MA39212B1 - Système et procédé pour une inspection complète et non intrusive d'un aéronef - Google Patents

Système et procédé pour une inspection complète et non intrusive d'un aéronef

Info

Publication number
MA39212B1
MA39212B1 MA39212A MA39212A MA39212B1 MA 39212 B1 MA39212 B1 MA 39212B1 MA 39212 A MA39212 A MA 39212A MA 39212 A MA39212 A MA 39212A MA 39212 B1 MA39212 B1 MA 39212B1
Authority
MA
Morocco
Prior art keywords
aircraft
mobile
intrusive
scanning
inspection
Prior art date
Application number
MA39212A
Other languages
English (en)
Other versions
MA39212A1 (fr
Inventor
Mircea Tudor
Original Assignee
Sc Mb Telecom Ltd Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sc Mb Telecom Ltd Srl filed Critical Sc Mb Telecom Ltd Srl
Publication of MA39212A1 publication Critical patent/MA39212A1/fr
Publication of MA39212B1 publication Critical patent/MA39212B1/fr

Links

Classifications

    • G01V5/22—
    • G01V5/226—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G01V5/228—
    • G01V5/232—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/4453—PMT
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/631—Specific applications or type of materials large structures, walls
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects

Abstract

La présente invention concerne un procédé et un système de balayage permettant une inspection non intrusive par radiographie des aéronefs inspectés à partir d'au moins deux perspectives différentes. Le système, selon la présente invention, est composé de : un dispositif de remorquage mobile; au moins deux cadres de balayage, chaque cadre comprenant une source de radiations pénétrantes et un réseau de détecteurs situés sur des côtés opposés de l'aéronef balayé; et un centre de commande mobile, tous les composants étant fixés ou situés sur le châssis mobile en mode transport. Le système complet de balayage pour une inspection non intrusive d'aéronefs selon la présente invention est un ensemble de balayage non intrusif mobile, installé sur le châssis d'un véhicule (1) sur lequel il y a un châssis supplémentaire, une superstructure (2) sur laquelle est immobilisé un profilé en forme de parallélogramme déformable (3), sur lequel est monté une flèche mécanique (4), sous un angle variable, dans une double articulation 5, supportant à l'extrémité une source de radiations pénétrantes (6). Le long de la superstructure (2) est installée une flèche suspendue (7), dans une articulation (8), avec un degré de liberté, une flèche équipée d'un réseau de détecteurs (9). Le système de balayage pour inspection non intrusive comporte un dispositif de remorquage mobile (15), fixé au train moteur afin de remorquer l'aéronef inspecté à une vitesse constante à travers les cadres de balayage. Le centre de commande mobile (22) est placé en dehors de l'aire d'exclusion et gère, par des connexions sans fil ou filaires, tous les composants et appareils périphériques qui font partie du système mobile de balayage. Le procédé d'inspection non intrusive, selon la présente invention, consiste à utiliser un dispositif de remorquage, fixé au train moteur de l'aéronef, qui remorque ledit aéronef à travers les au moins deux cadres de balayage afin d'obtenir au moins deux images radiographiques de l'aéronef balayé d'après des perspectives différentes.
MA39212A 2014-01-23 2015-01-22 Système et procédé pour une inspection complète et non intrusive d'un aéronef MA39212B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
RO201400068A RO130582B1 (ro) 2014-01-23 2014-01-23 Sistem şi metodă pentru inspecţia completă şi neintruzivă a aeronavelor
PCT/RO2015/000002 WO2015174875A2 (fr) 2014-01-23 2015-01-22 Système et procédé pour une inspection complète et non intrusive d'un aéronef

Publications (2)

Publication Number Publication Date
MA39212A1 MA39212A1 (fr) 2016-12-30
MA39212B1 true MA39212B1 (fr) 2018-09-28

Family

ID=53836177

Family Applications (1)

Application Number Title Priority Date Filing Date
MA39212A MA39212B1 (fr) 2014-01-23 2015-01-22 Système et procédé pour une inspection complète et non intrusive d'un aéronef

Country Status (17)

Country Link
US (1) US11119244B2 (fr)
EP (1) EP3097439B1 (fr)
JP (1) JP6552510B2 (fr)
KR (1) KR102363268B1 (fr)
CN (1) CN106104308B (fr)
AU (1) AU2015259893B2 (fr)
BR (1) BR112016017135B1 (fr)
CA (1) CA2936071C (fr)
EA (1) EA032965B1 (fr)
ES (1) ES2817934T3 (fr)
IL (1) IL246905A0 (fr)
MA (1) MA39212B1 (fr)
MX (1) MX357685B (fr)
PL (1) PL3097439T3 (fr)
RO (1) RO130582B1 (fr)
SA (1) SA516371524B1 (fr)
WO (1) WO2015174875A2 (fr)

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CN112666622B (zh) * 2019-10-16 2024-02-02 同方威视技术股份有限公司 辐射扫描检查设备
KR102369170B1 (ko) * 2020-08-31 2022-03-03 한국항공우주산업 주식회사 기체 내부의 이물질 검출 방법 및 기체 내부의 이물질 검출 시스템
CN112363154B (zh) * 2020-10-14 2023-06-20 中国航天科工集团第二研究院 一种基于计算机断层扫描模式的探测识别系统及方法
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CA2936071A1 (fr) 2015-11-19
US11119244B2 (en) 2021-09-14
RO130582A2 (ro) 2015-09-30
SA516371524B1 (ar) 2020-06-07
BR112016017135B1 (pt) 2022-09-06
JP6552510B2 (ja) 2019-07-31
JP2017504803A (ja) 2017-02-09
AU2015259893A1 (en) 2016-07-14
ES2817934T3 (es) 2021-04-08
EA032965B1 (ru) 2019-08-30
BR112016017135A2 (fr) 2017-08-08
EP3097439A2 (fr) 2016-11-30
EA201691207A1 (ru) 2016-11-30
MA39212A1 (fr) 2016-12-30
KR102363268B1 (ko) 2022-02-14
US20170010383A1 (en) 2017-01-12
CN106104308A (zh) 2016-11-09
EP3097439B1 (fr) 2020-06-17
CA2936071C (fr) 2023-03-21
CN106104308B (zh) 2019-01-11
MX2016009305A (es) 2016-12-14
RO130582B1 (ro) 2021-12-30
PL3097439T3 (pl) 2020-11-30
AU2015259893B2 (en) 2020-03-12
WO2015174875A2 (fr) 2015-11-19
KR20160113204A (ko) 2016-09-28
IL246905A0 (en) 2016-09-29
WO2015174875A3 (fr) 2016-01-07
MX357685B (es) 2018-07-18

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