KR910004315B1 - 열전자 유니폴라 트랜지스터 - Google Patents
열전자 유니폴라 트랜지스터 Download PDFInfo
- Publication number
- KR910004315B1 KR910004315B1 KR1019860700621A KR860700621A KR910004315B1 KR 910004315 B1 KR910004315 B1 KR 910004315B1 KR 1019860700621 A KR1019860700621 A KR 1019860700621A KR 860700621 A KR860700621 A KR 860700621A KR 910004315 B1 KR910004315 B1 KR 910004315B1
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- base
- collector
- emitter
- base layer
- Prior art date
Links
- 239000002784 hot electron Substances 0.000 title description 3
- 230000004888 barrier function Effects 0.000 claims description 39
- 239000004065 semiconductor Substances 0.000 claims description 21
- 239000002800 charge carrier Substances 0.000 claims description 4
- 239000002131 composite material Substances 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 119
- 239000007789 gas Substances 0.000 description 14
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 12
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 12
- 239000012535 impurity Substances 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 9
- 239000010703 silicon Substances 0.000 description 9
- 239000000758 substrate Substances 0.000 description 8
- 239000000370 acceptor Substances 0.000 description 7
- 229910052732 germanium Inorganic materials 0.000 description 6
- 230000033001 locomotion Effects 0.000 description 6
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 229910001316 Ag alloy Inorganic materials 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- VDUJLAVRFQNSIN-UHFFFAOYSA-N [Au].[Ge].[Ag] Chemical compound [Au].[Ge].[Ag] VDUJLAVRFQNSIN-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 238000005036 potential barrier Methods 0.000 description 3
- 239000011241 protective layer Substances 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- 230000007480 spreading Effects 0.000 description 3
- 238000003892 spreading Methods 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- FTWRSWRBSVXQPI-UHFFFAOYSA-N alumanylidynearsane;gallanylidynearsane Chemical compound [As]#[Al].[As]#[Ga] FTWRSWRBSVXQPI-UHFFFAOYSA-N 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000010561 standard procedure Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000005641 tunneling Effects 0.000 description 2
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- 108091006149 Electron carriers Proteins 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- FYWVTSQYJIPZLW-UHFFFAOYSA-K diacetyloxygallanyl acetate Chemical compound [Ga+3].CC([O-])=O.CC([O-])=O.CC([O-])=O FYWVTSQYJIPZLW-UHFFFAOYSA-K 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- KWLSQQRRSAWBOQ-UHFFFAOYSA-N dipotassioarsanylpotassium Chemical compound [K][As]([K])[K] KWLSQQRRSAWBOQ-UHFFFAOYSA-N 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000001803 electron scattering Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910021480 group 4 element Inorganic materials 0.000 description 1
- 229910021478 group 5 element Inorganic materials 0.000 description 1
- 229910021476 group 6 element Inorganic materials 0.000 description 1
- 239000004047 hole gas Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 230000005428 wave function Effects 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/7606—Transistor-like structures, e.g. hot electron transistor [HET]; metal base transistor [MBT]
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/689,845 US4691215A (en) | 1985-01-09 | 1985-01-09 | Hot electron unipolar transistor with two-dimensional degenerate electron gas base with continuously graded composition compound emitter |
US689845 | 1985-01-09 | ||
PCT/US1985/002583 WO1986004184A1 (en) | 1985-01-09 | 1985-12-23 | Hot electron unipolar transistor |
Publications (2)
Publication Number | Publication Date |
---|---|
KR880700472A KR880700472A (ko) | 1988-03-15 |
KR910004315B1 true KR910004315B1 (ko) | 1991-06-25 |
Family
ID=24770103
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019860700621A KR910004315B1 (ko) | 1985-01-09 | 1985-12-23 | 열전자 유니폴라 트랜지스터 |
Country Status (9)
Country | Link |
---|---|
US (1) | US4691215A (ja) |
EP (1) | EP0207968B1 (ja) |
JP (1) | JPH07118531B2 (ja) |
KR (1) | KR910004315B1 (ja) |
CA (1) | CA1245775A (ja) |
DE (1) | DE3578274D1 (ja) |
HK (1) | HK98990A (ja) |
SG (1) | SG77090G (ja) |
WO (1) | WO1986004184A1 (ja) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61248561A (ja) * | 1985-04-25 | 1986-11-05 | インタ−ナショナル・ビジネス・マシ−ンズ・コ−ポレ−ション | 半導体構造体 |
JPS62224969A (ja) * | 1986-03-27 | 1987-10-02 | Agency Of Ind Science & Technol | 半導体装置 |
US4845541A (en) * | 1986-05-29 | 1989-07-04 | Regents Of The University Of Minnesota | Tunneling emitter bipolar transistor |
US4833517A (en) * | 1987-04-27 | 1989-05-23 | International Business Machines Corporation | Theta device with improved base contact |
EP0314836A1 (en) * | 1987-11-06 | 1989-05-10 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Semiconductor device in particular a hot electron transistor |
US4825265A (en) * | 1987-09-04 | 1989-04-25 | American Telephone And Telegraph Company At&T Bell Laboratories | Transistor |
US4860064A (en) * | 1987-10-21 | 1989-08-22 | American Telephone And Telegraph Company At&T Bell Laboratories | Transistor comprising a 2-dimensional carrier gas collector situated between emitter and gate |
US5091759A (en) * | 1989-10-30 | 1992-02-25 | Texas Instruments Incorporated | Heterostructure field effect transistor |
US4912539A (en) * | 1988-08-05 | 1990-03-27 | The University Of Michigan | Narrow-band-gap base transistor structure with dual collector-base barrier including a graded barrier |
US5331410A (en) * | 1991-04-26 | 1994-07-19 | Sumitomo Electric Industries, Ltd. | Field effect transistor having a sandwiched channel layer |
US5352912A (en) * | 1991-11-13 | 1994-10-04 | International Business Machines Corporation | Graded bandgap single-crystal emitter heterojunction bipolar transistor |
US5463275A (en) * | 1992-07-10 | 1995-10-31 | Trw Inc. | Heterojunction step doped barrier cathode emitter |
US5268315A (en) * | 1992-09-04 | 1993-12-07 | Tektronix, Inc. | Implant-free heterojunction bioplar transistor integrated circuit process |
KR100240629B1 (ko) * | 1997-08-30 | 2000-01-15 | 정선종 | 테라급 집적이 가능한 대전효과 트랜지스터 및 그 제조방법 |
AU2001296104A1 (en) * | 2000-10-11 | 2002-04-22 | Timofei Timofeevich Kondratenko | Nonplanar semiconductor devices having closed region of spatial charge |
US8143648B1 (en) * | 2006-08-11 | 2012-03-27 | Hrl Laboratories, Llc | Unipolar tunneling photodetector |
CN107040062A (zh) * | 2017-05-26 | 2017-08-11 | 哈尔滨电气动力装备有限公司 | 屏蔽泵电动机转子护环结构 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4286275A (en) * | 1980-02-04 | 1981-08-25 | International Business Machines Corporation | Semiconductor device |
JPS5946103B2 (ja) * | 1980-03-10 | 1984-11-10 | 日本電信電話株式会社 | トランジスタ |
US4366493A (en) * | 1980-06-20 | 1982-12-28 | International Business Machines Corporation | Semiconductor ballistic transport device |
US4396931A (en) * | 1981-06-12 | 1983-08-02 | International Business Machines Corporation | Tunnel emitter upper valley transistor |
FR2520157B1 (fr) * | 1982-01-18 | 1985-09-13 | Labo Electronique Physique | Dispositif semi-conducteur du genre transistor a heterojonction(s) |
US4910562A (en) * | 1982-04-26 | 1990-03-20 | International Business Machines Corporation | Field induced base transistor |
CA1237824A (en) * | 1984-04-17 | 1988-06-07 | Takashi Mimura | Resonant tunneling semiconductor device |
JPS61121358A (ja) * | 1984-11-19 | 1986-06-09 | Fujitsu Ltd | 高速半導体装置 |
-
1985
- 1985-01-09 US US06/689,845 patent/US4691215A/en not_active Expired - Lifetime
- 1985-12-23 EP EP86900581A patent/EP0207968B1/en not_active Expired - Lifetime
- 1985-12-23 DE DE8686900581T patent/DE3578274D1/de not_active Expired - Fee Related
- 1985-12-23 JP JP61500511A patent/JPH07118531B2/ja not_active Expired - Lifetime
- 1985-12-23 WO PCT/US1985/002583 patent/WO1986004184A1/en active IP Right Grant
- 1985-12-23 KR KR1019860700621A patent/KR910004315B1/ko not_active IP Right Cessation
-
1986
- 1986-01-08 CA CA000499207A patent/CA1245775A/en not_active Expired
-
1990
- 1990-09-19 SG SG770/90A patent/SG77090G/en unknown
- 1990-11-29 HK HK989/90A patent/HK98990A/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO1986004184A1 (en) | 1986-07-17 |
SG77090G (en) | 1990-11-23 |
JPH07118531B2 (ja) | 1995-12-18 |
DE3578274D1 (de) | 1990-07-19 |
KR880700472A (ko) | 1988-03-15 |
EP0207968A1 (en) | 1987-01-14 |
CA1245775A (en) | 1988-11-29 |
EP0207968B1 (en) | 1990-06-13 |
HK98990A (en) | 1990-12-07 |
US4691215A (en) | 1987-09-01 |
JPS62501389A (ja) | 1987-06-04 |
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Legal Events
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A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20010531 Year of fee payment: 11 |
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LAPS | Lapse due to unpaid annual fee |