KR920022046A - 내식막 물질 및 이의 사용방법 - Google Patents
내식막 물질 및 이의 사용방법 Download PDFInfo
- Publication number
- KR920022046A KR920022046A KR1019920008223A KR920008223A KR920022046A KR 920022046 A KR920022046 A KR 920022046A KR 1019920008223 A KR1019920008223 A KR 1019920008223A KR 920008223 A KR920008223 A KR 920008223A KR 920022046 A KR920022046 A KR 920022046A
- Authority
- KR
- South Korea
- Prior art keywords
- acid
- substituent
- relief
- resist layer
- generating material
- Prior art date
Links
- 239000000463 material Substances 0.000 title claims 6
- 239000002253 acid Substances 0.000 claims 9
- 238000000034 method Methods 0.000 claims 8
- 125000001424 substituent group Chemical group 0.000 claims 4
- 125000000217 alkyl group Chemical group 0.000 claims 2
- 229910052739 hydrogen Inorganic materials 0.000 claims 2
- 239000001257 hydrogen Substances 0.000 claims 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims 1
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 claims 1
- 125000004093 cyano group Chemical group *C#N 0.000 claims 1
- 229910052736 halogen Inorganic materials 0.000 claims 1
- 150000002367 halogens Chemical class 0.000 claims 1
- 150000002431 hydrogen Chemical class 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 claims 1
- 125000001624 naphthyl group Chemical group 0.000 claims 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims 1
- 230000005855 radiation Effects 0.000 claims 1
- 230000009257 reactivity Effects 0.000 claims 1
- 238000007493 shaping process Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/122—Sulfur compound containing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Materials For Photolithography (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Formation Of Insulating Films (AREA)
Abstract
내용 없음.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
Claims (9)
- 장치 기판 위에 내식막 층〔여기서, 내식막 층은 화학선에 노광시 산을 발생시켜 내식막 층에서의 용해도 변경을 유도하는 산 발생 물질을 포함한다〕을 형성시키고, 당해 내식막층을 화학선에 노광시켜 목적하는 패턴 또는 부조 (浮彫; relief)를 수득한 다음, 당해 패턴 또는 부조를 형상시키는 단계들을 포함하는 장치의 제조방법에 있어서, 산 발생 물질이 하기 일반식으로 나타내어지는 조성물을 포함함을 특징으로 하는 장치 제조방법.상기식에서, X는 0 또는 1이고, A는 방향족 사이클릭, 카보닐 또는 시아노 잔기이며, R1, R2, R3및 R5는 산이 안정하도록 선택된다.
- 제1항에 있어서, R1, R2, R3및 R5가 모두 수소인 방법.
- 제1항에 있어서, A가 페닐 또는 나프틸인 방법.
- 제3항에 있어서, A가 치환체인 R4, 또는 R6이 할로겐인 방법.
- 제3항에 있어서, A의 치환체인 R4또는 R6이 메톡시인 방법.
- 제1항에 있어서, A의 치환체인 R4또는 R6이 산불안정성이 되도록 선택하여 산 발생 물질이 산 감지성 물질로서도 작용하도록 하는 방법.
- 제1항에 있어서, R1, R2, R3및 R5가 각각 독립적으로 수소, 저급 알킬 또·는 치환된 저급 알킬인 방법.
- 제1항에 있어서, A의 치환체인 R4,또는 R6이 목적하는 방사선 감지도, 용해도 또는 반응도 특성을 수득하도록 선택된 방법.
- 제1항에 있어서, 산이 산 감지성 물질과 상호작용하는 방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US70256491A | 1991-05-20 | 1991-05-20 | |
US7/702564 | 1991-05-20 | ||
US07/702564 | 1991-05-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920022046A true KR920022046A (ko) | 1992-12-19 |
KR100206623B1 KR100206623B1 (ko) | 1999-07-01 |
Family
ID=24821740
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920008223A KR100206623B1 (ko) | 1991-05-20 | 1992-05-15 | 내식막 물질 및 이의 사용방법 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5374504A (ko) |
EP (1) | EP0515079B1 (ko) |
JP (1) | JP2662141B2 (ko) |
KR (1) | KR100206623B1 (ko) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5344742A (en) * | 1993-04-21 | 1994-09-06 | Shipley Company Inc. | Benzyl-substituted photoactive compounds and photoresist compositions comprising same |
JP3589365B2 (ja) * | 1996-02-02 | 2004-11-17 | 富士写真フイルム株式会社 | ポジ画像形成組成物 |
JP4029625B2 (ja) * | 2002-02-12 | 2008-01-09 | 三菱電機株式会社 | マスクブランク、並びにマスクブランクの製造方法とフォトマスクの製造方法 |
US7314700B2 (en) * | 2002-12-05 | 2008-01-01 | International Business Machines Corporation | High sensitivity resist compositions for electron-based lithography |
EP1586005B1 (en) * | 2002-12-05 | 2010-08-11 | International Business Machines Corporation | High sensitivity resist compositions for electron-based lithography |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1204495A (en) * | 1967-01-03 | 1970-09-09 | Agfa Gevaert Nv | Light sensitive compounds, and compositions and recording materials containing them |
US3779778A (en) * | 1972-02-09 | 1973-12-18 | Minnesota Mining & Mfg | Photosolubilizable compositions and elements |
US4708925A (en) * | 1984-12-11 | 1987-11-24 | Minnesota Mining And Manufacturing Company | Photosolubilizable compositions containing novolac phenolic resin |
JPS63265242A (ja) * | 1987-04-23 | 1988-11-01 | Fuji Photo Film Co Ltd | 多色画像形成方法 |
US4996136A (en) * | 1988-02-25 | 1991-02-26 | At&T Bell Laboratories | Radiation sensitive materials and devices made therewith |
JP2540199B2 (ja) * | 1988-02-25 | 1996-10-02 | アメリカン テレフォン アンド テレグラフ カムパニー | デバイスの製造方法 |
JPH02265950A (ja) * | 1989-04-05 | 1990-10-30 | Kanto Chem Co Inc | ポジ型レジスト組成物 |
DE3921459A1 (de) * | 1989-06-30 | 1991-01-03 | Merck Patent Gmbh | Strahlungshaertbare bindemittelsysteme mit (alpha)-substituierten sulfonylverbindungen als fotoaktivatoren |
-
1992
- 1992-05-01 JP JP4137577A patent/JP2662141B2/ja not_active Expired - Lifetime
- 1992-05-12 EP EP92304287A patent/EP0515079B1/en not_active Expired - Lifetime
- 1992-05-15 KR KR1019920008223A patent/KR100206623B1/ko not_active IP Right Cessation
-
1993
- 1993-05-11 US US08/060,468 patent/US5374504A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5374504A (en) | 1994-12-20 |
JP2662141B2 (ja) | 1997-10-08 |
JPH07225473A (ja) | 1995-08-22 |
EP0515079B1 (en) | 1999-08-25 |
EP0515079A1 (en) | 1992-11-25 |
KR100206623B1 (ko) | 1999-07-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR920020276A (ko) | 패턴형성용 레지스트 | |
KR980003842A (ko) | 중합체 및 레지스트 물질 | |
KR910006777A (ko) | 포지티브-작용성 감조사성 혼합물 및 이로부터 제조된 감조사성 복사물질 | |
KR970066718A (ko) | 감방사선성 수지 조성물 | |
KR960032093A (ko) | 화학 증폭형 감방사선성 수지 조성물 | |
KR930006498A (ko) | 감방사선성 조성물 | |
JPS55156953A (en) | Organic semiconductor electrophotographic material | |
KR930022149A (ko) | 에너지 감응 재료와 그 사용 방법 | |
KR930002880A (ko) | 감광성 조성물 | |
DE60320081D1 (de) | Photothermographisches Material | |
KR870007454A (ko) | 포토레지스트 현상방법 | |
KR920022046A (ko) | 내식막 물질 및 이의 사용방법 | |
JPS6025061B2 (ja) | 感光性シリコ−ン樹脂組成物 | |
KR850002377A (ko) | 살충제 조성물 | |
JPS5780451A (en) | Hardening of gelatin | |
SE7712054L (sv) | Stralningskensligt element | |
KR960024674A (ko) | 방사선-민감성 조성물에 사용되는 광산 생성 조성물 | |
KR890012191A (ko) | 만니히 염기 및 요오드늄 염을 갖는 감광제 및 중합성 조성물 | |
KR890007120A (ko) | 염료를 함유하는 양성-작용성 감광성 조성물 및 이러한 조성물로부터 제조된 양성-작용성 감광성 기록물질 | |
JP2002006495A5 (ko) | ||
ATE222541T1 (de) | Verfahren zur herstellung von elektronischen bauteilen | |
KR890014565A (ko) | 실리콘 나프탈로시아닌 및 이것을 함유하는 방사선 감응 코우팅박막 | |
KR920001242A (ko) | 포지티브 레지스트 조성물 | |
KR830007025A (ko) | 감광성 (感光性)조성물 및 그것을 사용한 패터언 형성방법 | |
KR960015087A (ko) | 중합체 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
LAPS | Lapse due to unpaid annual fee |