KR20180085024A - 결함 분리 기능을 갖춘 매트릭스 형 집적 회로 - Google Patents
결함 분리 기능을 갖춘 매트릭스 형 집적 회로 Download PDFInfo
- Publication number
- KR20180085024A KR20180085024A KR1020187018616A KR20187018616A KR20180085024A KR 20180085024 A KR20180085024 A KR 20180085024A KR 1020187018616 A KR1020187018616 A KR 1020187018616A KR 20187018616 A KR20187018616 A KR 20187018616A KR 20180085024 A KR20180085024 A KR 20180085024A
- Authority
- KR
- South Korea
- Prior art keywords
- matrix
- integrated circuit
- type integrated
- defect isolation
- defect
- Prior art date
Links
- 230000007547 defect Effects 0.000 title 1
- 238000002955 isolation Methods 0.000 title 1
Classifications
-
- H04N5/367—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14634—Assemblies, i.e. Hybrid structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14636—Interconnect structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/74—Circuitry for scanning or addressing the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
-
- H04N5/376—
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/007,312 | 2016-01-27 | ||
US15/007,312 US9947712B2 (en) | 2016-01-27 | 2016-01-27 | Matrix type integrated circuit with fault isolation capability |
PCT/US2017/015502 WO2017132616A1 (en) | 2016-01-27 | 2017-01-27 | Matrix type integrated circuit with fault isolation capability |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20180085024A true KR20180085024A (ko) | 2018-07-25 |
KR101933365B1 KR101933365B1 (ko) | 2018-12-27 |
Family
ID=58016846
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020187018616A KR101933365B1 (ko) | 2016-01-27 | 2017-01-27 | 결함 분리 기능을 갖춘 매트릭스 형 집적 회로 |
Country Status (6)
Country | Link |
---|---|
US (1) | US9947712B2 (ko) |
EP (1) | EP3409010B1 (ko) |
JP (1) | JP6542482B2 (ko) |
KR (1) | KR101933365B1 (ko) |
CN (1) | CN108496362B (ko) |
WO (1) | WO2017132616A1 (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9233765B2 (en) * | 2011-06-16 | 2016-01-12 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Multi-dimensional damage detection |
EP3382344B1 (en) * | 2017-03-30 | 2021-12-15 | Melexis Technologies SA | Fault detection |
EP3907983B1 (en) * | 2020-05-07 | 2023-06-28 | Teledyne Dalsa B.V. | Fault detection circuit for image sensor |
CN113907808B (zh) * | 2021-12-14 | 2022-03-01 | 极限人工智能有限公司 | 分体式手术装置及分体式手术装置的控制方法 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
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DE3526485A1 (de) * | 1985-07-24 | 1987-02-05 | Heinz Krug | Schaltungsanordnung zum pruefen integrierter schaltungseinheiten |
US4956602A (en) * | 1989-02-14 | 1990-09-11 | Amber Engineering, Inc. | Wafer scale testing of redundant integrated circuit dies |
US5648661A (en) * | 1992-07-02 | 1997-07-15 | Lsi Logic Corporation | Integrated circuit wafer comprising unsingulated dies, and decoder arrangement for individually testing the dies |
JPH06230086A (ja) * | 1992-09-22 | 1994-08-19 | Nec Corp | Lsiのテスト回路 |
US6115305A (en) * | 1999-06-15 | 2000-09-05 | Atmel Corporation | Method and apparatus for testing a video display chip |
US6734897B1 (en) * | 1999-08-10 | 2004-05-11 | Agilent Technologies, Inc | Digital imaging circuit and method |
US6407770B1 (en) * | 1999-08-19 | 2002-06-18 | General Electric Company | Apparatus and method for detecting defects in a discrete picture element detector circuit |
JP2001155905A (ja) * | 1999-11-24 | 2001-06-08 | Nec Corp | 半導体装置およびトリミング方法ならびに記録媒体 |
US6876572B2 (en) * | 2003-05-21 | 2005-04-05 | Altera Corporation | Programmable logic devices with stabilized configuration cells for reduced soft error rates |
JP2006049611A (ja) * | 2004-08-05 | 2006-02-16 | Iwate Toshiba Electronics Co Ltd | Cmosイメージセンサ |
US7608837B2 (en) * | 2006-11-24 | 2009-10-27 | Tower Semiconductor Ltd. | High resolution integrated X-ray CMOS image sensor |
GB0724983D0 (en) * | 2007-12-21 | 2008-01-30 | Cmosis Nv | Pixel array with reduced sensitivity to defects |
JP4905420B2 (ja) * | 2008-07-29 | 2012-03-28 | ソニー株式会社 | 表示装置、表示装置の駆動方法及び製造方法、並びに電子機器 |
WO2011089462A1 (en) * | 2010-01-21 | 2011-07-28 | Freescale Semiconductor, Inc. Are | Chip damage detection device for a semiconductor integrated circuit |
FR2971085A1 (fr) * | 2011-01-31 | 2012-08-03 | Commissariat Energie Atomique | Matrice de composants electronique fiabilisee et procede de localisation de defaut dans la matrice |
CN102445650B (zh) * | 2011-09-22 | 2014-09-24 | 重庆大学 | 基于盲信号分离算法的电路故障诊断方法 |
JP6188433B2 (ja) * | 2013-06-07 | 2017-08-30 | 浜松ホトニクス株式会社 | 固体撮像装置 |
KR101807439B1 (ko) | 2013-09-11 | 2018-02-28 | 배리언 메디컬 시스템즈, 인크. | 정전압 바이어싱된 광다이오드를 갖는 픽셀 회로 및 관련 이미징 방법 |
FR3016079B1 (fr) * | 2013-12-30 | 2015-12-25 | Trixell | Dispositif electronique comprenant une matrice de circuits electroniques elementaires |
JP2015185860A (ja) * | 2014-03-20 | 2015-10-22 | 株式会社東芝 | 固体撮像装置 |
US9563222B2 (en) | 2014-05-08 | 2017-02-07 | Varian Medical Systems, Inc. | Differential reference signal distribution method and system |
-
2016
- 2016-01-27 US US15/007,312 patent/US9947712B2/en active Active
-
2017
- 2017-01-27 KR KR1020187018616A patent/KR101933365B1/ko active IP Right Grant
- 2017-01-27 CN CN201780008180.XA patent/CN108496362B/zh active Active
- 2017-01-27 WO PCT/US2017/015502 patent/WO2017132616A1/en active Application Filing
- 2017-01-27 EP EP17704623.2A patent/EP3409010B1/en active Active
- 2017-01-27 JP JP2018538881A patent/JP6542482B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
JP2019511145A (ja) | 2019-04-18 |
US20170213867A1 (en) | 2017-07-27 |
EP3409010B1 (en) | 2021-07-21 |
CN108496362B (zh) | 2019-08-02 |
EP3409010A1 (en) | 2018-12-05 |
WO2017132616A1 (en) | 2017-08-03 |
KR101933365B1 (ko) | 2018-12-27 |
CN108496362A (zh) | 2018-09-04 |
US9947712B2 (en) | 2018-04-17 |
JP6542482B2 (ja) | 2019-07-10 |
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Date | Code | Title | Description |
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A201 | Request for examination | ||
A302 | Request for accelerated examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant |