KR20220074994A - 프로브 시트 및 프로브 시트의 제조 방법 - Google Patents

프로브 시트 및 프로브 시트의 제조 방법 Download PDF

Info

Publication number
KR20220074994A
KR20220074994A KR1020227017606A KR20227017606A KR20220074994A KR 20220074994 A KR20220074994 A KR 20220074994A KR 1020227017606 A KR1020227017606 A KR 1020227017606A KR 20227017606 A KR20227017606 A KR 20227017606A KR 20220074994 A KR20220074994 A KR 20220074994A
Authority
KR
South Korea
Prior art keywords
sheet
flexible sheet
electrode
resin layer
conductive particles
Prior art date
Application number
KR1020227017606A
Other languages
English (en)
Korean (ko)
Inventor
도모유키 이시마쓰
Original Assignee
데쿠세리아루즈 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 데쿠세리아루즈 가부시키가이샤 filed Critical 데쿠세리아루즈 가부시키가이샤
Publication of KR20220074994A publication Critical patent/KR20220074994A/ko

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Measuring Leads Or Probes (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
KR1020227017606A 2019-11-26 2020-11-19 프로브 시트 및 프로브 시트의 제조 방법 KR20220074994A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019213061A JP2021085701A (ja) 2019-11-26 2019-11-26 プローブシート及びプローブシートの製造方法
JPJP-P-2019-213061 2019-11-26
PCT/JP2020/043284 WO2021106753A1 (ja) 2019-11-26 2020-11-19 プローブシート及びプローブシートの製造方法

Publications (1)

Publication Number Publication Date
KR20220074994A true KR20220074994A (ko) 2022-06-03

Family

ID=76087331

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020227017606A KR20220074994A (ko) 2019-11-26 2020-11-19 프로브 시트 및 프로브 시트의 제조 방법

Country Status (5)

Country Link
JP (1) JP2021085701A (zh)
KR (1) KR20220074994A (zh)
CN (1) CN114787640A (zh)
TW (1) TW202139526A (zh)
WO (1) WO2021106753A1 (zh)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005056860A (ja) 2001-02-09 2005-03-03 Jsr Corp 異方導電性コネクターおよびその応用製品
JP2007275705A (ja) 2006-04-03 2007-10-25 Mitsui Eng & Shipbuild Co Ltd 排ガスの脱硝方法
JP2010009911A (ja) 2008-06-26 2010-01-14 Jsr Corp 異方導電性シート

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4507644B2 (ja) * 2003-06-12 2010-07-21 Ｊｓｒ株式会社 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
JP2005235509A (ja) * 2004-02-18 2005-09-02 Jsr Corp 異方導電性シートおよび回路装置の検査装置並びに回路装置の検査方法
JP2009193710A (ja) * 2008-02-12 2009-08-27 Jsr Corp 異方導電性コネクターおよびこの異方導電性コネクターを用いた回路装置の検査装置
KR101204940B1 (ko) * 2011-12-26 2012-11-27 주식회사 아이에스시 전기적 콘택터 및 전기적 콘택터의 제조방법
KR101572139B1 (ko) * 2014-05-29 2015-11-26 주식회사 아이에스시 접속용 커넥터 및 접속용 커넥터의 제조방법
WO2018066540A1 (ja) * 2016-10-06 2018-04-12 日東電工株式会社 異方導電性シート

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005056860A (ja) 2001-02-09 2005-03-03 Jsr Corp 異方導電性コネクターおよびその応用製品
JP2007275705A (ja) 2006-04-03 2007-10-25 Mitsui Eng & Shipbuild Co Ltd 排ガスの脱硝方法
JP2010009911A (ja) 2008-06-26 2010-01-14 Jsr Corp 異方導電性シート

Also Published As

Publication number Publication date
JP2021085701A (ja) 2021-06-03
CN114787640A (zh) 2022-07-22
WO2021106753A1 (ja) 2021-06-03
TW202139526A (zh) 2021-10-16

Similar Documents

Publication Publication Date Title
JP4930574B2 (ja) 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
KR102184019B1 (ko) 전기 특성의 검사 지그
KR101030360B1 (ko) 이방 도전성 커넥터 장치 및 회로 장치의 검사 장치
KR20080079670A (ko) 웨이퍼 검사용 회로 기판 장치, 프로브 카드 및 웨이퍼검사 장치
KR20080059260A (ko) 이방 도전성 커넥터 장치 및 회로 장치의 검사 장치
JP3753145B2 (ja) 異方導電性シートおよびその製造方法、アダプター装置およびその製造方法並びに回路装置の電気的検査装置
KR20050115297A (ko) 전기 저항 측정용 커넥터, 전기 저항 측정용 커넥터 장치및 그 제조 방법 및 회로 기판의 전기 저항 측정 장치 및측정 방법
JP5018612B2 (ja) 異方導電性シートおよび異方導電性シートの製造方法
JP4507644B2 (ja) 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
KR20220082085A (ko) 프로브 시트 및 프로브 시트의 제조 방법
JP2006040632A (ja) 異方導電性コネクターおよびその製造方法、アダプター装置並びに回路装置の電気的検査装置
JP5104265B2 (ja) プローブ部材およびその製造方法ならびにその応用
JP4380373B2 (ja) 電気抵抗測定用コネクター、電気抵抗測定用コネクター装置およびその製造方法並びに回路基板の電気抵抗測定装置および測定方法
KR20220074994A (ko) 프로브 시트 및 프로브 시트의 제조 방법
JP2005300279A (ja) 異方導電性コネクター装置およびその製造方法並びに回路装置の検査装置
KR101042374B1 (ko) 매개부재의 제조방법 및 그 제조방법에 의해 제조된 매개부재
JPH1164377A (ja) 積層型コネクターおよび回路基板検査用アダプター装置
JP4385767B2 (ja) 異方導電性コネクターおよびその製造方法並びに回路装置の検査装置
JPH11231010A (ja) 積層型コネクターおよび回路基板検査用アダプター装置
JP2004227828A (ja) 異方導電性コネクター装置および回路装置の検査装置
JP2021012040A (ja) 電気特性の検査冶具
JPH11260446A (ja) 積層型コネクターおよび回路装置検査用アダプター装置
JP2005317214A (ja) 異方導電性コネクターおよび回路装置の検査装置
JP2007263635A (ja) ウエハ検査用プローブカードおよびウエハ検査装置