KR0108362Y1 - Test clip for pqep type ic - Google Patents
Test clip for pqep type icInfo
- Publication number
- KR0108362Y1 KR0108362Y1 KR94035479U KR19940035479U KR0108362Y1 KR 0108362 Y1 KR0108362 Y1 KR 0108362Y1 KR 94035479 U KR94035479 U KR 94035479U KR 19940035479 U KR19940035479 U KR 19940035479U KR 0108362 Y1 KR0108362 Y1 KR 0108362Y1
- Authority
- KR
- South Korea
- Prior art keywords
- pqep
- type
- test clip
- clip
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2896—Testing of IC packages; Test features related to IC packages
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR94035479U KR0108362Y1 (en) | 1994-12-24 | 1994-12-24 | Test clip for pqep type ic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR94035479U KR0108362Y1 (en) | 1994-12-24 | 1994-12-24 | Test clip for pqep type ic |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960024306U KR960024306U (en) | 1996-07-22 |
KR0108362Y1 true KR0108362Y1 (en) | 1997-10-27 |
Family
ID=19402556
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR94035479U KR0108362Y1 (en) | 1994-12-24 | 1994-12-24 | Test clip for pqep type ic |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0108362Y1 (en) |
-
1994
- 1994-12-24 KR KR94035479U patent/KR0108362Y1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR960024306U (en) | 1996-07-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
LAPS | Lapse due to unpaid annual fee |