KR900021177U - Tab번인 시험용 소켓 - Google Patents

Tab번인 시험용 소켓

Info

Publication number
KR900021177U
KR900021177U KR2019900006601U KR900006601U KR900021177U KR 900021177 U KR900021177 U KR 900021177U KR 2019900006601 U KR2019900006601 U KR 2019900006601U KR 900006601 U KR900006601 U KR 900006601U KR 900021177 U KR900021177 U KR 900021177U
Authority
KR
South Korea
Prior art keywords
burn
tab
test socket
socket
test
Prior art date
Application number
KR2019900006601U
Other languages
English (en)
Other versions
KR940002667Y1 (ko
Inventor
헬로프 피터슨 커트
파블로 리오스 주안
Original Assignee
미네소타 마이닝 앤드 매뉴팩츄어링 컴패니
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 미네소타 마이닝 앤드 매뉴팩츄어링 컴패니 filed Critical 미네소타 마이닝 앤드 매뉴팩츄어링 컴패니
Publication of KR900021177U publication Critical patent/KR900021177U/ko
Application granted granted Critical
Publication of KR940002667Y1 publication Critical patent/KR940002667Y1/ko

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
    • H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
    • H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0475—Sockets for IC's or transistors for TAB IC's

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)
KR2019900006601U 1989-05-19 1990-05-17 Tab번인 시험용 소켓 KR940002667Y1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/354,903 US4986760A (en) 1989-05-19 1989-05-19 Socket for tab burn-in and test
US354903 1989-05-19

Publications (2)

Publication Number Publication Date
KR900021177U true KR900021177U (ko) 1990-12-14
KR940002667Y1 KR940002667Y1 (ko) 1994-04-22

Family

ID=23395390

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900006601U KR940002667Y1 (ko) 1989-05-19 1990-05-17 Tab번인 시험용 소켓

Country Status (4)

Country Link
US (1) US4986760A (ko)
JP (1) JPH0717024Y2 (ko)
KR (1) KR940002667Y1 (ko)
DE (1) DE9004918U1 (ko)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5634267A (en) * 1991-06-04 1997-06-03 Micron Technology, Inc. Method and apparatus for manufacturing known good semiconductor die
JPH0715826B2 (ja) * 1989-12-28 1995-02-22 山一電機工業株式会社 Ｉｃソケット
JP3022593B2 (ja) * 1990-10-31 2000-03-21 株式会社秩父富士 Ｉｃソケット
JPH0736343B2 (ja) * 1991-05-02 1995-04-19 山一電機株式会社 電気部品用ソケット
US5177436A (en) * 1991-05-21 1993-01-05 Aseco Corporation Contactor for testing integrated circuit chips mounted in molded carrier rings
US5247250A (en) * 1992-03-27 1993-09-21 Minnesota Mining And Manufacturing Company Integrated circuit test socket
US5440231A (en) * 1993-04-19 1995-08-08 Motorola, Inc. Method and apparatus for coupling a semiconductor device with a tester
JP3054003B2 (ja) * 1993-09-01 2000-06-19 株式会社東芝 Ｉｃコンタクタ
JPH07211416A (ja) * 1994-01-10 1995-08-11 Texas Instr Japan Ltd ソケット
US5376010A (en) * 1994-02-08 1994-12-27 Minnesota Mining And Manufacturing Company Burn-in socket
US5427536A (en) * 1994-03-29 1995-06-27 Minnesota Mining And Manufacturing Company Socket for tab testing
JP3840667B2 (ja) * 1995-01-13 2006-11-01 株式会社エンプラス Ｉｃソケット
US5498970A (en) * 1995-02-06 1996-03-12 Minnesota Mining And Manufacturing Top load socket for ball grid array devices
US5562470A (en) * 1995-06-27 1996-10-08 Minnesota Mining And Manufacturing Company Cam actuated socket for gull wing device
US5791914A (en) * 1995-11-21 1998-08-11 Loranger International Corporation Electrical socket with floating guide plate
US5788524A (en) * 1996-07-22 1998-08-04 Itt Manufacturing Enterprises Inc. Test clip with standard interface
JP2008041322A (ja) * 2006-08-02 2008-02-21 Three M Innovative Properties Co Ｉｃソケット
KR20110079702A (ko) 2008-10-14 2011-07-07 솔베이(소시에떼아노님) 비닐 할라이드 중합체에 기초한 조성물

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4176895A (en) * 1978-09-27 1979-12-04 Burroughs Corporation High density double contacting connector assembly for leadless integrated circuit packages
US4341433A (en) * 1979-05-14 1982-07-27 Amp Incorporated Active device substrate connector
US4376560A (en) * 1980-12-15 1983-03-15 Amp Incorporated Socket for a ceramic chip carrier
US4378139A (en) * 1981-07-14 1983-03-29 Wells Electronics, Inc. Integrated circuit carrier connector
US4553805A (en) * 1984-01-23 1985-11-19 E. I. Du Pont De Nemours And Company Chip carrier connector
US4630875A (en) * 1984-07-02 1986-12-23 Amp Incorporated Chip carrier socket which requires low insertion force for the chip carrier
JPS61219874A (ja) * 1985-03-27 1986-09-30 Hitachi Micro Comput Eng Ltd ソケツト
US4799897A (en) * 1985-12-30 1989-01-24 Dai-Ichi Seiko Kabushiki Kaisha IC tester socket
JPS62165161A (ja) * 1986-01-17 1987-07-21 Nippon Texas Instr Kk ソケツト
JPH0518708Y2 (ko) * 1986-04-14 1993-05-18
JPS6317550A (ja) * 1986-07-10 1988-01-25 Yamaichi Electric Mfg Co Ltd Ｉｃ載接形ソケツト
JPH01119043A (ja) * 1987-10-31 1989-05-11 Yamaichi Electric Mfg Co Ltd Ｉｃソケット

Also Published As

Publication number Publication date
JPH02148483U (ko) 1990-12-17
DE9004918U1 (de) 1990-08-16
KR940002667Y1 (ko) 1994-04-22
US4986760A (en) 1991-01-22
JPH0717024Y2 (ja) 1995-04-19

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20020416

Year of fee payment: 9

LAPS Lapse due to unpaid annual fee