KR930006498A - 감방사선성 조성물 - Google Patents
감방사선성 조성물 Download PDFInfo
- Publication number
- KR930006498A KR930006498A KR1019920016240A KR920016240A KR930006498A KR 930006498 A KR930006498 A KR 930006498A KR 1019920016240 A KR1019920016240 A KR 1019920016240A KR 920016240 A KR920016240 A KR 920016240A KR 930006498 A KR930006498 A KR 930006498A
- Authority
- KR
- South Korea
- Prior art keywords
- group
- radiation
- alkyl group
- radiation sensitive
- germanyl
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/04—Chromates
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
- Y10S430/111—Polymer of unsaturated acid or ester
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/12—Nitrogen compound containing
- Y10S430/121—Nitrogen in heterocyclic ring
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/122—Sulfur compound containing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/126—Halogen compound containing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Materials For Photolithography (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Abstract
본 발명의 감방사선성 조성물은 (A)하기 식(1)
(여기에서, R1은 치환 메틸기, 치환 에틸기, 실릴기, 게르밀기 또는 알콕시 카르보닐기를 나타내고, R2는 -OR3또는 -NR4R5를 나타내며, 단, R3은 수소원자, 직쇄 알킬기, 고리상 알킬기, 아릴킬기, 아릴기, 치환 메틸기, 치환 에틸기. 실릴기, 게르밀기 또는 알콕시 카르보닐기를 나타내고, R4및 R5는, 동일하거나 또는 상이한 것으로서, 수소원자, 직쇄 알킬기, 고리상 알킬기, 아랄킬기 또는 아릴기를 나타낸다)로 표시되는 반복 단위를 갖는 중합체 및(B)감방사선성 산 형성제를 함유하는 것을 특징으로 한다.
본 발명의 감방사선성 조성물은 엑시머레이저 등의 원자오선, 신크로트론 방사선 등의 X건, 전자선 등의 하전방사선과 같은 방사선의 어느 것에도 대응할 수 있으므로, 이후 미세화가 진행한다고 예상되는 집적회로 제조용의 레지스트로서 유리하게 사용할 수 있다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
Claims (1)
- (A)하기 식(1)로 표시되는 반복 단위를 갖는 중합체 및 (B)감방사선성 산 형성제를 함유하는 것을 특징으로 하는 감방사선성 조성물.식중, R1은 치환 메틸기, 치환 에틸기, 실릴기, 게르밀기 또는 알콕시카르보닐기를 나타내고, R2는 -OR3또는 -NR4R5를 나타내며, 단, R3은 수소원자, 직쇄 알킬기, 고리상 알킬기, 아랄킬기, 아릴기, 치환 메틸기, 치환에틸기, 실릴기, 게르밀기 또는 알콕시 카르보닐기를 나타내고, R4및 R5는, 동일하거나 또는 상이한 것으로서, 수소원자, 직쇄 알킬기, 고리상 알킬기, 아랄킬기 또는 알릴기를 나타낸다.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25422591 | 1991-09-06 | ||
JP91-254225 | 1991-09-06 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930006498A true KR930006498A (ko) | 1993-04-21 |
KR100198177B1 KR100198177B1 (ko) | 1999-06-15 |
Family
ID=17262004
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019920016240A KR100198177B1 (ko) | 1991-09-06 | 1992-09-05 | 감방사선성 조성물 |
Country Status (3)
Country | Link |
---|---|
US (2) | US5332650A (ko) |
KR (1) | KR100198177B1 (ko) |
DE (1) | DE4229816A1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100854743B1 (ko) * | 2002-08-30 | 2008-08-27 | 엘지전자 주식회사 | 밀폐형 압축기의 크랭크축 |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5332650A (en) * | 1991-09-06 | 1994-07-26 | Japan Synthetic Rubber Co., Ltd. | Radiation-sensitive composition |
DE4136213A1 (de) * | 1991-11-02 | 1993-05-06 | Basf Ag, 6700 Ludwigshafen, De | Positiv arbeitendes strahlungsempfindliches gemisch und verfahren zur herstellung von reliefmustern |
US5580695A (en) * | 1992-02-25 | 1996-12-03 | Japan Synthetic Rubber Co., Ltd. | Chemically amplified resist |
KR100341563B1 (ko) * | 1992-03-23 | 2002-10-25 | 제이에스알 가부시끼가이샤 | 레지스트도포조성물 |
FR2693205B1 (fr) * | 1992-07-02 | 1994-09-02 | Inst Francais Du Petrole | Compositions de revêtement gravables notamment pour rouleaux d'imprimerie, procédé d'enduction et objets fabriqués par ce procédé. |
EP0588544A3 (en) * | 1992-09-14 | 1994-09-28 | Wako Pure Chem Ind Ltd | Fine pattern forming material and pattern formation process |
US6010824A (en) * | 1992-11-10 | 2000-01-04 | Tokyo Ohka Kogyo Co., Ltd. | Photosensitive resin composition containing a triazine compound and a pre-sensitized plate using the same, and photosensitive resin composition containing acridine and triazine compounds and a color filter and a pre-sensitized plate using the same |
JPH06214395A (ja) * | 1993-01-18 | 1994-08-05 | Sumitomo Chem Co Ltd | ポジ型フォトレジスト組成物 |
KR100233367B1 (ko) * | 1993-04-15 | 1999-12-01 | 카나가와 치히로 | 레지스트 재료 |
KR960015081A (ko) * | 1993-07-15 | 1996-05-22 | 마쯔모또 에이이찌 | 화학증폭형 레지스트 조성물 |
US5514502A (en) * | 1993-08-16 | 1996-05-07 | Fuji Photo Film Co., Ltd. | Photopolymerizable composition, color filter, and production of color filter |
EP0689098B1 (de) * | 1994-06-22 | 2000-08-16 | Ciba SC Holding AG | Positiv-Photoresist |
DE4430680A1 (de) * | 1994-08-29 | 1996-03-07 | Hoechst Ag | Lichtempfindliches Gemisch |
US5558971A (en) * | 1994-09-02 | 1996-09-24 | Wako Pure Chemical Industries, Ltd. | Resist material |
EP0716344A1 (en) * | 1994-12-05 | 1996-06-12 | Konica Corporation | Light-sensitive composition and light-sensitive lithographic printing plate using the same |
US5952150A (en) * | 1995-06-08 | 1999-09-14 | Jsr Corporation | Radiation sensitive resin composition |
GB9520950D0 (en) * | 1995-10-13 | 1995-12-13 | Martinex R & D Inc | Water-processable chemically amplified resist |
JP2845225B2 (ja) * | 1995-12-11 | 1999-01-13 | 日本電気株式会社 | 高分子化合物、それを用いた感光性樹脂組成物およびパターン形成方法 |
US5962180A (en) * | 1996-03-01 | 1999-10-05 | Jsr Corporation | Radiation sensitive composition |
DE69712988T2 (de) * | 1996-07-18 | 2002-11-21 | Jsr Corp | Strahlungsempfindliche Harzzusammensetzung |
US5994023A (en) * | 1996-07-19 | 1999-11-30 | Agfa-Gevaert, N.V. | Acid-sensitive substance and photosensitive compositions therewith |
EP0819986B1 (en) * | 1996-07-19 | 2002-03-27 | Agfa-Gevaert | Imaging element for making lithographic printing plates |
US6074800A (en) * | 1998-04-23 | 2000-06-13 | International Business Machines Corporation | Photo acid generator compounds, photo resists, and method for improving bias |
EP0952166B1 (de) | 1998-04-24 | 2003-06-25 | Infineon Technologies AG | Filmbildende Polymere |
DE59908549D1 (de) * | 1998-04-24 | 2004-03-25 | Infineon Technologies Ag | Strahlungsempfindliches Gemisch und dessen Verwendung |
US6365321B1 (en) * | 1999-04-13 | 2002-04-02 | International Business Machines Corporation | Blends of hydroxystyrene polymers for use in chemically amplified positive resist formulations |
KR100299689B1 (ko) * | 1999-08-30 | 2001-09-13 | 한의섭 | 포지티브형 포토레지스트 조성물 |
KR100455652B1 (ko) | 1999-09-06 | 2004-11-06 | 삼성전자주식회사 | 포지티브형 포토레지스트 막의 제조방법 |
US6346362B1 (en) * | 2000-06-15 | 2002-02-12 | International Business Machines Corporation | Polymers and use thereof |
KR20020082006A (ko) * | 2001-04-23 | 2002-10-30 | 금호석유화학 주식회사 | 신규한 산-민감성 중합체 및 이를 함유하는 레지스트 조성물 |
JP2003107707A (ja) * | 2001-09-28 | 2003-04-09 | Clariant (Japan) Kk | 化学増幅型ポジ型感放射線性樹脂組成物 |
JP4222850B2 (ja) | 2003-02-10 | 2009-02-12 | Spansion Japan株式会社 | 感放射線性樹脂組成物、その製造法並びにそれを用いた半導体装置の製造方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5421089B2 (ko) * | 1973-05-29 | 1979-07-27 | ||
US4539286A (en) * | 1983-06-06 | 1985-09-03 | Dynachem Corporation | Flexible, fast processing, photopolymerizable composition |
EP0164083B1 (de) * | 1984-06-07 | 1991-05-02 | Hoechst Aktiengesellschaft | Positiv arbeitende strahlungsempfindliche Beschichtungslösung |
DE3637717A1 (de) * | 1986-11-05 | 1988-05-11 | Hoechst Ag | Lichtempfindliches gemisch, dieses enthaltendes aufzeichnungsmaterial und verfahren zur herstellung von positiven oder negativen reliefkopien unter verwendung dieses materials |
DE3737734A1 (de) * | 1987-11-06 | 1989-05-18 | Hoechst Ag | Strahlungsempfindliches gemisch |
US5169741A (en) * | 1988-10-11 | 1992-12-08 | Matsushita Electric Industrial Co., Ltd. | Method for forming high sensitivity positive patterns employing a material containing a photosensitive compound having a diazo group, an alkaline-soluble polymer, a compound capable of adjusting the pH to 4 or less and a solvent |
EP0430302B1 (en) * | 1989-12-01 | 1996-10-09 | Tosoh Corporation | Positive photosensitive compositions for forming lenses |
US5068168A (en) * | 1990-12-20 | 1991-11-26 | Monsanto Company | Styrene/maleates terpolymers |
US5332650A (en) * | 1991-09-06 | 1994-07-26 | Japan Synthetic Rubber Co., Ltd. | Radiation-sensitive composition |
US5346803A (en) * | 1993-09-15 | 1994-09-13 | Shin-Etsu Chemical Co., Ltd. | Photoresist composition comprising a copolymer having a di-t-butyl fumarate |
-
1992
- 1992-09-04 US US07/940,264 patent/US5332650A/en not_active Expired - Lifetime
- 1992-09-05 KR KR1019920016240A patent/KR100198177B1/ko not_active IP Right Cessation
- 1992-09-07 DE DE4229816A patent/DE4229816A1/de not_active Ceased
-
1994
- 1994-06-21 US US08/263,421 patent/US5482816A/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100854743B1 (ko) * | 2002-08-30 | 2008-08-27 | 엘지전자 주식회사 | 밀폐형 압축기의 크랭크축 |
Also Published As
Publication number | Publication date |
---|---|
US5482816A (en) | 1996-01-09 |
US5332650A (en) | 1994-07-26 |
KR100198177B1 (ko) | 1999-06-15 |
DE4229816A1 (de) | 1993-03-11 |
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