KR20240142529A - 요인 추론 장치, 요인 추론 방법, 요인 추론 시스템 및 단말 장치 - Google Patents

요인 추론 장치, 요인 추론 방법, 요인 추론 시스템 및 단말 장치 Download PDF

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Publication number
KR20240142529A
KR20240142529A KR1020247029224A KR20247029224A KR20240142529A KR 20240142529 A KR20240142529 A KR 20240142529A KR 1020247029224 A KR1020247029224 A KR 1020247029224A KR 20247029224 A KR20247029224 A KR 20247029224A KR 20240142529 A KR20240142529 A KR 20240142529A
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KR
South Korea
Prior art keywords
information
node
knowledge model
factor
factor inference
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Pending
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KR1020247029224A
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English (en)
Korean (ko)
Inventor
요헤이 하라다
타케히데 히라타
Original Assignee
제이에프이 스틸 가부시키가이샤
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Publication of KR20240142529A publication Critical patent/KR20240142529A/ko
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/04—Inference or reasoning models
    • G06N5/045—Explanation of inference; Explainable artificial intelligence [XAI]; Interpretable artificial intelligence
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/02—Knowledge representation; Symbolic representation
    • G06N5/022—Knowledge engineering; Knowledge acquisition

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Evolutionary Computation (AREA)
  • Computing Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Physics (AREA)
  • Software Systems (AREA)
  • Computational Linguistics (AREA)
  • Artificial Intelligence (AREA)
  • Medical Informatics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Debugging And Monitoring (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1020247029224A 2022-03-16 2023-03-02 요인 추론 장치, 요인 추론 방법, 요인 추론 시스템 및 단말 장치 Pending KR20240142529A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2022041005 2022-03-16
JPJP-P-2022-041005 2022-03-16
PCT/JP2023/007733 WO2023176467A1 (ja) 2022-03-16 2023-03-02 要因推論装置、要因推論方法、要因推論システムおよび端末装置

Publications (1)

Publication Number Publication Date
KR20240142529A true KR20240142529A (ko) 2024-09-30

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Family Applications (1)

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KR1020247029224A Pending KR20240142529A (ko) 2022-03-16 2023-03-02 요인 추론 장치, 요인 추론 방법, 요인 추론 시스템 및 단말 장치

Country Status (6)

Country Link
US (1) US20250181942A1 (https=)
EP (1) EP4474932A4 (https=)
JP (1) JP7578199B2 (https=)
KR (1) KR20240142529A (https=)
CN (1) CN118742867A (https=)
WO (1) WO2023176467A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119759694A (zh) * 2024-12-20 2025-04-04 苏州元脑智能科技有限公司 推理服务监控方法、装置、计算机设备和存储介质

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019194849A (ja) 2018-04-30 2019-11-07 富士通株式会社 機械学習システムのための因果関係

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57123409A (en) * 1981-01-23 1982-07-31 Hitachi Ltd Process system of plant faulty signal
JPS6214210A (ja) * 1985-07-11 1987-01-22 Nippon Atom Ind Group Co Ltd 異常診断分析方法
KR960016138B1 (ko) * 1988-06-17 1996-12-04 가부시기가이샤 히다찌세이꾸쇼 지식정보생성 시스템
JP3220912B2 (ja) * 1992-08-21 2001-10-22 株式会社日立製作所 プラント運転情報提供装置
JPH06137908A (ja) * 1992-10-27 1994-05-20 Toshiba Corp プラント監視装置
JPH07219624A (ja) * 1994-02-04 1995-08-18 Hitachi Ltd プラント監視方法および装置
JP3651693B2 (ja) * 1995-02-24 2005-05-25 株式会社東芝 プラント監視診断装置および方法
JP2000075923A (ja) * 1998-09-03 2000-03-14 Yamatake Corp 異常診断装置
JP5055800B2 (ja) * 2006-03-23 2012-10-24 オムロン株式会社 要因推定装置、プログラムおよびコンピュータ読取可能記録媒体
JP6831743B2 (ja) * 2017-04-19 2021-02-17 株式会社日立製作所 因果関係モデルの検証方法およびシステム、および不良原因抽出システム
JP6991833B2 (ja) * 2017-10-31 2022-01-13 株式会社日立製作所 因果関係モデル構築システムおよび方法
JP7230600B2 (ja) * 2019-03-13 2023-03-01 オムロン株式会社 表示システム
JP7218747B2 (ja) * 2020-04-28 2023-02-07 Ｊｆｅスチール株式会社 支援装置及び支援方法
US11474509B2 (en) * 2020-08-03 2022-10-18 Palo Alto Research Center Incorporated System and method for casual inference in manufacturing process

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019194849A (ja) 2018-04-30 2019-11-07 富士通株式会社 機械学習システムのための因果関係

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Marco, "Why should I trust you？: Explaining the predictions of any classifier", Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, August 2016, pp.1135-1144

Also Published As

Publication number Publication date
CN118742867A (zh) 2024-10-01
JP7578199B2 (ja) 2024-11-06
EP4474932A4 (en) 2025-05-28
JPWO2023176467A1 (https=) 2023-09-21
EP4474932A1 (en) 2024-12-11
WO2023176467A1 (ja) 2023-09-21
US20250181942A1 (en) 2025-06-05

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Patent event date: 20240830

Patent event code: PA01051R01D

Comment text: International Patent Application

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