ES8706258A1 - Disposicion de medida del perfil transversal de espesor de un producto. - Google Patents

Disposicion de medida del perfil transversal de espesor de un producto.

Info

Publication number
ES8706258A1
ES8706258A1 ES552718A ES552718A ES8706258A1 ES 8706258 A1 ES8706258 A1 ES 8706258A1 ES 552718 A ES552718 A ES 552718A ES 552718 A ES552718 A ES 552718A ES 8706258 A1 ES8706258 A1 ES 8706258A1
Authority
ES
Spain
Prior art keywords
product
profile
produce
respect
transverse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES552718A
Other languages
English (en)
Other versions
ES552718A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institut de Recherches de la Siderurgie Francaise IRSID
Original Assignee
Institut de Recherches de la Siderurgie Francaise IRSID
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institut de Recherches de la Siderurgie Francaise IRSID filed Critical Institut de Recherches de la Siderurgie Francaise IRSID
Publication of ES8706258A1 publication Critical patent/ES8706258A1/es
Publication of ES552718A0 publication Critical patent/ES552718A0/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Paper (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

CONJUNTO DE MEDIDA DEL PERFIL TRANSVERSAL DE ESPESOR DE UN PRODUCTO. CONSTA DE: UNA FUENTE DE RAYOS X QUE SE SITUA EN UN LADO DE LA BANDA (13), SE FIJA EN UNA ZONA Y PRODUCE UN HAZ (11) DE RAYOS X QUE SE CONFORMA MEDIANTE UN COLIMADOR (12) Y QUE TIENE FORMA DE ABANICO; UN DISPOSITIVO DE DETECCION (20) FORMADO POR UNA HILERA DE DETECTORES (21) ELEMENTALES YUXTAPUESTOS IDENTICOS, REAGRUPADOS EN MODULOS (22) Y ENSAMBLADOS EN UNA CAJA (23) PROVISTA DE UN COLIMADOR (21); Y UN CIRCUITO IMPRESO DE TRATAMIENTO DE SEÑALES. SE UTILIZA EN EL CONTROL DE CALIDAD DE PIEZAS METALICAS.
ES552718A 1985-03-07 1986-03-06 Disposicion de medida del perfil transversal de espesor de un producto. Expired ES8706258A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8503380A FR2578643B1 (fr) 1985-03-07 1985-03-07 Ensemble de mesure du profil transversal d'epaisseur d'un produit

Publications (2)

Publication Number Publication Date
ES8706258A1 true ES8706258A1 (es) 1987-06-01
ES552718A0 ES552718A0 (es) 1987-06-01

Family

ID=9316972

Family Applications (1)

Application Number Title Priority Date Filing Date
ES552718A Expired ES8706258A1 (es) 1985-03-07 1986-03-06 Disposicion de medida del perfil transversal de espesor de un producto.

Country Status (9)

Country Link
JP (1) JPS61207912A (es)
KR (1) KR860007534A (es)
BE (1) BE904362A (es)
BR (1) BR8600965A (es)
DE (1) DE3607593A1 (es)
ES (1) ES8706258A1 (es)
FR (1) FR2578643B1 (es)
LU (1) LU86332A1 (es)
NL (1) NL8600456A (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2704643B1 (fr) * 1993-04-26 1995-06-23 Lorraine Laminage Procede et dispositf d'etalonnage pour un ensemble de mesure du profil transversal d'epaisseur d'un produit plat.
DE19913929A1 (de) 1999-03-26 2000-09-28 Voith Sulzer Papiertech Patent Vorrichtung und Verfahren zum Bestimmen von Eigenschaften einer Materialbahn
DE102006054716A1 (de) * 2006-11-19 2008-05-29 Heraeus Kulzer Gmbh Anordnung zur Erfassung von Oberflächenkonturen an Objekten, insbesondere im zahnmedizinischen Bereich

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7705788A (nl) * 1977-05-26 1978-11-28 Philips Nv Inrichting voor computer-tomografie.
DE3140714A1 (de) * 1981-10-14 1983-04-28 Paul Ing.(Grad.) Flormann Vorrichtung zur dickenmessung von flachprofilen
JPS5890112A (ja) * 1981-11-26 1983-05-28 Toshiba Corp 放射線厚さ計

Also Published As

Publication number Publication date
DE3607593A1 (de) 1986-09-11
JPS61207912A (ja) 1986-09-16
BR8600965A (pt) 1986-11-18
BE904362A (fr) 1986-06-30
ES552718A0 (es) 1987-06-01
FR2578643B1 (fr) 1990-03-09
LU86332A1 (fr) 1986-06-10
KR860007534A (ko) 1986-10-13
FR2578643A1 (fr) 1986-09-12
NL8600456A (nl) 1986-10-01

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