KR930012346U - Ic칩의 테스트 모드제어회로 - Google Patents

Ic칩의 테스트 모드제어회로

Info

Publication number
KR930012346U
KR930012346U KR2019910019226U KR910019226U KR930012346U KR 930012346 U KR930012346 U KR 930012346U KR 2019910019226 U KR2019910019226 U KR 2019910019226U KR 910019226 U KR910019226 U KR 910019226U KR 930012346 U KR930012346 U KR 930012346U
Authority
KR
South Korea
Prior art keywords
control circuit
test mode
mode control
chip test
chip
Prior art date
Application number
KR2019910019226U
Other languages
English (en)
Other versions
KR0123056Y1 (ko
Inventor
강선호
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019910019226U priority Critical patent/KR0123056Y1/ko
Publication of KR930012346U publication Critical patent/KR930012346U/ko
Application granted granted Critical
Publication of KR0123056Y1 publication Critical patent/KR0123056Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019910019226U 1991-11-12 1991-11-12 Ic칩의 테스트 모드제어회로 KR0123056Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910019226U KR0123056Y1 (ko) 1991-11-12 1991-11-12 Ic칩의 테스트 모드제어회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910019226U KR0123056Y1 (ko) 1991-11-12 1991-11-12 Ic칩의 테스트 모드제어회로

Publications (2)

Publication Number Publication Date
KR930012346U true KR930012346U (ko) 1993-06-25
KR0123056Y1 KR0123056Y1 (ko) 1999-02-18

Family

ID=19322038

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910019226U KR0123056Y1 (ko) 1991-11-12 1991-11-12 Ic칩의 테스트 모드제어회로

Country Status (1)

Country Link
KR (1) KR0123056Y1 (ko)

Also Published As

Publication number Publication date
KR0123056Y1 (ko) 1999-02-18

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