | 検査位置の特定方法及び検査装置 |
JP2019060809A (ja) * | 2017-09-28 | 2019-04-18 | 株式会社サキコーポレーション | 3次元画像の生成方法及び検査装置 |
EP3690428A4 (en) * | 2017-09-28 | 2021-06-09 | Saki Corporation | INSPECTION POSITION SPECIFICATION PROCESS, THREE-DIMENSIONAL IMAGE GENERATION PROCESS AND INSPECTION DEVICE |
JP7456207B2 (ja) * | 2020-03-12 | 2024-03-27 | オムロン株式会社 | 検査システム、検査方法及びプログラム |
KR102434478B1 (ko) * | 2022-07-13 | 2022-08-19 | (주)동아씨앤지 | 재난 예방 기능을 포함한 인공지능 기반의 스마트 하천 관제 플랫폼 및 그 제어 방법 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0692944B2 (ja) * | 1986-07-30 | 1994-11-16 | 株式会社日立製作所 | X線断層撮影装置 |
US5097492A (en) * | 1987-10-30 | 1992-03-17 | Four Pi Systems Corporation | Automated laminography system for inspection of electronics |
US4926452A (en) * | 1987-10-30 | 1990-05-15 | Four Pi Systems Corporation | Automated laminography system for inspection of electronics |
DE3838792A1 (de) * | 1988-11-17 | 1990-05-31 | Philips Patentverwaltung | Kernspintomographieverfahren zur bestimmung der kernmagnetisierung in einer anzahl paralleler schichten |
JPH0642946A (ja) * | 1992-04-10 | 1994-02-18 | Kobe Steel Ltd | 半田付け検査方法及び装置 |
CA2113752C (en) * | 1994-01-19 | 1999-03-02 | Stephen Michael Rooks | Inspection system for cross-sectional imaging |
JPH0855887A (ja) * | 1994-08-10 | 1996-02-27 | Toshiba Corp | ラミノグラフ |
JPH08327563A (ja) * | 1995-06-02 | 1996-12-13 | Toshiba Corp | ラミノグラフ |
WO1999042818A1 (en) * | 1998-02-23 | 1999-08-26 | Nicolet Imaging Systems | Method and apparatus for imaging obscured areas of a test object |
-
2000
- 2000-11-07 AU AU37928/01A patent/AU3792801A/en not_active Abandoned
- 2000-11-07 DE DE60022672T patent/DE60022672T2/de not_active Expired - Lifetime
- 2000-11-07 CN CN00816889A patent/CN1409816A/zh active Pending
- 2000-11-07 JP JP2001536933A patent/JP3665294B2/ja not_active Expired - Fee Related
- 2000-11-07 CA CA002390068A patent/CA2390068A1/en not_active Abandoned
- 2000-11-07 AT AT00992041T patent/ATE304695T1/de not_active IP Right Cessation
- 2000-11-07 WO PCT/US2000/041931 patent/WO2001035051A2/en active IP Right Grant
- 2000-11-07 MX MXPA02004628A patent/MXPA02004628A/es active IP Right Grant
- 2000-11-07 EP EP00992041A patent/EP1236017B1/en not_active Expired - Lifetime
- 2000-11-07 KR KR10-2002-7005894A patent/KR100522560B1/ko not_active IP Right Cessation
-
2005
- 2005-01-06 JP JP2005001571A patent/JP4227959B2/ja not_active Expired - Fee Related
-
2008
- 2008-05-01 JP JP2008119945A patent/JP2008216265A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP1236017A2 (en) | 2002-09-04 |
DE60022672D1 (en) | 2005-10-20 |
CA2390068A1 (en) | 2001-05-17 |
CN1409816A (zh) | 2003-04-09 |
WO2001035051A3 (en) | 2001-12-13 |
KR100522560B1 (ko) | 2005-10-20 |
AU3792801A (en) | 2001-06-06 |
JP2005142584A (ja) | 2005-06-02 |
ATE304695T1 (de) | 2005-09-15 |
JP4227959B2 (ja) | 2009-02-18 |
WO2001035051A9 (en) | 2002-08-08 |
JP2003514233A (ja) | 2003-04-15 |
DE60022672T2 (de) | 2006-06-29 |
KR20020079732A (ko) | 2002-10-19 |
EP1236017B1 (en) | 2005-09-14 |
JP3665294B2 (ja) | 2005-06-29 |
JP2008216265A (ja) | 2008-09-18 |
WO2001035051A2 (en) | 2001-05-17 |
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Legal Events
Date | Code | Title | Description |
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FG | Grant or registration |