KR860007534A - Object cross section thickness measuring device - Google Patents

Object cross section thickness measuring device Download PDF

Info

Publication number
KR860007534A
KR860007534A KR1019860001585A KR860001585A KR860007534A KR 860007534 A KR860007534 A KR 860007534A KR 1019860001585 A KR1019860001585 A KR 1019860001585A KR 860001585 A KR860001585 A KR 860001585A KR 860007534 A KR860007534 A KR 860007534A
Authority
KR
South Korea
Prior art keywords
measuring device
cross
section
measuring
detection
Prior art date
Application number
KR1019860001585A
Other languages
Korean (ko)
Inventor
뚜르쉐 제라르
와닌 모리스
Original Assignee
로제르 벵따블리
인스티뜨 드 르세르시드라 시더러지 프랑솨즈(아이 알 에스 아이 데)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 로제르 벵따블리, 인스티뜨 드 르세르시드라 시더러지 프랑솨즈(아이 알 에스 아이 데) filed Critical 로제르 벵따블리
Publication of KR860007534A publication Critical patent/KR860007534A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Paper (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

내용 없음No content

Description

물체 횡단면 두께 측정장치Object cross section thickness measuring device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 본 발명의 측정장치의 실시예를 도시한 개략도.1 is a schematic view showing an embodiment of the measuring device of the present invention.

제2도는 제1도에 도시한 측정장치의 측면도.2 is a side view of the measuring device shown in FIG.

제4도는 본 발명의 측정장치의 다른 실시예를 위에서 본 도면.4 is a view from above of another embodiment of the measuring device of the present invention;

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

10 : X선원, 11 : X선 비임, 12, 24 : 콜리메이터 20 : 검출장치, 21 : 검출소자, 22 : 모듈, 23 : 케이스, 25 : 프린트 배선기판, 26 : 멀티플렉서, 27 : 처리회로, 27a : A/D변환기, 27C : 보정회로, 27i : 화상메모리, 27l : 행메모리, 27n : 제어회로, 27r : 참조용 메모리, 28 : 모니터, 30 : 검출 소자열, B : 스트립10: X-ray source, 11: X-ray beam, 12, 24: collimator 20: detection device, 21: detection element, 22: module, 23: case, 25: printed wiring board, 26: multiplexer, 27: processing circuit, 27a : A / D converter, 27C: correction circuit, 27i: image memory, 27l: row memory, 27n: control circuit, 27r: reference memory, 28: monitor, 30: detection element string, B: strip

Claims (4)

물체(B)의 한쪽에 설치된 방사선원(10)과 상기 물체의 다른쪽에 설치되어 상기 물체의 폭방향으로 넓어져 있는 고정검출장치(20)를 구비한 물체 횡단면의 두께를 측정하는 장치에 있어서, 상기 방사선원(10)은 고정하고 상기 방사선원에는 콜리메이터(12)를 설치하여 상기 물체의 폭방향으로 넓어지는 비임을 만들어 상기 물체의 측정을 행하는 단면부를 조사하고, 상기 검출장치(20)는 받아들인 방사선의 양에 의존하는 신호를 각각 발생하는 병렬배치된 검출소자(21)로 이루어지는 열과 상기 검출소자로부터의 신호를 수신하여 측정을 행한 횡단면에 관한 정보를 만드는 처리화로(27)를 적어도 구비한 것을 특징으로 하는 물체 횡단면 두께 측정장치.In the apparatus for measuring the thickness of the cross section of the object having a radiation source 10 provided on one side of the object (B) and a fixed detection device (20) provided on the other side of the object and widened in the width direction of the object, The radiation source 10 is fixed, and a collimator 12 is installed at the radiation source to make a beam widening in the width direction of the object, to irradiate a cross section for measuring the object, and the detection device 20 And at least a processing furnace 27 for generating information about a cross section in which the signals from the detection elements are received and measured from the detection elements 21 arranged in parallel to generate a signal depending on the quantity, respectively. Cross section thickness measuring device. 제1항에 있어서, 상기 검출장치는 상기 방사선이 상기 물체를 통과하는 방향과 상기 물체의 법선 방향이 엇갈린 경우의 차를 보정하는 수단을 구비한 것을 특징으로 하는 측정장치.The measuring device according to claim 1, wherein the detection device comprises a means for correcting a difference between a direction in which the radiation passes through the object and a normal direction of the object. 제1항 또는 제2항에 있어서, 상기 검출장치는, 미리 결정된 시간동안 상기 검출장치에서 검출된 신호의 적분을 행하는 수단을 구비한 것을 특징으로 하는 측정장치.The measuring device according to claim 1 or 2, wherein the detecting device comprises means for integrating a signal detected by the detecting device for a predetermined time. 제1항 또는 제2항에 있어서, 상기 검출장치는 상기 물체의 폭방향으로 설치한 검출소자로 이루어지는 열을 복수개구비하고, 상기 복수개의 열은 상기 물체의 길이방향으로 서로 간격을 두어 배치한 것을 특징으로 하는 측정장치.The apparatus of claim 1 or 2, wherein the detection device comprises a plurality of rows of detection elements provided in the width direction of the object, and the plurality of rows are spaced apart from each other in the longitudinal direction of the object. Characteristic measuring device. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019860001585A 1985-03-07 1986-03-06 Object cross section thickness measuring device KR860007534A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8503380A FR2578643B1 (en) 1985-03-07 1985-03-07 CROSS-SECTION THICKNESS PROFILE MEASUREMENT ASSEMBLY
FR8503380 1985-03-07

Publications (1)

Publication Number Publication Date
KR860007534A true KR860007534A (en) 1986-10-13

Family

ID=9316972

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019860001585A KR860007534A (en) 1985-03-07 1986-03-06 Object cross section thickness measuring device

Country Status (9)

Country Link
JP (1) JPS61207912A (en)
KR (1) KR860007534A (en)
BE (1) BE904362A (en)
BR (1) BR8600965A (en)
DE (1) DE3607593A1 (en)
ES (1) ES8706258A1 (en)
FR (1) FR2578643B1 (en)
LU (1) LU86332A1 (en)
NL (1) NL8600456A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2704643B1 (en) * 1993-04-26 1995-06-23 Lorraine Laminage CALIBRATION METHOD AND DEVICE FOR A CROSS-SECTION THICKNESS PROFILE MEASUREMENT ASSEMBLY.
DE19913929A1 (en) 1999-03-26 2000-09-28 Voith Sulzer Papiertech Patent Equipment determining properties of band of paper, comprises source of electromagnetic or particulate radiation passing through or reflected by band to detector array with irregular subdivision
DE102006054716A1 (en) * 2006-11-19 2008-05-29 Heraeus Kulzer Gmbh Arrangement for detecting surface contours on objects, in particular in the dental field

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7705788A (en) * 1977-05-26 1978-11-28 Philips Nv DEVICE FOR COMPUTER TOMOGRAPHY.
DE3140714A1 (en) * 1981-10-14 1983-04-28 Paul Ing.(Grad.) Flormann Device for measuring the thickness of flat sections
JPS5890112A (en) * 1981-11-26 1983-05-28 Toshiba Corp Radiation ray thickness meter

Also Published As

Publication number Publication date
DE3607593A1 (en) 1986-09-11
LU86332A1 (en) 1986-06-10
FR2578643A1 (en) 1986-09-12
JPS61207912A (en) 1986-09-16
BE904362A (en) 1986-06-30
ES8706258A1 (en) 1987-06-01
NL8600456A (en) 1986-10-01
ES552718A0 (en) 1987-06-01
FR2578643B1 (en) 1990-03-09
BR8600965A (en) 1986-11-18

Similar Documents

Publication Publication Date Title
DE69935640D1 (en) X-ray imaging device
MX166501B (en) METHOD AND APPARATUS FOR VALIDATING CURRENCY PAPER
ATE321340T1 (en) ULTRA-SENSITIVE MONITORING OF SENSORS AND PROCESSES
EP1767904A1 (en) Encoder
DK201887A (en) PRINTING MACHINE WITH AT LEAST ONE PRESSURE
US3859538A (en) Fault detector for paper webs
TW349011B (en) Remote position sensing apparatus and method
KR860007534A (en) Object cross section thickness measuring device
US4268746A (en) Document feed jam detector for a document reading apparatus
KR880014843A (en) Radiation receiving device
KR930018926A (en) Image Reader
KR850004816A (en) Image input device
GB1490906A (en) Method of and apparatus for measuring the average size of a group of apertures
US3850809A (en) Fault detector for paper webs
DE3583590D1 (en) TEST SYSTEM FOR A KEYBOARD INTERFACE CIRCUIT.
KR850006773A (en) Crosshair and crosshair pattern inspection method used in semiconductor device manufacturing
KR960702106A (en) Device for measuring weight per unit area
US5322990A (en) Apparatus for reading coding on a moving coding carrier, especially a travelling fabric web
SU667815A1 (en) Photoelectric discrete level meter for fibrous and loose materials
NL1001633C2 (en) Device for detecting color variation in moving colored material webs.
SU855544A1 (en) Device for checking pcb's
ITMO20010084A1 (en) METHOD TO REALIZE THE READING OF INTERACTION FRACTIONS BETWEEN THE PHOTOSENSITIVE ELEMENTS OR CONTINUOUS PIXELS OF A LINEAR OPTICAL SENSOR
JPS5654310A (en) Device for measurement of pattern area from printing plate for offset print
GB1394602A (en) Document reading apparatus
FI88133C (en) RELEASE INSTRUCTIONS FOR OWNING

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E601 Decision to refuse application