KR20170002398A - 저 면적 디지털 soc를 위한 적응형 표준 셀 아키텍처 및 레이아웃 기술들 - Google Patents

저 면적 디지털 soc를 위한 적응형 표준 셀 아키텍처 및 레이아웃 기술들 Download PDF

Info

Publication number
KR20170002398A
KR20170002398A KR1020167030392A KR20167030392A KR20170002398A KR 20170002398 A KR20170002398 A KR 20170002398A KR 1020167030392 A KR1020167030392 A KR 1020167030392A KR 20167030392 A KR20167030392 A KR 20167030392A KR 20170002398 A KR20170002398 A KR 20170002398A
Authority
KR
South Korea
Prior art keywords
power rail
metal
layer
transistor devices
layer interconnect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020167030392A
Other languages
English (en)
Korean (ko)
Inventor
제이 마드후카르 샤
카메쉬 메디세티
비제야라크쉬미 랑안나
아니메쉬 다타
Original Assignee
퀄컴 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 퀄컴 인코포레이티드 filed Critical 퀄컴 인코포레이티드
Publication of KR20170002398A publication Critical patent/KR20170002398A/ko
Withdrawn legal-status Critical Current

Links

Images

Classifications

    • H01L27/0207
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/10Integrated device layouts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/528Layout of the interconnection structure
    • H01L23/5286Arrangements of power or ground buses
    • H01L27/11807
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90Masterslice integrated circuits
    • H10D84/903Masterslice integrated circuits comprising field effect technology
    • H10D84/907CMOS gate arrays
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90Masterslice integrated circuits
    • H10D84/903Masterslice integrated circuits comprising field effect technology
    • H10D84/907CMOS gate arrays
    • H10D84/968Macro-architecture
    • H10D84/974Layout specifications, i.e. inner core regions
    • H10D84/981Power supply lines
    • H01L2027/11881
    • H10W20/427

Landscapes

  • Design And Manufacture Of Integrated Circuits (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
KR1020167030392A 2014-05-01 2015-03-16 저 면적 디지털 soc를 위한 적응형 표준 셀 아키텍처 및 레이아웃 기술들 Withdrawn KR20170002398A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/267,888 US9070552B1 (en) 2014-05-01 2014-05-01 Adaptive standard cell architecture and layout techniques for low area digital SoC
US14/267,888 2014-05-01
PCT/US2015/020730 WO2015167679A1 (en) 2014-05-01 2015-03-16 Adaptive standard cell architecture and layout techniques for low area digital soc

Publications (1)

Publication Number Publication Date
KR20170002398A true KR20170002398A (ko) 2017-01-06

Family

ID=53268859

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167030392A Withdrawn KR20170002398A (ko) 2014-05-01 2015-03-16 저 면적 디지털 soc를 위한 적응형 표준 셀 아키텍처 및 레이아웃 기술들

Country Status (7)

Country Link
US (1) US9070552B1 (enExample)
EP (1) EP3138129A1 (enExample)
JP (1) JP2017517143A (enExample)
KR (1) KR20170002398A (enExample)
CN (1) CN106165097A (enExample)
BR (1) BR112016025414A2 (enExample)
WO (1) WO2015167679A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180106826A (ko) * 2017-03-20 2018-10-01 삼성전자주식회사 표준 셀 블록용 파워 레일

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160136715A (ko) * 2015-05-20 2016-11-30 삼성전자주식회사 반도체 장치 및 그 제조 방법
US9935100B2 (en) 2015-11-09 2018-04-03 Qualcomm Incorporated Power rail inbound middle of line (MOL) routing
KR20170059364A (ko) * 2015-11-19 2017-05-30 삼성전자주식회사 반도체 소자 및 이의 제조 방법
US10541243B2 (en) 2015-11-19 2020-01-21 Samsung Electronics Co., Ltd. Semiconductor device including a gate electrode and a conductive structure
US9634026B1 (en) * 2016-07-13 2017-04-25 Qualcomm Incorporated Standard cell architecture for reduced leakage current and improved decoupling capacitance
US10090244B2 (en) 2016-07-27 2018-10-02 Qualcomm Incorporated Standard cell circuits employing high aspect ratio voltage rails for reduced resistance
US10605859B2 (en) * 2016-09-14 2020-03-31 Qualcomm Incorporated Visible alignment markers/landmarks for CAD-to-silicon backside image alignment
KR102678555B1 (ko) 2016-10-05 2024-06-26 삼성전자주식회사 변형 셀을 포함하는 집적 회로 및 그 설계 방법
US10236886B2 (en) * 2016-12-28 2019-03-19 Qualcomm Incorporated Multiple via structure for high performance standard cells
US10811357B2 (en) 2017-04-11 2020-10-20 Samsung Electronics Co., Ltd. Standard cell and an integrated circuit including the same
US9978682B1 (en) * 2017-04-13 2018-05-22 Qualcomm Incorporated Complementary metal oxide semiconductor (CMOS) standard cell circuits employing metal lines in a first metal layer used for routing, and related methods
US10692808B2 (en) 2017-09-18 2020-06-23 Qualcomm Incorporated High performance cell design in a technology with high density metal routing
US10867102B2 (en) * 2018-06-28 2020-12-15 Taiwan Semiconductor Manufacturing Company, Ltd. Inverted pitch IC structure, layout method, and system
US11201148B2 (en) * 2018-10-29 2021-12-14 Tokyo Electron Limited Architecture for monolithic 3D integration of semiconductor devices
US11710733B2 (en) * 2020-03-03 2023-07-25 Qualcomm Incorporated Vertical power grid standard cell architecture
US11290109B1 (en) * 2020-09-23 2022-03-29 Qualcomm Incorporated Multibit multi-height cell to improve pin accessibility
US11929325B2 (en) * 2021-08-18 2024-03-12 Qualcomm Incorporated Mixed pitch track pattern
US20250336824A1 (en) * 2024-04-26 2025-10-30 Samsung Electronics Co., Ltd. Semiconductor device

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0727968B2 (ja) * 1988-12-20 1995-03-29 株式会社東芝 半導体集積回路装置
JPH06120224A (ja) * 1992-09-30 1994-04-28 Nec Ic Microcomput Syst Ltd 半導体集積回路
US6502231B1 (en) 2001-05-31 2002-12-31 Applied Micro Circuits Corporation Integrated circuit template cell system and method
JP2006196872A (ja) * 2004-12-17 2006-07-27 Matsushita Electric Ind Co Ltd 標準セル、標準セルライブラリ、半導体装置、及びその配置方法
JP2007066974A (ja) * 2005-08-29 2007-03-15 Matsushita Electric Ind Co Ltd 半導体集積回路および半導体集積回路のレイアウト方法
US7989849B2 (en) 2006-11-15 2011-08-02 Synopsys, Inc. Apparatuses and methods for efficient power rail structures for cell libraries
TWI376615B (en) * 2008-01-30 2012-11-11 Realtek Semiconductor Corp Power mesh managing method utilized in an integrated circuit
KR101394145B1 (ko) * 2008-02-26 2014-05-16 삼성전자주식회사 스탠다드 셀 라이브러리 및 집적 회로
JP5552775B2 (ja) * 2009-08-28 2014-07-16 ソニー株式会社 半導体集積回路
US8421205B2 (en) * 2010-05-06 2013-04-16 Taiwan Semiconductor Manufacturing Company, Ltd. Power layout for integrated circuits
US8742464B2 (en) * 2011-03-03 2014-06-03 Synopsys, Inc. Power routing in standard cells
US8513978B2 (en) 2011-03-30 2013-08-20 Synopsys, Inc. Power routing in standard cell designs
US8756550B2 (en) 2011-09-19 2014-06-17 Texas Instruments Incorporated Method to ensure double patterning technology compliance in standard cells
US8694945B2 (en) 2011-12-20 2014-04-08 Taiwan Semiconductor Manufacturing Co., Ltd. Automatic place and route method for electromigration tolerant power distribution
WO2013161249A1 (ja) * 2012-04-24 2013-10-31 パナソニック株式会社 半導体装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180106826A (ko) * 2017-03-20 2018-10-01 삼성전자주식회사 표준 셀 블록용 파워 레일

Also Published As

Publication number Publication date
BR112016025414A2 (pt) 2017-08-15
CN106165097A (zh) 2016-11-23
US9070552B1 (en) 2015-06-30
WO2015167679A1 (en) 2015-11-05
EP3138129A1 (en) 2017-03-08
JP2017517143A (ja) 2017-06-22

Similar Documents

Publication Publication Date Title
KR20170002398A (ko) 저 면적 디지털 soc를 위한 적응형 표준 셀 아키텍처 및 레이아웃 기술들
US9502351B1 (en) Multiple split rail standard cell library architecture
US8174052B2 (en) Standard cell libraries and integrated circuit including standard cells
US20180122824A1 (en) Standard cell architecture with m1 layer unidirectional routing
US9520358B2 (en) Via structure for optimizing signal porosity
KR101898510B1 (ko) 고밀도 안테나 보호 다이오드를 위한 회로 및 레이아웃
US8525552B2 (en) Semiconductor integrated circuit device having a plurality of standard cells for leakage current suppression
KR20190019952A (ko) 핀 카운트에 기반한 확산을 위한 표준 셀 아키텍처
US9640480B2 (en) Cross-couple in multi-height sequential cells for uni-directional M1
US20100308905A1 (en) Semiconductor integrated circuit and method of designing semiconductor integrated circuit
US9035389B2 (en) Layout schemes for cascade MOS transistors
US11710733B2 (en) Vertical power grid standard cell architecture
US9634026B1 (en) Standard cell architecture for reduced leakage current and improved decoupling capacitance
KR102417056B1 (ko) 스페어 회로 셀들을 구비한 집적회로
CN110945655B (zh) 具有内在去耦电容器的单元架构
CN107210304B (zh) 连续扩散可配置标准单元架构
EP4338204B1 (en) Dummy cell and tap cell layout structure
KR20230082615A (ko) 이종 높이 로직 셀 아키텍처
US20180183439A1 (en) Multiple via structure for high performance standard cells
KR102531038B1 (ko) 소스 분리 셀
JP2023552060A (ja) 追加の酸化物拡散領域を有するセルアーキテクチャ
US9929095B2 (en) IO power bus mesh structure design

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

PC1203 Withdrawal of no request for examination

St.27 status event code: N-1-6-B10-B12-nap-PC1203

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000