MX361605B - Dispositivo y método de inspección de propiedad de superficie. - Google Patents
Dispositivo y método de inspección de propiedad de superficie.Info
- Publication number
- MX361605B MX361605B MX2016008731A MX2016008731A MX361605B MX 361605 B MX361605 B MX 361605B MX 2016008731 A MX2016008731 A MX 2016008731A MX 2016008731 A MX2016008731 A MX 2016008731A MX 361605 B MX361605 B MX 361605B
- Authority
- MX
- Mexico
- Prior art keywords
- examination
- surface characteristic
- subject
- detector
- characteristic examination
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 238000004381 surface treatment Methods 0.000 abstract 2
- 238000009826 distribution Methods 0.000 abstract 1
- 238000011156 evaluation Methods 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 238000005121 nitriding Methods 0.000 abstract 1
- 238000005480 shot peening Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9073—Recording measured data
- G01N27/9086—Calibrating of recording device
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electrochemistry (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Se proporciona un dispositivo de examinación de característica de superficie y método de examinación de característica de superficie capaz de examinar de forma precisa el estado de tratamiento de superficie de un material tratado sujeto a tratamiento de superficie tal como granallado, tratamiento térmico, y tratamiento de nitruración mientras que minimiza el efecto de variación de temperatura y otros efectos de ambiente de evaluación y capaz de ser aplicados a la medida dentro de una línea de producción. Se proporciona un dispositivo (1) de examinación de característica de superficie con una fuente (10) de alimentación de CA, una conexión (20) de puente de CA, y un dispositivo (30) de evaluación. Se configura la conexión (20) de puente de CA a partir una resistencia (21) variable que tiene una relación de distribución variable (y), un detector (22) de referencia, y un detector (23) de examinación. Se proporciona el detector (23) de examinación con una bobina (23b) devanada que opone el área de examinación de característica de superficie de un sujeto (M) e induce corrientes parásitas en el sujeto (M) al suministrar energía de CA desde la fuente (10) de alimentación de CA hasta la bobina (23b). Un objeto de referencia que tiene la misma estructura que el sujeto (M) se coloca en el detector (22) de referencia, y los efectos del ambiente de evaluación se cancelan.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014007788 | 2014-01-20 | ||
| JP2014024198 | 2014-02-12 | ||
| PCT/JP2014/074845 WO2015107725A1 (ja) | 2014-01-20 | 2014-09-19 | 表面特性検査装置及び表面特性検査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| MX2016008731A MX2016008731A (es) | 2016-10-13 |
| MX361605B true MX361605B (es) | 2018-12-11 |
Family
ID=53542637
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2016008731A MX361605B (es) | 2014-01-20 | 2014-09-19 | Dispositivo y método de inspección de propiedad de superficie. |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US9964520B2 (es) |
| EP (1) | EP3098600B1 (es) |
| JP (2) | JP6052713B2 (es) |
| KR (1) | KR102159779B1 (es) |
| CN (1) | CN106415261B (es) |
| BR (1) | BR112016016597B1 (es) |
| MX (1) | MX361605B (es) |
| RU (1) | RU2666176C2 (es) |
| TW (1) | TWI641818B (es) |
| WO (1) | WO2015107725A1 (es) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015125340A1 (ja) * | 2014-02-21 | 2015-08-27 | 新東工業株式会社 | 表面特性検査選別装置、表面特性検査選別システム及び表面特性検査選別方法 |
| EP3124964B1 (en) * | 2014-03-24 | 2024-12-04 | Sintokogio, Ltd. | Surface characteristic inspection method |
| BR112017025842B1 (pt) * | 2015-06-25 | 2021-06-08 | Sintokogio, Ltd. | aparelho e método de avaliação de características de superfície |
| WO2017022328A1 (ja) * | 2015-08-06 | 2017-02-09 | 新東工業株式会社 | 鋼材製品の表面特性検査方法及び表面特性検査装置 |
| EP3388196B1 (en) * | 2016-05-16 | 2024-07-17 | Sintokogio, Ltd. | Surface treatment processing method and surface treatment processing device |
| MX2019003438A (es) | 2016-10-06 | 2019-06-06 | Sintokogio Ltd | Metodo de inspeccion de caracteristicas de superficie y dispositivo de inspeccion de caracteristicas de superficie. |
| JP6984655B2 (ja) | 2017-05-16 | 2021-12-22 | 新東工業株式会社 | 表面処理加工方法及び表面処理加工装置 |
| KR102501482B1 (ko) * | 2017-06-30 | 2023-02-21 | 신토고교 가부시키가이샤 | 쇼트 처리 장치 |
| CN110869756B (zh) * | 2017-07-10 | 2023-10-27 | 新东工业株式会社 | 表面特性评价方法、表面特性评价装置以及表面特性评价系统 |
| KR102039927B1 (ko) * | 2018-03-12 | 2019-11-05 | 두산중공업 주식회사 | 탐촉자 및 이를 포함하는 결함 탐지 장치 |
| CN109084918B (zh) * | 2018-08-29 | 2020-06-23 | 中国人民解放军空军工程大学 | 一种基于电磁超声技术的激光冲击波结合力检测方法 |
| JP7247074B2 (ja) * | 2019-10-17 | 2023-03-28 | 株式会社東芝 | レーザピーニング施工装置、方法及びプログラム |
| DE102020206906A1 (de) * | 2020-06-03 | 2021-12-09 | Robert Bosch Gesellschaft mit beschränkter Haftung | Verfahren zur Überwachung der Druckeigenspannungen von Bauteilen eines Kugelstrahlbearbeitungsprozesses |
| EP4012399A1 (en) * | 2020-12-10 | 2022-06-15 | Introsys Integration for Robotics Systems, Integração de Sistemas Robóticos, S.A. | A probe and a system for the non-destructive inspection of a welding |
| JP7793913B2 (ja) | 2021-09-15 | 2026-01-06 | 新東工業株式会社 | 試験方法 |
| CN114345747A (zh) * | 2022-01-10 | 2022-04-15 | 海安县巨力磁材有限责任公司 | 一种用于判断磁环伤痕质量的分拣装置 |
| CN120688941B (zh) * | 2025-08-26 | 2025-11-11 | 蜂鸟智造(成都)科技有限公司 | 一种智能制造生产线的产品质量检测方法 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3539006A (en) * | 1968-05-22 | 1970-11-10 | Lamson & Sessions Co | Method and apparatus for inspecting annular articles |
| JPS557630A (en) * | 1978-06-30 | 1980-01-19 | Sumitomo Metal Ind Ltd | Inspection method of depth for peening machined layer at internal surface of tube |
| JPH073408B2 (ja) * | 1985-03-29 | 1995-01-18 | 日本鋼管株式会社 | パイプラインの孔食検出装置 |
| US5537037A (en) * | 1993-03-16 | 1996-07-16 | Hitachi, Ltd. | Apparatus with cancel coil assembly for cancelling a field parallel to an axial direction to the plural coils and to a squid pick up coil |
| JPH1078411A (ja) * | 1996-09-04 | 1998-03-24 | New Cosmos Electric Corp | 磁性粉濃度測定方法及びその装置 |
| DE69625777T2 (de) * | 1995-11-10 | 2003-10-02 | New Cosmos Electric Co., Ltd. | Verfahren zur Bestimmung der Konzentration eines magnetischen Pulvers und Vorrichtung dazu |
| US5744954A (en) * | 1996-11-25 | 1998-04-28 | Cleveland State University | Magnetic field generation in ferromagnetic metal objects |
| WO1999026062A1 (en) * | 1997-11-14 | 1999-05-27 | Jentek Sensors, Inc. | Multiple frequency quantitative coating characterization |
| US5898302A (en) | 1997-11-25 | 1999-04-27 | Cleveland State University | Residual stress measurements in metal objects using four coils |
| US6844722B2 (en) * | 2001-08-09 | 2005-01-18 | Avistar, Inc. | Mutual inductance bridge for detection of degradation in metallic components |
| TWI270662B (en) * | 2002-06-28 | 2007-01-11 | Lam Res Corp | Method and apparatus of arrayed, clustered or coupled eddy current sensor configuration for measuring conductive film properties |
| US6995556B2 (en) * | 2002-07-23 | 2006-02-07 | Ensco, Inc. | Electromagnetic gage sensing system and method for railroad track inspection |
| JP2005331332A (ja) * | 2004-05-19 | 2005-12-02 | Denso Corp | センサ装置 |
| GB0505089D0 (en) * | 2005-03-11 | 2005-04-20 | Glaxo Group Ltd | System and methods for detecting environmental conditions |
| JP5004519B2 (ja) * | 2006-06-22 | 2012-08-22 | 株式会社不二製作所 | ショットピーニング処理面の非破壊検査方法及び装置 |
| JP2009036682A (ja) * | 2007-08-02 | 2009-02-19 | Toyota Motor Corp | 渦電流センサ、硬化層深さ検査装置及び硬化層深さ検査方法 |
| JP2009168556A (ja) * | 2008-01-15 | 2009-07-30 | Meiwa E Tec:Kk | 焼入れ検査装置および焼入れ検査方法 |
| JP5018591B2 (ja) * | 2008-03-27 | 2012-09-05 | トヨタ自動車株式会社 | 判定基準データを作成する装置、方法、及びプログラム |
| JP4905560B2 (ja) * | 2010-01-14 | 2012-03-28 | トヨタ自動車株式会社 | 渦流計測用センサ、及び、渦流計測用センサによる検査方法 |
| JP5048822B2 (ja) * | 2010-10-04 | 2012-10-17 | 大和製衡株式会社 | 計量装置の異常検出方法及び計量装置 |
| TWI530679B (zh) * | 2011-05-10 | 2016-04-21 | 新東工業股份有限公司 | 表面特性檢查裝置及表面特性檢查方法 |
| RU2492454C1 (ru) * | 2012-04-03 | 2013-09-10 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Санкт-Петербургский государственный горный университет" | Способ измерения объемной плотности горной породы в составе горной массы и система для его осуществления |
| JP5877505B2 (ja) * | 2013-05-30 | 2016-03-08 | 新東工業株式会社 | 表面特性検査装置、表面特性検査システム及び表面特性検査方法 |
-
2014
- 2014-09-19 CN CN201480073696.9A patent/CN106415261B/zh active Active
- 2014-09-19 EP EP14878820.1A patent/EP3098600B1/en active Active
- 2014-09-19 RU RU2016133983A patent/RU2666176C2/ru active
- 2014-09-19 JP JP2015557706A patent/JP6052713B2/ja active Active
- 2014-09-19 KR KR1020167022413A patent/KR102159779B1/ko active Active
- 2014-09-19 MX MX2016008731A patent/MX361605B/es active IP Right Grant
- 2014-09-19 BR BR112016016597-7A patent/BR112016016597B1/pt active IP Right Grant
- 2014-09-19 WO PCT/JP2014/074845 patent/WO2015107725A1/ja not_active Ceased
- 2014-09-19 US US15/112,473 patent/US9964520B2/en active Active
- 2014-10-06 TW TW103134712A patent/TWI641818B/zh active
-
2016
- 2016-10-04 JP JP2016196516A patent/JP6421808B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| BR112016016597B1 (pt) | 2020-12-01 |
| BR112016016597A2 (pt) | 2017-08-08 |
| EP3098600A4 (en) | 2017-11-15 |
| US9964520B2 (en) | 2018-05-08 |
| US20160341699A1 (en) | 2016-11-24 |
| EP3098600A1 (en) | 2016-11-30 |
| KR20160111438A (ko) | 2016-09-26 |
| TW201530108A (zh) | 2015-08-01 |
| JP2016224073A (ja) | 2016-12-28 |
| JPWO2015107725A1 (ja) | 2017-03-23 |
| KR102159779B1 (ko) | 2020-09-25 |
| RU2666176C2 (ru) | 2018-09-10 |
| MX2016008731A (es) | 2016-10-13 |
| JP6052713B2 (ja) | 2016-12-27 |
| TWI641818B (zh) | 2018-11-21 |
| CN106415261A (zh) | 2017-02-15 |
| RU2016133983A (ru) | 2018-02-28 |
| CN106415261B (zh) | 2019-07-23 |
| RU2016133983A3 (es) | 2018-02-28 |
| EP3098600B1 (en) | 2023-11-01 |
| JP6421808B2 (ja) | 2018-11-14 |
| WO2015107725A1 (ja) | 2015-07-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG | Grant or registration |