BE904362A - Ensemble de mesure du profil transversal d'epaisseur d'un produit. - Google Patents
Ensemble de mesure du profil transversal d'epaisseur d'un produit.Info
- Publication number
- BE904362A BE904362A BE6/48197A BE6048197A BE904362A BE 904362 A BE904362 A BE 904362A BE 6/48197 A BE6/48197 A BE 6/48197A BE 6048197 A BE6048197 A BE 6048197A BE 904362 A BE904362 A BE 904362A
- Authority
- BE
- Belgium
- Prior art keywords
- product
- measuring
- assembly
- cross
- section thickness
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
- G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Paper (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Une source de rayonnement (10) fixe est située d'un coté du produit avec un faisceau divergent en direction transversale par rapport au produit, pour intercepter celui-ci sur la partie de profil à mesurer, et un dispositif de détection (20) s'étend transversalement par rapport au produit, de l'autre coté de celui-ci et comporte au moins une rangée de détecteurs élémentaires juxtaposés qui produisent chacun un signal fonction de la quantité de rayonnement reçu, un cirucuit de traitement élaborant une information représentative du profil recherché.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8503380A FR2578643B1 (fr) | 1985-03-07 | 1985-03-07 | Ensemble de mesure du profil transversal d'epaisseur d'un produit |
Publications (1)
Publication Number | Publication Date |
---|---|
BE904362A true BE904362A (fr) | 1986-06-30 |
Family
ID=9316972
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BE6/48197A BE904362A (fr) | 1985-03-07 | 1986-03-06 | Ensemble de mesure du profil transversal d'epaisseur d'un produit. |
Country Status (9)
Country | Link |
---|---|
JP (1) | JPS61207912A (fr) |
KR (1) | KR860007534A (fr) |
BE (1) | BE904362A (fr) |
BR (1) | BR8600965A (fr) |
DE (1) | DE3607593A1 (fr) |
ES (1) | ES8706258A1 (fr) |
FR (1) | FR2578643B1 (fr) |
LU (1) | LU86332A1 (fr) |
NL (1) | NL8600456A (fr) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2704643B1 (fr) * | 1993-04-26 | 1995-06-23 | Lorraine Laminage | Procede et dispositf d'etalonnage pour un ensemble de mesure du profil transversal d'epaisseur d'un produit plat. |
DE19913929A1 (de) | 1999-03-26 | 2000-09-28 | Voith Sulzer Papiertech Patent | Vorrichtung und Verfahren zum Bestimmen von Eigenschaften einer Materialbahn |
DE102006054716A1 (de) * | 2006-11-19 | 2008-05-29 | Heraeus Kulzer Gmbh | Anordnung zur Erfassung von Oberflächenkonturen an Objekten, insbesondere im zahnmedizinischen Bereich |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL7705788A (nl) * | 1977-05-26 | 1978-11-28 | Philips Nv | Inrichting voor computer-tomografie. |
DE3140714A1 (de) * | 1981-10-14 | 1983-04-28 | Paul Ing.(Grad.) Flormann | Vorrichtung zur dickenmessung von flachprofilen |
JPS5890112A (ja) * | 1981-11-26 | 1983-05-28 | Toshiba Corp | 放射線厚さ計 |
-
1985
- 1985-03-07 FR FR8503380A patent/FR2578643B1/fr not_active Expired - Fee Related
-
1986
- 1986-02-24 NL NL8600456A patent/NL8600456A/nl not_active Application Discontinuation
- 1986-02-28 LU LU86332A patent/LU86332A1/fr unknown
- 1986-03-06 ES ES552718A patent/ES8706258A1/es not_active Expired
- 1986-03-06 BE BE6/48197A patent/BE904362A/fr not_active IP Right Cessation
- 1986-03-06 KR KR1019860001585A patent/KR860007534A/ko not_active Application Discontinuation
- 1986-03-06 BR BR8600965A patent/BR8600965A/pt not_active IP Right Cessation
- 1986-03-06 JP JP61049515A patent/JPS61207912A/ja active Pending
- 1986-03-07 DE DE19863607593 patent/DE3607593A1/de not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
DE3607593A1 (de) | 1986-09-11 |
FR2578643B1 (fr) | 1990-03-09 |
ES8706258A1 (es) | 1987-06-01 |
LU86332A1 (fr) | 1986-06-10 |
JPS61207912A (ja) | 1986-09-16 |
ES552718A0 (es) | 1987-06-01 |
FR2578643A1 (fr) | 1986-09-12 |
NL8600456A (nl) | 1986-10-01 |
KR860007534A (ko) | 1986-10-13 |
BR8600965A (pt) | 1986-11-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RE | Patent lapsed |
Owner name: INSTITUT DE RECHERCHES DE LA SIDERURGIE FRANCAISE Effective date: 20020331 |