KR920008421B1 - - Google Patents

Info

Publication number
KR920008421B1
KR920008421B1 KR8907198A KR890007198A KR920008421B1 KR 920008421 B1 KR920008421 B1 KR 920008421B1 KR 8907198 A KR8907198 A KR 8907198A KR 890007198 A KR890007198 A KR 890007198A KR 920008421 B1 KR920008421 B1 KR 920008421B1
Authority
KR
South Korea
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
KR8907198A
Other languages
Korean (ko)
Other versions
KR900019221A (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR900019221A publication Critical patent/KR900019221A/ko
Application granted granted Critical
Publication of KR920008421B1 publication Critical patent/KR920008421B1/ko
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H7/00—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions
    • H02H7/20—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions for electronic equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H5/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection
    • H02H5/04—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature
    • H02H5/044—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature using a semiconductor device to sense the temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Bipolar Integrated Circuits (AREA)
KR1019890007198A 1988-05-31 1989-05-30 온도검출수단을 갖는 반도체 집적회로 장치 Granted KR900019221A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP63-133659 1988-05-31
JP63133659A JPH01302849A (ja) 1988-05-31 1988-05-31 半導体集積回路装置

Publications (2)

Publication Number Publication Date
KR900019221A KR900019221A (ko) 1990-12-24
KR920008421B1 true KR920008421B1 (cg-RX-API-DMAC7.html) 1992-09-28

Family

ID=15109938

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890007198A Granted KR900019221A (ko) 1988-05-31 1989-05-30 온도검출수단을 갖는 반도체 집적회로 장치

Country Status (3)

Country Link
EP (1) EP0344715A3 (cg-RX-API-DMAC7.html)
JP (1) JPH01302849A (cg-RX-API-DMAC7.html)
KR (1) KR900019221A (cg-RX-API-DMAC7.html)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5461252A (en) * 1992-10-06 1995-10-24 Matsushita Electric Industrial Co., Ltd. Semiconductor device comprising an over-temperature detection element for detecting excessive temperature of amplifiers
JP3869815B2 (ja) 2003-03-31 2007-01-17 Ｎｅｃエレクトロニクス株式会社 半導体集積回路装置
JP3810411B2 (ja) 2004-01-23 2006-08-16 Ｎｅｃエレクトロニクス株式会社 集積回路装置
JP4541717B2 (ja) 2004-02-09 2010-09-08 ルネサスエレクトロニクス株式会社 集積回路装置及びその製造方法
JP4620962B2 (ja) 2004-03-30 2011-01-26 ルネサスエレクトロニクス株式会社 集積回路装置の製造方法及び酸化バナジウム膜の形成方法
JP4536408B2 (ja) 2004-03-30 2010-09-01 ルネサスエレクトロニクス株式会社 集積回路装置
JP4541742B2 (ja) 2004-03-30 2010-09-08 ルネサスエレクトロニクス株式会社 集積回路装置
JP4535367B2 (ja) 2004-05-24 2010-09-01 ルネサスエレクトロニクス株式会社 集積回路装置
CN100389308C (zh) * 2004-05-26 2008-05-21 鸿富锦精密工业（深圳）有限公司 芯片温测装置及其温测方法
KR100736403B1 (ko) * 2005-08-19 2007-07-09 삼성전자주식회사 온도 검출기, 온도 검출방법, 및 상기 온도 검출기를구비하는 반도체 장치
JP4524688B2 (ja) * 2007-01-23 2010-08-18 エルピーダメモリ株式会社 基準電圧発生回路及び半導体集積回路装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3916263A (en) * 1971-12-13 1975-10-28 Honeywell Inf Systems Memory driver circuit with thermal protection
DE3415764A1 (de) * 1984-04-27 1985-10-31 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung zur temperaturueberwachung integrierter schaltungen
US4667265A (en) * 1985-12-20 1987-05-19 National Semiconductor Corporation Adaptive thermal shutdown circuit
JPS6315528A (ja) * 1986-07-08 1988-01-22 Nec Corp 半導体装置
JPS63124618A (ja) * 1986-11-14 1988-05-28 Nec Corp 論理ゲ−ト駆動制御回路

Also Published As

Publication number Publication date
EP0344715A3 (en) 1991-03-27
EP0344715A2 (en) 1989-12-06
KR900019221A (ko) 1990-12-24
JPH01302849A (ja) 1989-12-06

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Legal Events

Date Code Title Description
A201 Request for examination
SUBM Surrender of laid-open application requested