KR950004445A - 박막형성장치 - Google Patents

박막형성장치 Download PDF

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Publication number
KR950004445A
KR950004445A KR1019940015958A KR19940015958A KR950004445A KR 950004445 A KR950004445 A KR 950004445A KR 1019940015958 A KR1019940015958 A KR 1019940015958A KR 19940015958 A KR19940015958 A KR 19940015958A KR 950004445 A KR950004445 A KR 950004445A
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KR
South Korea
Prior art keywords
collimator
thin film
film forming
plate
forming apparatus
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KR1019940015958A
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English (en)
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KR0153213B1 (ko
Inventor
스스무 사와다
준이치 아난
요시타카 카쿠타니
히로노리 와다
후미히코 야나가와
크레이그 모젤리 로데릭
Original Assignee
나가시마 카즈나리
가부시기가이샤 재팬 에너지
타시로 시게오
어플라이드 머티리얼즈 재팬 가부시기가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 나가시마 카즈나리, 가부시기가이샤 재팬 에너지, 타시로 시게오, 어플라이드 머티리얼즈 재팬 가부시기가이샤 filed Critical 나가시마 카즈나리
Publication of KR950004445A publication Critical patent/KR950004445A/ko
Application granted granted Critical
Publication of KR0153213B1 publication Critical patent/KR0153213B1/ko

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3447Collimators, shutters, apertures
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/02Details
    • H01J2237/022Avoiding or removing foreign or contaminating particles, debris or deposits on sample or tube

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Metallurgy (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

본 발명은, 콜리메이터를 사용하는 박막형성장치에 있어서, 지향성박막형성을 위한 콜리메이터의 기능을 손상하는 일없이, 파티클의 증가를 저감시키는 것을 목적으로 한 것이며, 그 구성에 있어서 파티클게터기능을 가진 콜리메이터와 그것을 타겟과 웨이퍼의 사이에 개재시킨 박막형성장치로써, 콜리메이터(3)는, 파티콜게터판(PG판)(15)을 격자, 벌집형상구조등 개구군을 가진 구조로 짜맞추고, 프레임(16)에 고정해서 형성한다. PG판은, 파티클포획 및 유지작용에 뛰어난 표면을 일체적으로 형성한 시트, 판등을 포괄한다. 콜리메이터의 예는, 엠보스가공한 슬릿형성 파티클게터판의 격자형상조립체이다. 콜리메이터에 부착한 부착막의 박리를 콜리메이터의 성능을 저하시키는 일없이 방지할 수 있는 것을 특징으로 한 것이다.

Description

박막형성장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제2도는 본 발명의 일예로써 타켓스퍼터링에 의한 박막형성장치의 요부를 표시한 단면도, 제3도는 격자 형상의 파티클게터(particle getter)작용을 가진 콜리메이터를 표시하며, (a)도는 상면도, (b)도는 (a)도의 콜리메이터의 일부사시도, 제4도는 제3도의 파티클게터콜리메이터의 조립단계를 표시하며, (a)도는 구멍 가공한 PG판과 가장자리변에 슬릿을 형성한 PG판을 표시하고, (b)도는 이들 2종의 가공된 PG판을 둘로 꺽어구부린 상태를 각각 표시하고, (c)는 이들을 각각 엠보스가공기에 전후의 PG판을 표시한 도면.

Claims (4)

  1. 파티클게터판으로 구성된 콜리메이터를 성막원과 기판과의 사이에 구비하는 것을 특징으로 하는 박막 형성장치.
  2. 제1항에 있어서, 콜리메이터가 엠보스가공한 슬릿형성파티클게터판을 경자형상으로 조립하므로서 구성되는 것을 특징으로 하는 박막형성장치.
  3. 파티클게터판으로 구성된 것을 특징으로 하는 박막형성장치용 콜리메이터.
  4. 제3항에 있어서, 엠보스가공한 슬릿형성파티클게터판을 격자형상으로 조립하므로서 구성되는 것을 특징으로 하는 박막형성장치용 콜리메이터.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019940015958A 1993-07-06 1994-07-05 박막형성장치 KR0153213B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP93-191612 1993-07-06
JP5191612A JPH0718423A (ja) 1993-07-06 1993-07-06 薄膜形成装置

Publications (2)

Publication Number Publication Date
KR950004445A true KR950004445A (ko) 1995-02-18
KR0153213B1 KR0153213B1 (ko) 1998-12-01

Family

ID=16277536

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940015958A KR0153213B1 (ko) 1993-07-06 1994-07-05 박막형성장치

Country Status (6)

Country Link
US (1) US5804046A (ko)
EP (2) EP0633599B1 (ko)
JP (1) JPH0718423A (ko)
KR (1) KR0153213B1 (ko)
DE (1) DE69420902T2 (ko)
TW (1) TW294726B (ko)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5614071A (en) * 1995-06-28 1997-03-25 Hmt Technology Corporation Sputtering shield
KR20000069523A (ko) * 1997-01-16 2000-11-25 보텀필드 레인, 에프. 기상 증착 요소 및 기상 증착 방법
JPH1180964A (ja) * 1997-07-07 1999-03-26 Canon Inc プラズマcvd法による堆積膜形成装置
US6162297A (en) * 1997-09-05 2000-12-19 Applied Materials, Inc. Embossed semiconductor fabrication parts
KR20010032824A (ko) * 1997-12-05 2001-04-25 테갈 코퍼레이션 증착 실드를 갖는 플라즈마 리액터
US6482301B1 (en) * 1998-06-04 2002-11-19 Seagate Technology, Inc. Target shields for improved magnetic properties of a recording medium
US6390019B1 (en) 1998-06-11 2002-05-21 Applied Materials, Inc. Chamber having improved process monitoring window
US6416583B1 (en) * 1998-06-19 2002-07-09 Tokyo Electron Limited Film forming apparatus and film forming method
EP1252359B1 (en) * 1999-12-02 2020-03-11 OEM Group, Inc Method of operating a platinum etch reactor
US6440219B1 (en) * 2000-06-07 2002-08-27 Simplus Systems Corporation Replaceable shielding apparatus
US6673199B1 (en) 2001-03-07 2004-01-06 Applied Materials, Inc. Shaping a plasma with a magnetic field to control etch rate uniformity
US6652713B2 (en) 2001-08-09 2003-11-25 Applied Materials, Inc. Pedestal with integral shield
US6933508B2 (en) 2002-03-13 2005-08-23 Applied Materials, Inc. Method of surface texturizing
US6812471B2 (en) * 2002-03-13 2004-11-02 Applied Materials, Inc. Method of surface texturizing
KR100487419B1 (ko) * 2003-02-20 2005-05-04 엘지전자 주식회사 기상 증착 장치
JP4234684B2 (ja) 2003-05-02 2009-03-04 富士通株式会社 磁気記録媒体、磁気記憶装置及び磁気記録媒体の製造方法
US20050006223A1 (en) * 2003-05-07 2005-01-13 Robert Nichols Sputter deposition masking and methods
US20050066897A1 (en) * 2003-09-29 2005-03-31 Seagate Technology Llc System, method and aperture for oblique deposition
US20050067272A1 (en) * 2003-09-29 2005-03-31 Seagate Technology Llc System method and collimator for oblique deposition
DE102004004844B4 (de) * 2004-01-30 2009-04-09 Interpane Entwicklungs- Und Beratungsgesellschaft Mbh & Co Kg Vorrichtung zum Beschichten eines Substrats mit einer Absorberanordnung
US20060292310A1 (en) * 2005-06-27 2006-12-28 Applied Materials, Inc. Process kit design to reduce particle generation
US8090451B2 (en) * 2006-03-30 2012-01-03 Medtronic Inc. Transvenous active fixation lead system
US9567666B2 (en) * 2009-01-12 2017-02-14 Guardian Industries Corp Apparatus and method for making sputtered films with reduced stress asymmetry
EP2213765A1 (en) * 2009-01-16 2010-08-04 Applied Materials, Inc. Stray coating prevention device, coating chamber device for coating substrates, and method of coating
US20120087462A1 (en) * 2010-10-12 2012-04-12 Abdelaziz Ikhlef Hybrid collimator for x-rays and method of making same
US9416778B2 (en) * 2011-04-15 2016-08-16 Rutgers, The State University Of New Jersey Self-gettering differential pump
CN103876767B (zh) * 2013-12-19 2017-04-12 沈阳东软医疗系统有限公司 一种ct机及其x射线准直器
US9887072B2 (en) * 2014-01-23 2018-02-06 Taiwan Semiconductor Manufacturing Company, Ltd. Systems and methods for integrated resputtering in a physical vapor deposition chamber
JP6364295B2 (ja) * 2014-09-22 2018-07-25 ルネサスエレクトロニクス株式会社 半導体装置の製造方法およびスパッタリング装置
JP6088083B1 (ja) * 2016-03-14 2017-03-01 株式会社東芝 処理装置及びコリメータ
CN108538694B (zh) * 2017-03-02 2020-04-28 北京北方华创微电子装备有限公司 一种腔室和等离子体处理装置
DE102022103180A1 (de) * 2022-02-10 2023-08-10 Voestalpine Stahl Gmbh Verfahren zum Erzeugen von beschichtetem perforiertem Stahlband

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6156277A (ja) * 1984-08-27 1986-03-20 Hitachi Ltd 成膜装置
JPS6277477A (ja) * 1985-09-30 1987-04-09 Toshiba Corp 薄膜形成装置
JPH0660391B2 (ja) * 1987-06-11 1994-08-10 日電アネルバ株式会社 スパッタリング装置
US4824544A (en) * 1987-10-29 1989-04-25 International Business Machines Corporation Large area cathode lift-off sputter deposition device
JPH03120500A (ja) * 1989-10-04 1991-05-22 Toshiba Corp 多孔コリメータ及びその製造方法
US4988424A (en) * 1989-06-07 1991-01-29 Ppg Industries, Inc. Mask and method for making gradient sputtered coatings
US5135629A (en) * 1989-06-12 1992-08-04 Nippon Mining Co., Ltd. Thin film deposition system
JP2732539B2 (ja) * 1989-10-06 1998-03-30 日本電気株式会社 真空成膜装置
JP2663025B2 (ja) * 1989-11-24 1997-10-15 株式会社ジャパンエナジー 薄膜形成装置
JPH04232256A (ja) * 1990-12-28 1992-08-20 Nikko Kyodo Co Ltd 薄膜形成装置
JP2725944B2 (ja) * 1991-04-19 1998-03-11 インターナショナル・ビジネス・マシーンズ・コーポレイション 金属層堆積方法
JP2511545Y2 (ja) * 1991-09-06 1996-09-25 株式会社ジャパンエナジー パ―ティクルゲッタ治具キャップ
US5223108A (en) * 1991-12-30 1993-06-29 Materials Research Corporation Extended lifetime collimator
JPH0665731A (ja) * 1992-08-24 1994-03-08 Mitsubishi Electric Corp 半導体製造装置
JPH06295903A (ja) * 1993-02-09 1994-10-21 Matsushita Electron Corp スパッタリング装置

Also Published As

Publication number Publication date
DE69420902D1 (de) 1999-11-04
KR0153213B1 (ko) 1998-12-01
EP0633600A1 (en) 1995-01-11
EP0633599B1 (en) 1999-09-29
EP0633599A1 (en) 1995-01-11
US5804046A (en) 1998-09-08
TW294726B (ko) 1997-01-01
DE69420902T2 (de) 2000-04-13
JPH0718423A (ja) 1995-01-20

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