KR860004368A - 패턴 발생 장치 - Google Patents

패턴 발생 장치 Download PDF

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Publication number
KR860004368A
KR860004368A KR1019850007653A KR850007653A KR860004368A KR 860004368 A KR860004368 A KR 860004368A KR 1019850007653 A KR1019850007653 A KR 1019850007653A KR 850007653 A KR850007653 A KR 850007653A KR 860004368 A KR860004368 A KR 860004368A
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KR
South Korea
Prior art keywords
pattern
generator
patterns
data
pattern generator
Prior art date
Application number
KR1019850007653A
Other languages
English (en)
Other versions
KR900001976B1 (ko
Inventor
메이지(외 2) 오가모도
Original Assignee
미쓰다 가쓰시게
가부시기가이샤 히다찌 세이사꾸쇼
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP59228983A external-priority patent/JPS61108134A/ja
Priority claimed from JP60082384A external-priority patent/JPS61241996A/ja
Application filed by 미쓰다 가쓰시게, 가부시기가이샤 히다찌 세이사꾸쇼 filed Critical 미쓰다 가쓰시게
Publication of KR860004368A publication Critical patent/KR860004368A/ko
Application granted granted Critical
Publication of KR900001976B1 publication Critical patent/KR900001976B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

내용 없음

Description

패턴 발생 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도에서 제3도까지는, 본 발명의 제1의 특징을 설명하기 위한 도면.
제1도는, 패턴 검사 장치의 제1의 전체구성을 도시한 도면.
제2도는, 전형적인 프린트 기판의 패턴의 도면.
제3도는 프린트 기판의 패턴을 묘화하는 방법을 설명하기 위한 도면.

Claims (3)

  1. 여러 종류의 패턴을 기억하는 메모리 제12도 28이 상기 패턴의 좌표 및 그 패턴을 구성하는 패턴 요소의 종결을 표시하는 패턴 코오드를 그 패턴의 발생순으로 나란히 늘어놓는 것으로 된 도형 데이터와, 제4도, 제6도, 제12도와, 사익 도형 데이터를 입력하여 상기 패턴 코오드에 따라서 패턴 요소 발생부 제12도, 25,26,27, 제14도, 제16도, 제18도의 일부를 기동시키는 패턴 발생부 선택회로 제12도, 24와, 상기 도형 데이터에서 지시되는 순서로 상기 패턴 요소를 상기 좌표 위치에 따라서 발생시키는 패턴요소 발생부 제12도 25,26,27, 제14도, 제16도, 제18도와 외부에서 주어지는 주사 신호에 동기해서 상기 패턴요소 발생부에서 발생한 패턴 요소의 논리화를 취하는 라스터 변환부 제12도, 29,30,31,32으로 되는 패턴 발생장치
  2. 특허청구의 범위 제1항의 패턴 발생 장치에 있어서, 상기 패턴 요소 발생부는 원호 패턴 발생부(제2도, 27, 제18도), 애페추어 패턴 발생부(제12도 25, 제14도) 및 장방형 패턴 발생부(제12도 26, 제16도)로 되며, 그 패턴의 좌표 위치에 대응하는 데이터만을 입력하는 것을 특징으로 하는 패턴 발생장치.
  3. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019850007653A 1984-11-01 1985-10-17 다수 개의 패턴 발생기를 포함하는 패턴 검사 장치 KR900001976B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP59-228983 1984-11-01
JP59228983A JPS61108134A (ja) 1984-11-01 1984-11-01 マスク検査装置
JP60082384A JPS61241996A (ja) 1985-04-19 1985-04-19 パタ−ン発生方法
JP60-82384 1985-04-19

Publications (2)

Publication Number Publication Date
KR860004368A true KR860004368A (ko) 1986-06-20
KR900001976B1 KR900001976B1 (ko) 1990-03-30

Family

ID=26423416

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850007653A KR900001976B1 (ko) 1984-11-01 1985-10-17 다수 개의 패턴 발생기를 포함하는 패턴 검사 장치

Country Status (2)

Country Link
US (1) US4744047A (ko)
KR (1) KR900001976B1 (ko)

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Also Published As

Publication number Publication date
US4744047A (en) 1988-05-10
KR900001976B1 (ko) 1990-03-30

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