KR930026515U - 반도체 식각장치 - Google Patents
반도체 식각장치Info
- Publication number
- KR930026515U KR930026515U KR2019920008094U KR920008094U KR930026515U KR 930026515 U KR930026515 U KR 930026515U KR 2019920008094 U KR2019920008094 U KR 2019920008094U KR 920008094 U KR920008094 U KR 920008094U KR 930026515 U KR930026515 U KR 930026515U
- Authority
- KR
- South Korea
- Prior art keywords
- etching device
- semiconductor etching
- semiconductor
- etching
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Weting (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019920008094U KR0129924Y1 (ko) | 1992-05-13 | 1992-05-13 | 반도체 식각장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019920008094U KR0129924Y1 (ko) | 1992-05-13 | 1992-05-13 | 반도체 식각장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930026515U true KR930026515U (ko) | 1993-12-28 |
KR0129924Y1 KR0129924Y1 (ko) | 1999-02-01 |
Family
ID=19333043
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019920008094U KR0129924Y1 (ko) | 1992-05-13 | 1992-05-13 | 반도체 식각장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0129924Y1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG92720A1 (en) * | 1999-07-14 | 2002-11-19 | Nisso Engineering Co Ltd | Method and apparatus for etching silicon |
-
1992
- 1992-05-13 KR KR2019920008094U patent/KR0129924Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0129924Y1 (ko) | 1999-02-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20060720 Year of fee payment: 9 |
|
EXPY | Expiration of term |