KR920008246B1 - A semiconductor memory circuit - Google Patents
A semiconductor memory circuitInfo
- Publication number
- KR920008246B1 KR920008246B1 KR8901414A KR890001414A KR920008246B1 KR 920008246 B1 KR920008246 B1 KR 920008246B1 KR 8901414 A KR8901414 A KR 8901414A KR 890001414 A KR890001414 A KR 890001414A KR 920008246 B1 KR920008246 B1 KR 920008246B1
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor memory
- memory circuit
- circuit
- semiconductor
- memory
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/04—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using capacitive elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63-27220 | 1988-02-08 | ||
JP63027220A JPH01204298A (ja) | 1988-02-08 | 1988-02-08 | 半導体記憶回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR890013652A KR890013652A (ko) | 1989-09-25 |
KR920008246B1 true KR920008246B1 (en) | 1992-09-25 |
Family
ID=12215017
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR8901414A KR920008246B1 (en) | 1988-02-08 | 1989-02-08 | A semiconductor memory circuit |
Country Status (5)
Country | Link |
---|---|
US (1) | US5079746A (ko) |
EP (1) | EP0328458B1 (ko) |
JP (1) | JPH01204298A (ko) |
KR (1) | KR920008246B1 (ko) |
DE (1) | DE68915018T2 (ko) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0834257B2 (ja) * | 1990-04-20 | 1996-03-29 | 株式会社東芝 | 半導体メモリセル |
JPH07122989B2 (ja) * | 1990-06-27 | 1995-12-25 | 株式会社東芝 | 半導体記憶装置 |
US5208780A (en) * | 1990-07-17 | 1993-05-04 | Kabushiki Kaisha Toshiba | Structure of electrically programmable read-only memory cells and redundancy signature therefor |
JP2564046B2 (ja) * | 1991-02-13 | 1996-12-18 | 株式会社東芝 | 半導体記憶装置 |
JP2660111B2 (ja) * | 1991-02-13 | 1997-10-08 | 株式会社東芝 | 半導体メモリセル |
US5276653A (en) * | 1991-02-13 | 1994-01-04 | Mckenny Vernon G | Fuse protection circuit |
DE69222793T2 (de) * | 1991-03-14 | 1998-03-12 | Toshiba Kawasaki Kk | Halbleiterspeicheranordnung |
JP3181311B2 (ja) * | 1991-05-29 | 2001-07-03 | 株式会社東芝 | 半導体記憶装置 |
JP3464803B2 (ja) * | 1991-11-27 | 2003-11-10 | 株式会社東芝 | 半導体メモリセル |
US5381364A (en) * | 1993-06-24 | 1995-01-10 | Ramtron International Corporation | Ferroelectric-based RAM sensing scheme including bit-line capacitance isolation |
US5787044A (en) * | 1995-10-23 | 1998-07-28 | Micron Technology, Inc. | Memory-cell array and a method for repairing the same |
KR100214462B1 (ko) * | 1995-11-27 | 1999-08-02 | 구본준 | 반도체메모리셀의 라이트 방법 |
US6188239B1 (en) * | 1996-08-12 | 2001-02-13 | Micron Technology, Inc. | Semiconductor programmable test arrangement such as an antifuse to ID circuit having common access switches and/or common programming switches |
US5909049A (en) * | 1997-02-11 | 1999-06-01 | Actel Corporation | Antifuse programmed PROM cell |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5828750B2 (ja) * | 1979-12-25 | 1983-06-17 | 富士通株式会社 | 半導体装置 |
EP0229081A4 (en) * | 1985-07-09 | 1990-03-22 | Motorola Inc | ADAPTABLE LINE DRIVER CIRCUIT AND OUTPUT CIRCUIT FOR PROGRAMMABLE READ-ONLY MEMORY. |
US4782466A (en) * | 1985-09-04 | 1988-11-01 | Fujitsu Limited | Programmable semiconductor read only memory device |
-
1988
- 1988-02-08 JP JP63027220A patent/JPH01204298A/ja active Pending
-
1989
- 1989-02-07 US US07/306,961 patent/US5079746A/en not_active Expired - Fee Related
- 1989-02-08 EP EP89400361A patent/EP0328458B1/en not_active Expired - Lifetime
- 1989-02-08 DE DE68915018T patent/DE68915018T2/de not_active Expired - Fee Related
- 1989-02-08 KR KR8901414A patent/KR920008246B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE68915018D1 (de) | 1994-06-09 |
DE68915018T2 (de) | 1994-08-18 |
EP0328458A3 (en) | 1992-01-02 |
JPH01204298A (ja) | 1989-08-16 |
EP0328458B1 (en) | 1994-05-04 |
EP0328458A2 (en) | 1989-08-16 |
US5079746A (en) | 1992-01-07 |
KR890013652A (ko) | 1989-09-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB2215913B (en) | Semiconductor memory device | |
GB2189958B (en) | A semiconductor intergrated circuit memory | |
EP0423495A3 (en) | A semiconductor memory device | |
GB2227109B (en) | Semiconductor memory device | |
HK42290A (en) | A semiconductor memory device | |
EP0116464A3 (en) | A semiconductor memory device | |
EP0352193A3 (en) | Semiconductor memory device | |
EP0172016A3 (en) | Semiconductor memory device having a redundancy circuit | |
EP0459521A3 (en) | Semiconductor memory device with a redundancy circuit | |
DE3479937D1 (en) | A semiconductor memory device | |
EP0364110A3 (en) | Semiconductor memory device having a serial access memory | |
EP0136170A3 (en) | A semiconductor memory device | |
EP0472095A3 (en) | Semiconductor memory device having a boost circuit | |
EP0474238A3 (en) | Semiconductor memory circuit | |
EP0166540A3 (en) | A semiconductor memory device | |
KR920008246B1 (en) | A semiconductor memory circuit | |
GB2190558B (en) | Semiconductor memory circuit | |
EP0458351A3 (en) | Semiconductor memory circuit | |
EP0139385A3 (en) | A semiconductor memory device | |
EP0366530A3 (en) | Josephson memory circuit | |
EP0181177A3 (en) | A semiconductor memory device | |
KR0112040Y1 (en) | A semiconductor memory device | |
EP0352111A3 (en) | Semiconductor memory device | |
EP0441388A3 (en) | Semiconductor memory circuit | |
GB2225485B (en) | A semiconductor memory device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
LAPS | Lapse due to unpaid annual fee |