KR20220113348A - 결함 분류 방법, 결함 분류 장치, 및 유리 물품의 제조 방법 - Google Patents
결함 분류 방법, 결함 분류 장치, 및 유리 물품의 제조 방법 Download PDFInfo
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- KR20220113348A KR20220113348A KR1020227010768A KR20227010768A KR20220113348A KR 20220113348 A KR20220113348 A KR 20220113348A KR 1020227010768 A KR1020227010768 A KR 1020227010768A KR 20227010768 A KR20227010768 A KR 20227010768A KR 20220113348 A KR20220113348 A KR 20220113348A
- Authority
- KR
- South Korea
- Prior art keywords
- defect
- classification
- image data
- classifier
- glass article
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
- G06F18/214—Generating training patterns; Bootstrap methods, e.g. bagging or boosting
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20081—Training; Learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30121—CRT, LCD or plasma display
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Data Mining & Analysis (AREA)
- Health & Medical Sciences (AREA)
- Nonlinear Science (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Mathematical Physics (AREA)
- Software Systems (AREA)
- Artificial Intelligence (AREA)
- Evolutionary Computation (AREA)
- General Engineering & Computer Science (AREA)
- Computing Systems (AREA)
- Medical Informatics (AREA)
- Quality & Reliability (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Bioinformatics & Computational Biology (AREA)
- Evolutionary Biology (AREA)
- Signal Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Liquid Crystal (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019227239A JP7349066B2 (ja) | 2019-12-17 | 2019-12-17 | 欠陥分類方法、欠陥分類装置及びガラス物品の製造方法 |
JPJP-P-2019-227239 | 2019-12-17 | ||
PCT/JP2020/043010 WO2021124775A1 (ja) | 2019-12-17 | 2020-11-18 | 欠陥分類方法、欠陥分類装置及びガラス物品の製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20220113348A true KR20220113348A (ko) | 2022-08-12 |
Family
ID=76431082
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020227010768A KR20220113348A (ko) | 2019-12-17 | 2020-11-18 | 결함 분류 방법, 결함 분류 장치, 및 유리 물품의 제조 방법 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7349066B2 (zh) |
KR (1) | KR20220113348A (zh) |
CN (1) | CN114556414A (zh) |
TW (1) | TW202132766A (zh) |
WO (1) | WO2021124775A1 (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2023095756A1 (ja) * | 2021-11-29 | 2023-06-01 | 日本電気硝子株式会社 | ガラス板の製造方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015205811A (ja) | 2015-04-27 | 2015-11-19 | AvanStrate株式会社 | フラットパネルディスプレイ用ガラス基板及びその製造方法、ならびに液晶ディスプレイ |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004354251A (ja) | 2003-05-29 | 2004-12-16 | Nidek Co Ltd | 欠陥検査装置 |
JP5022174B2 (ja) | 2007-10-22 | 2012-09-12 | 株式会社日立製作所 | 欠陥分類方法及びその装置 |
JP2012026982A (ja) | 2010-07-27 | 2012-02-09 | Panasonic Electric Works Sunx Co Ltd | 検査装置 |
JP6113024B2 (ja) | 2013-08-19 | 2017-04-12 | 株式会社Screenホールディングス | 分類器取得方法、欠陥分類方法、欠陥分類装置およびプログラム |
JP6669453B2 (ja) | 2015-09-08 | 2020-03-18 | 株式会社Screenホールディングス | 画像分類装置および画像分類方法 |
CN106645180A (zh) | 2017-02-06 | 2017-05-10 | 东旭科技集团有限公司 | 检查基板玻璃缺陷的方法、现场终端及服务器 |
CN109635856A (zh) | 2018-11-29 | 2019-04-16 | 上海集成电路研发中心有限公司 | 一种产线缺陷图像智能分类系统及分类方法 |
-
2019
- 2019-12-17 JP JP2019227239A patent/JP7349066B2/ja active Active
-
2020
- 2020-11-18 KR KR1020227010768A patent/KR20220113348A/ko active Search and Examination
- 2020-11-18 CN CN202080071666.XA patent/CN114556414A/zh active Pending
- 2020-11-18 WO PCT/JP2020/043010 patent/WO2021124775A1/ja active Application Filing
- 2020-11-26 TW TW109141471A patent/TW202132766A/zh unknown
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015205811A (ja) | 2015-04-27 | 2015-11-19 | AvanStrate株式会社 | フラットパネルディスプレイ用ガラス基板及びその製造方法、ならびに液晶ディスプレイ |
Also Published As
Publication number | Publication date |
---|---|
CN114556414A (zh) | 2022-05-27 |
JP7349066B2 (ja) | 2023-09-22 |
WO2021124775A1 (ja) | 2021-06-24 |
JP2021096151A (ja) | 2021-06-24 |
TW202132766A (zh) | 2021-09-01 |
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