KR940021410U - 번인(Burn-In) 테스트모드 발생회로 - Google Patents
번인(Burn-In) 테스트모드 발생회로Info
- Publication number
- KR940021410U KR940021410U KR2019930001420U KR930001420U KR940021410U KR 940021410 U KR940021410 U KR 940021410U KR 2019930001420 U KR2019930001420 U KR 2019930001420U KR 930001420 U KR930001420 U KR 930001420U KR 940021410 U KR940021410 U KR 940021410U
- Authority
- KR
- South Korea
- Prior art keywords
- burn
- generation circuit
- test mode
- mode generation
- test
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019930001420U KR940021410U (ko) | 1993-02-04 | 1993-02-04 | 번인(Burn-In) 테스트모드 발생회로 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019930001420U KR940021410U (ko) | 1993-02-04 | 1993-02-04 | 번인(Burn-In) 테스트모드 발생회로 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR940021410U true KR940021410U (ko) | 1994-09-24 |
Family
ID=60672329
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019930001420U KR940021410U (ko) | 1993-02-04 | 1993-02-04 | 번인(Burn-In) 테스트모드 발생회로 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR940021410U (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100530868B1 (ko) * | 1997-07-31 | 2006-02-09 | 삼성전자주식회사 | 내부 전원 전압 발생 회로들을 갖는 반도체 장치 |
-
1993
- 1993-02-04 KR KR2019930001420U patent/KR940021410U/ko not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100530868B1 (ko) * | 1997-07-31 | 2006-02-09 | 삼성전자주식회사 | 내부 전원 전압 발생 회로들을 갖는 반도체 장치 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WITN | Withdrawal due to no request for examination |