KR960024306U - Pqfp형 집적회로용 테스트 클립 - Google Patents

Pqfp형 집적회로용 테스트 클립

Info

Publication number
KR960024306U
KR960024306U KR2019940035479U KR19940035479U KR960024306U KR 960024306 U KR960024306 U KR 960024306U KR 2019940035479 U KR2019940035479 U KR 2019940035479U KR 19940035479 U KR19940035479 U KR 19940035479U KR 960024306 U KR960024306 U KR 960024306U
Authority
KR
South Korea
Prior art keywords
pqfp
integrated circuit
type integrated
test clip
clip
Prior art date
Application number
KR2019940035479U
Other languages
English (en)
Other versions
KR0108362Y1 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR94035479U priority Critical patent/KR0108362Y1/ko
Publication of KR960024306U publication Critical patent/KR960024306U/ko
Application granted granted Critical
Publication of KR0108362Y1 publication Critical patent/KR0108362Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
KR94035479U 1994-12-24 1994-12-24 Test clip for pqep type ic KR0108362Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR94035479U KR0108362Y1 (en) 1994-12-24 1994-12-24 Test clip for pqep type ic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR94035479U KR0108362Y1 (en) 1994-12-24 1994-12-24 Test clip for pqep type ic

Publications (2)

Publication Number Publication Date
KR960024306U true KR960024306U (ko) 1996-07-22
KR0108362Y1 KR0108362Y1 (en) 1997-10-27

Family

ID=19402556

Family Applications (1)

Application Number Title Priority Date Filing Date
KR94035479U KR0108362Y1 (en) 1994-12-24 1994-12-24 Test clip for pqep type ic

Country Status (1)

Country Link
KR (1) KR0108362Y1 (ko)

Also Published As

Publication number Publication date
KR0108362Y1 (en) 1997-10-27

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
LAPS Lapse due to unpaid annual fee