KR20210144838A - 측정 방법 및 검사 장치 - Google Patents

측정 방법 및 검사 장치 Download PDF

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Publication number
KR20210144838A
KR20210144838A KR1020217034919A KR20217034919A KR20210144838A KR 20210144838 A KR20210144838 A KR 20210144838A KR 1020217034919 A KR1020217034919 A KR 1020217034919A KR 20217034919 A KR20217034919 A KR 20217034919A KR 20210144838 A KR20210144838 A KR 20210144838A
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KR
South Korea
Prior art keywords
impedance
wiring
current detection
electrode
measured
Prior art date
Application number
KR1020217034919A
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English (en)
Korean (ko)
Inventor
도시히사 히바리노
Original Assignee
니혼덴산리드가부시키가이샤
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Application filed by 니혼덴산리드가부시키가이샤 filed Critical 니혼덴산리드가부시키가이샤
Publication of KR20210144838A publication Critical patent/KR20210144838A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
KR1020217034919A 2019-03-29 2020-02-15 측정 방법 및 검사 장치 KR20210144838A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2019-068676 2019-03-29
JP2019068676 2019-03-29
PCT/JP2020/005919 WO2020202832A1 (ja) 2019-03-29 2020-02-15 測定方法、及び検査装置

Publications (1)

Publication Number Publication Date
KR20210144838A true KR20210144838A (ko) 2021-11-30

Family

ID=72668959

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020217034919A KR20210144838A (ko) 2019-03-29 2020-02-15 측정 방법 및 검사 장치

Country Status (5)

Country Link
JP (1) JP7472903B2 (ja)
KR (1) KR20210144838A (ja)
CN (1) CN113728240B (ja)
TW (1) TW202109073A (ja)
WO (1) WO2020202832A1 (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014238318A (ja) 2013-06-07 2014-12-18 日本電産リード株式会社 検査装置、検査装置のキャリブレーション方法及び検査方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0758313B2 (ja) * 1988-04-28 1995-06-21 日置電機株式会社 回路基板検査方法
JP3527665B2 (ja) * 1999-07-16 2004-05-17 松下電器産業株式会社 コンデンサのインピーダンス測定装置
JP2003294793A (ja) * 2002-03-29 2003-10-15 Matsushita Electric Ind Co Ltd 電子部品のインダクタ測定治具およびその方法
TW583409B (en) 2002-12-25 2004-04-11 Advanced Semiconductor Eng Impedance standard substrate and correction method for vector network analyzer
US6889467B2 (en) * 2003-01-31 2005-05-10 Edwin Hawn Carbon fiber outrigger
JP2006091850A (ja) * 2004-07-22 2006-04-06 Toshiba Matsushita Display Technology Co Ltd Ｅｌ表示装置およびｅｌ表示パネルの検査装置
JP4959942B2 (ja) * 2005-01-18 2012-06-27 日本電産リード株式会社 基板検査装置、基板検査プログラム及び基板検査方法
WO2011121862A1 (ja) * 2010-03-29 2011-10-06 株式会社アイテス 静電容量式タッチパネルの検査装置、及び検査方法
JP2012079148A (ja) * 2010-10-04 2012-04-19 Toppan Printing Co Ltd 静電容量式透過型タッチパネルの電極層パターン欠陥検査修正システム
GB2510600B (en) * 2013-02-08 2015-05-20 R & D Core Ltd Calibration of Contact Sensor
JP2015152416A (ja) * 2014-02-14 2015-08-24 株式会社東芝 キャパシタンス検出装置
JP6368927B2 (ja) * 2014-02-18 2018-08-08 日本電産リード株式会社 シングルレイヤー型検査対象物の検査装置及び検査方法
JP6592885B2 (ja) * 2014-10-08 2019-10-23 日本電産リード株式会社 基板検査方法及び基板検査装置
JP6642443B2 (ja) * 2014-10-29 2020-02-05 日本電産リード株式会社 基板検査装置、及び基板検査方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014238318A (ja) 2013-06-07 2014-12-18 日本電産リード株式会社 検査装置、検査装置のキャリブレーション方法及び検査方法

Also Published As

Publication number Publication date
WO2020202832A1 (ja) 2020-10-08
JP7472903B2 (ja) 2024-04-23
CN113728240A (zh) 2021-11-30
CN113728240B (zh) 2024-03-29
TW202109073A (zh) 2021-03-01
JPWO2020202832A1 (ja) 2020-10-08

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