KR860007534A - 물체 횡단면 두께 측정장치 - Google Patents

물체 횡단면 두께 측정장치 Download PDF

Info

Publication number
KR860007534A
KR860007534A KR1019860001585A KR860001585A KR860007534A KR 860007534 A KR860007534 A KR 860007534A KR 1019860001585 A KR1019860001585 A KR 1019860001585A KR 860001585 A KR860001585 A KR 860001585A KR 860007534 A KR860007534 A KR 860007534A
Authority
KR
South Korea
Prior art keywords
measuring device
cross
section
measuring
detection
Prior art date
Application number
KR1019860001585A
Other languages
English (en)
Korean (ko)
Inventor
뚜르쉐 제라르
와닌 모리스
Original Assignee
로제르 벵따블리
인스티뜨 드 르세르시드라 시더러지 프랑솨즈(아이 알 에스 아이 데)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 로제르 벵따블리, 인스티뜨 드 르세르시드라 시더러지 프랑솨즈(아이 알 에스 아이 데) filed Critical 로제르 벵따블리
Publication of KR860007534A publication Critical patent/KR860007534A/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Paper (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1019860001585A 1985-03-07 1986-03-06 물체 횡단면 두께 측정장치 KR860007534A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8503380A FR2578643B1 (fr) 1985-03-07 1985-03-07 Ensemble de mesure du profil transversal d'epaisseur d'un produit
FR8503380 1985-03-07

Publications (1)

Publication Number Publication Date
KR860007534A true KR860007534A (ko) 1986-10-13

Family

ID=9316972

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019860001585A KR860007534A (ko) 1985-03-07 1986-03-06 물체 횡단면 두께 측정장치

Country Status (9)

Country Link
JP (1) JPS61207912A (fr)
KR (1) KR860007534A (fr)
BE (1) BE904362A (fr)
BR (1) BR8600965A (fr)
DE (1) DE3607593A1 (fr)
ES (1) ES8706258A1 (fr)
FR (1) FR2578643B1 (fr)
LU (1) LU86332A1 (fr)
NL (1) NL8600456A (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2704643B1 (fr) * 1993-04-26 1995-06-23 Lorraine Laminage Procede et dispositf d'etalonnage pour un ensemble de mesure du profil transversal d'epaisseur d'un produit plat.
DE19913929A1 (de) 1999-03-26 2000-09-28 Voith Sulzer Papiertech Patent Vorrichtung und Verfahren zum Bestimmen von Eigenschaften einer Materialbahn
DE102006054716A1 (de) * 2006-11-19 2008-05-29 Heraeus Kulzer Gmbh Anordnung zur Erfassung von Oberflächenkonturen an Objekten, insbesondere im zahnmedizinischen Bereich

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7705788A (nl) * 1977-05-26 1978-11-28 Philips Nv Inrichting voor computer-tomografie.
DE3140714A1 (de) * 1981-10-14 1983-04-28 Paul Ing.(Grad.) Flormann Vorrichtung zur dickenmessung von flachprofilen
JPS5890112A (ja) * 1981-11-26 1983-05-28 Toshiba Corp 放射線厚さ計

Also Published As

Publication number Publication date
ES8706258A1 (es) 1987-06-01
DE3607593A1 (de) 1986-09-11
JPS61207912A (ja) 1986-09-16
BR8600965A (pt) 1986-11-18
BE904362A (fr) 1986-06-30
ES552718A0 (es) 1987-06-01
FR2578643B1 (fr) 1990-03-09
LU86332A1 (fr) 1986-06-10
FR2578643A1 (fr) 1986-09-12
NL8600456A (nl) 1986-10-01

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E601 Decision to refuse application