KR940021410U - 번인(Burn-In) 테스트모드 발생회로 - Google Patents

번인(Burn-In) 테스트모드 발생회로

Info

Publication number
KR940021410U
KR940021410U KR2019930001420U KR930001420U KR940021410U KR 940021410 U KR940021410 U KR 940021410U KR 2019930001420 U KR2019930001420 U KR 2019930001420U KR 930001420 U KR930001420 U KR 930001420U KR 940021410 U KR940021410 U KR 940021410U
Authority
KR
South Korea
Prior art keywords
burn
generation circuit
test mode
mode generation
test
Prior art date
Application number
KR2019930001420U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019930001420U priority Critical patent/KR940021410U/ko
Publication of KR940021410U publication Critical patent/KR940021410U/ko

Links

KR2019930001420U 1993-02-04 1993-02-04 번인(Burn-In) 테스트모드 발생회로 KR940021410U (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930001420U KR940021410U (ko) 1993-02-04 1993-02-04 번인(Burn-In) 테스트모드 발생회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930001420U KR940021410U (ko) 1993-02-04 1993-02-04 번인(Burn-In) 테스트모드 발생회로

Publications (1)

Publication Number Publication Date
KR940021410U true KR940021410U (ko) 1994-09-24

Family

ID=60672329

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930001420U KR940021410U (ko) 1993-02-04 1993-02-04 번인(Burn-In) 테스트모드 발생회로

Country Status (1)

Country Link
KR (1) KR940021410U (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100530868B1 (ko) * 1997-07-31 2006-02-09 삼성전자주식회사 내부 전원 전압 발생 회로들을 갖는 반도체 장치

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100530868B1 (ko) * 1997-07-31 2006-02-09 삼성전자주식회사 내부 전원 전압 발생 회로들을 갖는 반도체 장치

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Legal Events

Date Code Title Description
WITN Withdrawal due to no request for examination