KR20160135403A - Apparatus for loading electronic component for testing and for testing electronic component - Google Patents
Apparatus for loading electronic component for testing and for testing electronic component Download PDFInfo
- Publication number
- KR20160135403A KR20160135403A KR1020150068600A KR20150068600A KR20160135403A KR 20160135403 A KR20160135403 A KR 20160135403A KR 1020150068600 A KR1020150068600 A KR 1020150068600A KR 20150068600 A KR20150068600 A KR 20150068600A KR 20160135403 A KR20160135403 A KR 20160135403A
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- KR
- South Korea
- Prior art keywords
- tray
- electronic component
- shuttle
- unit
- loader
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
The present invention relates to an electronic component loading apparatus for testing and an electronic component testing apparatus.
Generally, electronic components or electronic devices such as semiconductor devices such as integrated circuits and drive devices such as SSDs and the like are manufactured through various test processes to cover good or defective products.
At this time, a test handler is used in the process of testing electronic components or electronic devices. A test handler or handler system is a device that connects electronic components to separate test equipment for testing electronic components and classifies tested parts according to the test results. The handler system is divided into a transfer area where the tray accommodating the device to be tested is transferred, a test area for testing the device, and a dispensing area for distributing the tested devices by good and defective categories, Test and distribute the device sequentially as it progresses. In other words, the handler system performs the loading process, the testing process, and the unloading process largely, and the electronic parts are mounted on a tray having a plurality of modules capable of mounting electronic components to perform the processes.
Storage drive devices such as hard disks and solid state drives (SSD) are tested through handler systems as well as semiconductor devices. At this time, it is loaded on a tray like the electronic component device, carried to a tester device, and tested in a tester.
In this process, a process of loading the component to be inspected with the test instrument is performed, and the component to be inspected is identified and inspected before mounting the component to be inspected on the test equipment. For example, .
SUMMARY OF THE INVENTION The present invention has been made to solve the above problems and it is an object of the present invention to provide an electronic component loading apparatus and electronic component testing apparatus capable of preventing identification or further reverse insertion by scanning electronic components in the process of transferring inspection electronic components to a tray I would like to propose.
In order to achieve the above object, according to one aspect of the present invention, there is provided a tray loader unit for providing a carrying tray containing electronic parts; A tray shuttle unit for transporting the electronic component in a shuttle tray; A scanner that scans and identifies an electronic component transferred from the carrier tray to the shuttle tray; A pick-up assembly unit for picking up the electronic components contained in the tray of the tray loader unit, moving the tray to the shuttle tray of the tray shuttle unit via the scanner, picking up the electronic components contained in the shuttle tray, And a control unit for receiving the scan result from the scanner and controlling at least the tray shuttle unit and the pickup assembly unit.
At this time, in one example, the electronic component loading apparatus for inspection further includes a collection tray for collecting the electronic components recovered by the pickup assembly unit. At this time, the scanner scans the identification code of the electronic component transferred by the pickup assembly unit, and the control unit judges that the electronic component whose identification code is not detected by the scanner is reverse insertion, and the pickup assembly unit The picked-up electronic component which is judged to be reverse inserted is transferred to the collection tray.
At this time, in another example, the tray loader unit may include a first tray loader providing a transport tray containing electronic components and a second tray loader providing an empty transport tray for receiving the inspected electronic components from the pickup assembly unit . In addition, the tray shuttle unit includes a first tray shuttle for transferring the electronic component transferred from the conveyance tray of the first tray loader by the pickup assembly unit to the shuttle tray, and an electronic component And a second tray shuttle for transporting the tray tray in a shuttle tray. In addition, the pick-up assembly unit: picks up the electronic component from the transport tray of the first tray loader, transfers it to the shuttle tray of the first tray shuttle via the scanner, and transfers the determined electronic component to the collection tray, A first pick-up assembly for transferring the inspected product from the shuttle tray of the inspected electronic component to the empty delivery tray of the second tray loader and the untested product to the collection tray; And a second pick-up assembly for transferring the electronic component from the shuttle tray of the first tray shuttle to the test board and for transferring the inspected electronic component from the test board to the shuttle tray of the second tray shuttle.
In yet another example, the electronic component loading apparatus for testing further includes a test board loading unit for receiving and loading a test board containing electronic components and providing an empty test board for receiving electronic components through the second pickup assembly .
Further, in one example, the pickup assembly unit includes a picker for picking up an electronic component, a horizontal rail for guiding the horizontal movement of the picker, and a side guide rail for guiding the vertical movement of the horizontal rail. At this time, a tray loader unit, a tray shuttle unit, a scanner, a test board, and a collection tray may be disposed between the side guide rails formed on both sides.
In another example, the tray loader unit transports the uppermost and lowermost trays of the elevating and lowering portions to the other side, while the tray loader unit transports the uppermost and lowermost trays of the elevating and lowering portions, And a rotation unit for rotating the conveyance tray so that the conveyance tray is lowered or raised. At this time, when the conveyance tray of the main elevating portion is lowered, the electronic components contained in the uppermost conveyance tray of the main elevating portion are picked up by the pickup assembly unit and the empty conveying trays are sequentially lowered.
Further, in one example, the electronic component may be a drive device for data storage.
Next, in order to achieve the above-mentioned object, according to another aspect of the present invention, there is provided a tray loader unit, comprising: a tray loader unit for providing a conveyance tray containing electronic components and providing an empty conveyance tray for receiving tested electronic components; A tray shuttle unit for transporting the electronic component in a shuttle tray; A scanner that scans and identifies an electronic component transferred from the carrier tray to the shuttle tray; The electronic components in the tray loader unit's transport tray are picked up, transferred to the shuttle tray of the tray shuttle unit via the scanner, picked up from the shuttle tray, transferred to the test board of the test unit, A pickup assembly unit for transferring from the shuttle tray to the shuttle tray and from the shuttle tray to the empty transport tray of the tray loader unit; A test unit including a test board on which the electronic component to be tested is mounted by the pickup assembly unit and a test instrument for inspecting electronic components mounted on the test board; And a control unit for receiving and judging the scan result of the scanner and the inspection result of the test equipment, and controlling at least the tray shuttle unit and the pickup assembly unit.
At this time, in one example, the electronic component loading apparatus for inspection further includes a collection tray for collecting the electronic components recovered by the pickup assembly unit. At this time, the scanner scans the identification code of the electronic component transferred by the pickup assembly unit, and the control unit judges that the electronic component whose identification code is not detected by the scanner is reverse insertion, and the pickup assembly unit The electronic parts that are picked up by the shuttle tray from the carrying tray and transferred to the collection tray from the shuttle tray containing the electronic parts judged to be reversely inserted and the inspected electronic parts among the electronic parts being carried are moved to the collection tray.
In yet another example, the tray loader unit may include a first tray loader providing a transport tray containing electronic components and a second tray loader providing an empty transport tray for receiving inspected electronic components from the pickup assembly unit. And the tray shuttle unit is moved from the test board through the first tray shuttle for transferring the electronic component transferred from the transport tray of the first tray loader by the pickup assembly unit to the shuttle tray and the pickup assembly unit after the inspection The pick-up assembly unit may include: a pick-up assembly unit for picking up the electronic component from the transport tray of the first tray loader and for transporting the electronic component to the shuttle tray of the first tray shuttle via the scanner, The picked up electronic components are transferred to the collection tray, A first pick-up assembly for transferring the inspection-passed product from the shuttle tray of the two-tray shuttle to the empty transport tray of the second tray loader and the untested product to the collection tray; And a second pick-up assembly for transferring the electronic component from the shuttle tray of the first tray shuttle to the test board and for transferring the inspected electronic component from the test board to the shuttle tray of the second tray shuttle.
Further, in one example, the pickup assembly unit includes a picker for picking up an electronic component, a horizontal rail for guiding the horizontal movement of the picker, and a side guide rail for guiding the vertical movement of the horizontal rail. At this time, a tray loader unit, a tray shuttle unit, a scanner, a test unit, and a collection tray may be disposed between the side guide rails formed on both sides.
In another example, the first and second tray loaders transport the uppermost and lowermost trays of the elevating and lowering portions to the other side, the main elevating and lowering portions for lowering or raising the transporting tray, the secondary elevating and lowering portion for operating in the opposite direction to the main elevating and lowering portion, And a rotation unit that rotates the conveyance tray so that the conveyance tray is lowered or raised in each elevation portion. At this time, the main lifting and lowering portion of the first tray loader sequentially downwardly stacks the empty transport trays after picking up the electronic components contained in the uppermost transport tray transferred from the secondary lifting portion of the first tray loader, The portion can transfer the uppermost conveyance tray provided with the inspection-passing electronic component by the first pick-up assembly to the elevating and lowering portion, and can sequentially raise the uppermost empty conveying tray of the main elevating portion.
Also in one example, the electronic component may be a drive device for data storage.
According to one embodiment of the present invention, an electronic component to be tested can be identified by scanning an electronic component in the process of transferring the electronic component for inspection to a tray, and further, can do.
It is apparent that various effects not directly referred to in accordance with various embodiments of the present invention can be derived by those of ordinary skill in the art from the various configurations according to the embodiments of the present invention.
1 is a view schematically showing an electronic component loading apparatus for testing or an electronic component testing apparatus according to an embodiment of the present invention.
2A and 2B are schematic plan configuration diagrams showing an electronic component loading apparatus for inspection according to another embodiment of the present invention.
3 is a plan view schematically showing an electronic component loading apparatus for testing or an electronic component testing apparatus according to another embodiment of the present invention.
BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a block diagram showing the configuration of a first embodiment of the present invention; Fig. In the description, the same reference numerals denote the same components, and a detailed description may be omitted for the sake of understanding of the present invention to those skilled in the art.
As used herein, unless an element is referred to as being 'direct' in connection, combination, or placement with other elements, it is to be understood that not only are there forms of being 'directly connected, They may also be present in the form of being connected, bonded or disposed.
It should be noted that, even though a singular expression is described in this specification, it can be used as a concept representing the entire constitution unless it is contrary to, or obviously different from, or inconsistent with the concept of the invention. It is to be understood that the phrases "including", "having", "having", "comprising", etc. in this specification are intended to be additionally or interchangeable with one or more other elements or combinations thereof.
The drawings referred to in this specification are for illustrating an embodiment of the present invention, and shapes, sizes, thicknesses, and the like may be exaggerated for an effective explanation of technical features.
First, an inspection electronic component loading apparatus according to one aspect of the present invention will be described with reference to the drawings.
FIG. 1 schematically shows an electronic component loading apparatus for inspection according to an embodiment of the present invention, and FIGS. 2 (a) and 2 (b) are schematic views showing an electronic component loading apparatus for inspection according to another embodiment of the present invention FIG. 3 is a plan view schematically showing an electronic component loading apparatus for inspection according to another embodiment of the present invention. FIG.
1 to 3, an inspection electronic component loading apparatus according to one example includes a
First, in one example, the electronic component loading apparatus for inspection may be a device that transports, scans and picks up a drive device (not shown) for data storage. For example, it may be an electronic component loading device for inspection that transports, scans and picks up a drive device such as a solid state drive (SSD).
Referring to Figures 1-3, the
For example, referring to FIG. 3, in one example, the
1 to 3, the
The main elevating
Next, the elevating and lowering
The rotation unit (not shown) of the
For example, at this time, referring to FIG. 2A and / or FIG. 3, the main elevating
Next, the
The
For example, referring to FIGS. 1-3, the
For example, referring to FIG. 3, the
The
The
That is, in one example, the identification code recorded on the electronic component in the
Next, the
The
For example, referring to FIG. 1, the
1 and 3, in one example, the first pick-up
Next, the second pick-up
1 and 3, a
1, in one example, the
The picker of the
At this time, the
Next, although not shown, a control unit of the electronic component loading apparatus for inspection will be described. A control unit (not shown) receives a scan result from the
For example, a control unit (not shown) may determine the reverse insertion of the electronic component from the scan result from the
1 to 3, a testing electronic component loading apparatus according to another example will be described. At this time, the electronic component loading apparatus for inspection further includes a
At this time, the
Referring to Figs. 1 to 3, in another example, the electronic component loading apparatus for inspection may further include a test
2A and 2B, the test
Next, an electronic device testing apparatus according to another aspect of the present invention will be described with reference to the drawings. At this time, embodiments of the electronic component loading apparatus for inspection according to one aspect described above can be referred to, and redundant explanations can be omitted.
FIG. 1 is a schematic view of an electronic component testing apparatus according to one embodiment of the present invention, and FIG. 3 is a plan view schematically showing an electronic component testing apparatus according to another embodiment of the present invention.
1 and 3, an electronic component testing apparatus according to one example includes a
First, in one example, the electronic component testing device may be a device that transports, picks up, scans, and tests a drive device (not shown) for data storage. For example, it may be an electronic component testing apparatus that transports, picks up, scans, and tests a drive device such as a solid state drive (SSD).
Referring to Figures 1 and / or 3, the
For example, in one example, the
Referring to FIGS. 1 and 3, in another example, the
Next, referring to Figs. 1 and 3, the
For example, referring to FIG. 3, in one example, the
Next, referring to FIGS. 1 and / or 3, the
Next, the
The
For example, the
The first pick-up
Further, in one example, the angle of the
Subsequently, the
Next, referring to FIG. 1 and / or 3, a control unit (not shown) receives the scan result of the
Further, another example will be described with reference to Figs. 1 and / or 3. At this time, in one example, the electronic component loading apparatus for inspection may further include a
At this time, the
The foregoing embodiments and accompanying drawings are not intended to limit the scope of the present invention but to illustrate the present invention in order to facilitate understanding of the present invention by those skilled in the art. Embodiments in accordance with various combinations of the above-described configurations can also be implemented by those skilled in the art from the foregoing detailed description. Accordingly, various embodiments of the present invention may be embodied in various forms without departing from the essential characteristics thereof, and the scope of the present invention should be construed in accordance with the invention as set forth in the appended claims. Alternatives, and equivalents by those skilled in the art.
110:
110b, 111b, and 113b: auxiliary lift portion 111: first tray loader
113: Second tray loader 115: Transport tray
120: scanner 130: pickup assembly unit
131: first pick-up assembly 131a, 133a: picker connecting line
131b, 133b:
133: second pick-up assembly 140: tray shuttle unit
141: first tray shuttle 143: second tray shuttle
145: Shuttle tray 150: Test unit
155: test board 170: collection tray
200: Test board loading unit
Claims (13)
A tray shuttle unit for transporting the electronic component in a shuttle tray;
A scanner that scans and identifies the electronic component transferred from the carrier tray to the shuttle tray;
A pick-up assembly unit for picking up an electronic component contained in the transport tray of the tray loader unit, transferring the picked-up electronic component to the shuttle tray of the tray shuttle unit via the scanner, picking up the electronic component contained in the shuttle tray, And
And a control unit for receiving the scan result from the scanner and controlling at least the tray shuttle unit and the pickup assembly unit.
Wherein the inspection electronic component loading apparatus further comprises a collection tray for collecting the electronic component collected by the pickup assembly unit,
Wherein the scanner scans an identification code of the electronic component transferred by the pick-up assembly unit,
Wherein the control unit judges that the electronic component which is not detected as an identification code by the scanner is reversed,
Wherein the pick-up assembly unit transfers the picked-up electronic component, which is determined to be inversely inserted under the control of the control unit, to the collection tray.
The tray loader unit having a first tray loader for providing the transport tray containing the electronic component and a second tray loader for providing a blank transport tray for receiving the inspected electronic components from the pickup assembly unit,
Wherein the tray shuttle unit includes a first tray shuttle for transferring the electronic component transferred from the transport tray of the first tray loader by the pickup assembly unit to the shuttle tray, And a second tray shuttle for transferring the electronic component transferred from the board into the shuttle tray,
The pick-up assembly unit is configured to pick up the electronic component from the conveyance tray of the first tray loader, to transfer the electronic component determined to be inserted back into the shuttle tray of the first tray shuttle via the scanner, A first pick-up assembly for transferring the inspected product from the shuttle tray of the second tray shuttle to the empty delivery tray of the second tray loader and the untested product to the collection tray; And a second pickup assembly for transferring the electronic component from the shuttle tray of the first tray shuttle to the test board and for transferring the inspected electronic component from the test board to the shuttle tray of the second tray shuttle. An electronic component loading device for inspection.
The testing electronic component loading apparatus further includes a test board loading unit for loading and storing the test board containing the electronic component and providing the test board to receive the electronic component through the second pickup assembly Characterized in that the electronic component loading device for inspection.
Wherein the pick-up assembly unit includes a picker for picking up the electronic component, a horizontal rail for guiding horizontal movement of the picker, and a side guide rail for guiding vertical movement of the horizontal rail,
Wherein the tray loader unit, the tray shuttle unit, the scanner, the test board, and the collection tray are disposed between the side guide rails formed on both sides.
Wherein the tray loader unit transports the uppermost and lowermost trays of the respective elevating and lowering portions to the other side, the elevating and lowering portions moving in the elevating and lowering portions, And a rotation portion for rotating the conveyance tray so that the conveyance tray is lowered or raised,
Wherein when the transport tray of the main elevating unit is lowered, the electronic parts contained in the uppermost transport tray of the main lift unit are picked up by the pickup assembly unit and the empty transport trays are sequentially lowered. .
Wherein the electronic component is a drive device for data storage.
A tray shuttle unit for transporting the electronic component in a shuttle tray;
A scanner that scans and identifies the electronic component transferred from the carrier tray to the shuttle tray;
Picking up the electronic component contained in the tray of the tray loader unit and transferring the electronic component to the shuttle tray of the tray shuttle unit via the scanner and picking up the electronic component contained in the shuttle tray and transferring the electronic component to the test board of the test unit, A pick-up assembly unit for transferring the completed electronic component from the test board to the shuttle tray and from the shuttle tray to the empty shipping tray of the tray loader unit;
A test unit for testing the electronic component mounted on the test board and the test board on which the electronic component to be tested is mounted by the pickup assembly unit; And
And a control unit for receiving at least a scan result of the scanner and an inspection result of the test device to determine at least the tray shuttle unit and the pickup assembly unit.
Wherein the inspection electronic component loading apparatus further comprises a collection tray for collecting the electronic component collected by the pickup assembly unit,
Wherein the scanner scans an identification code of the electronic component transferred by the pick-up assembly unit,
Wherein the control unit judges that the electronic component which is not detected as an identification code by the scanner is reversed,
Wherein the pick-up assembly unit is configured to move from the shuttle tray containing the inspected electronic component and the inspected electronic component, which are determined to be inversely inserted, of the electronic component picked up from the carrying tray to the shuttle tray under the control of the control unit, And transfers the judged electronic component to the collection tray.
Wherein the tray loader unit has a first tray loader for providing the transport tray containing the electronic components and a second tray loader for providing a blank transport tray for receiving the electronic components inspected from the pickup assembly unit,
Wherein the tray shuttle unit includes a first tray shuttle for transferring the electronic component transferred from the transport tray of the first tray loader by the pickup assembly unit to the shuttle tray, And a second tray shuttle for transferring the electronic component transferred from the board into the shuttle tray,
The pick-up assembly unit is configured to pick up the electronic component from the conveyance tray of the first tray loader, to transfer the electronic component determined to be inserted back into the shuttle tray of the first tray shuttle via the scanner, A first pick-up assembly for transferring the inspected product from the shuttle tray of the second tray shuttle to the empty delivery tray of the second tray loader and the untested product to the collection tray; And a second pickup assembly for transferring the electronic component from the shuttle tray of the first tray shuttle to the test board and for transferring the inspected electronic component from the test board to the shuttle tray of the second tray shuttle. Electronic component testing device.
Wherein the pick-up assembly unit includes a picker for picking up the electronic component, a horizontal rail for guiding horizontal movement of the picker, and a side guide rail for guiding vertical movement of the horizontal rail,
Wherein the tray loader unit, the tray shuttle unit, the scanner, the test unit, and the collection tray are disposed between the side guide rails formed on both sides.
The first and second tray loaders transfer the uppermost and lowermost trays of the elevating and lowering portions to the other side, and the elevating and lowering portions of the elevating and lowering portions, which move in the opposite direction to the main elevating and lowering portions, And a rotation section for rotating the conveyance tray so that the conveyance tray is lowered or raised in the conveyance tray,
The main lifting portion of the first tray loader sequentially lowers and stacks down the empty transport trays of the electronic components contained in the uppermost transport tray transported from the secondary lifting portion of the first tray loader,
Wherein the main lifting portion of the second tray loader transfers the uppermost transport tray provided with the inspection-passing electronic component by the first pick-up assembly to the sub-lifting portion and sequentially raises the uppermost empty transport tray of the main lifting portion Electronic component testing device.
Wherein the electronic component is a drive device for data storage.
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KR1020150068600A KR101734397B1 (en) | 2015-05-18 | 2015-05-18 | Apparatus for loading electronic component for testing and for testing electronic component |
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KR1020150068600A KR101734397B1 (en) | 2015-05-18 | 2015-05-18 | Apparatus for loading electronic component for testing and for testing electronic component |
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KR101734397B1 KR101734397B1 (en) | 2017-05-12 |
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Cited By (3)
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2015
- 2015-05-18 KR KR1020150068600A patent/KR101734397B1/en active IP Right Grant
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CN114553997A (en) * | 2022-03-10 | 2022-05-27 | 苏州茂特斯自动化设备有限公司 | Mobile phone mainboard detection line, detection method and storage medium |
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KR102627016B1 (en) * | 2022-09-26 | 2024-01-19 | 에스에스오트론 주식회사 | semiconductor chip tray transfer device |
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