KR102227346B1 - Electronic device test handler - Google Patents

Abstract

The present invention relates to an electronic component test handler, which has a function of giving rating information of devices loaded in a plurality of unloading stacker modules, converting rating information of the plurality of unloading stacker modules during the test, and controlling to move a plurality of user trays loaded between unloading stackers according to the rating information. According to the present invention, the electronic component test handler loads the user tray according to the rating information for each unloading stacker, and the user tray can be transferred between the unloading stackers, so that it can be operated flexibly in response to the rating of the device given in a plurality of numbers. In addition, if the judgment rate of a retest rating device is high, the retest can be performed by loading it directly into the user tray, storing it in a stacker, and transferring it directly to the loading site, so that the retest rating device can be processed quickly.

Description

Electronic component test handler {ELECTRONIC DEVICE TEST HANDLER}

The present invention relates to an electronic component test handler, and more particularly, it is possible to change the loading position of the classified user tray, thereby improving the loading efficiency, and quickly reloading the retest grade electronic components for retesting. It relates to an electronic component test handler.

The electronic component test handler is a device that inspects a plurality of electronic components, for example, semiconductor devices, modules, and SSDs after being manufactured. The electronic component test handler is configured to connect electronic components to a test device and artificially create various environments to inspect whether the electronic components are operating normally, and to classify them into good, re-inspection, and defective products according to the inspection results.

The electronic component test handler performs logistics by exchanging a user tray loaded with a device to be tested or a device that has been tested with the outside, and logistics with the outside must be performed at an appropriate cycle so that the inspection can be continuously performed.

Korean Patent No. 1,734,397 (registered on May 02, 2017) is disclosed for such a test handler filed and registered by the present applicant.

However, such a conventional test handler has a problem in that the overall processing speed is lowered due to poor responsiveness when the quantity of electronic components unloaded for each classified grade suddenly changes.

Korean Patent Registration No. 1,734,397 (2017. 05. 02. Registration)

An object of the present invention is to provide an electronic component test handler that improves responsiveness to fluctuations in the incidence rate for each grade in the conventional electronic component test handler described above, and in particular enables rapid processing of retest quantity.

As a means of solving the above problems, a stacker configured to accommodate a plurality of user trays and including a plurality of loading stacker modules and a plurality of unloading stacker modules, a device loaded on a user tray, a test tray, and a buffer tray on the base A plurality of hands configured to pick up or place a device, a test chamber configured to give a rating by performing a device test while receiving the test tray, and a user tray are configured to be seated, and the user tray is mounted on the base. The set plate and the unloading stacker module, which are configured to be elevated to be exposed to, are given rating information of the loaded device, and the unloading stacker module according to the rating information of the devices classified into a plurality of grades as a test result. It includes a control unit that controls the device to be loaded on the device, and the control unit assigns rating information of devices to be loaded into the plurality of unloading stacker modules, and converts the rating information of the plurality of unloading stacker modules during the test, and An electronic component test handler may be provided to control so as to move a plurality of user trays loaded between the unloading stackers.

Meanwhile, in the first mode, the control unit loads the device requiring retest from the test tray into the buffer tray, and in the second mode, assigns retest grade information to any one of the unloading stacker modules, and retests are required. The device can be controlled to load in the unloading stacker module to which the retest grade information is assigned.

In addition, the control unit may control to switch between the first mode and the second mode according to a determination rate of a device determined as a retest grade as a result of a test result of a plurality of devices.

Furthermore, the control unit may preferentially select the first mode and, when the determination rate exceeds a predetermined value, control to switch to the second mode.

Meanwhile, the unloading stacker module includes an upper unloading stacker and a lower unloading stacker, and the upper unloading stacker and the lower unloading stacker may be configured to exchange user trays in the vertical direction.

In addition, in the first mode, the control unit may assign grade information excluding the retest grade to each of the upper unloading stackers, and load the user tray on the upper unloading stacker according to the grade of the device.

Further, in the second mode, the control unit moves the user tray loaded on any of the upper unloading stackers to the lower unloading stacker and assigns retest grade information to the empty upper unloading stacker.

In addition, in the second mode, the controller may control the hand to directly transfer the device determined as the retest grade from the test handler to the set plate located above the upper unloading stacker to which the retest grade information is assigned.

Furthermore, when the test for the loaded device in the second mode is finished, the device to which the retest rating information is assigned is loaded, and the user tray loaded in the upper unloading stacker is transferred to the loading stacker to provide retest rating information. It can be controlled to re-run the test for the device to which is assigned.

In addition, the upper unloading stacker is configured to be drawn out in a horizontal direction so that the user tray can be exchanged with the outside, and the lower unloading stacker is a guide rod in the vertical direction so that the user tray can be exchanged with the upper unloading stacker in the vertical direction. It can be configured to include.

The electronic component test handler according to the present invention switches the loading target rating for each stacker according to the judgment rate of the electronic component that has been tested and graded, and in particular, in some cases, directly loads the electronic component with retest rating into the user tray. It can be loaded on the stacker, so it has the effect of quickly retesting it.

1 is a conceptual diagram of an electronic component test handler according to the present invention divided into spaces according to functions.
FIG. 2 is a conceptual diagram of the test handler body of FIG. 1 divided according to functions on a plane.
3 is a conceptual diagram showing movement of a device and a test tray in a loading site.
4 is a conceptual diagram showing the transfer of a device at an unloading site.
5 is a partial perspective view of a stacker of an electronic component test handler according to the present invention.
6 is an enlarged perspective view showing an enlarged partial configuration of FIG. 4.
7 is a conceptual diagram showing an operation concept of the stacker during distribution between the first loading unit and the outside.
8 is an operational state diagram showing the transfer of the user tray between the first loading unit and the second loading unit.
9 illustrates a concept of transferring devices according to grades at an unloading site.
10A and 10D are conceptual diagrams of loading a user tray into a stacker according to grade information.
11A and 11B are conceptual diagrams illustrating a concept of loading a user tray when a new grade is assigned according to the grade information.
12A and 12B are conceptual diagrams illustrating a concept of a change in a transfer position of a device classified as a retest grade and a change in a loading position of a user tray.
13 illustrates the concept of conveying the user tray to the outside for each grade after completing the one-time cycle test process.
14 illustrates the concept of directly transferring a device to which a retest grade has been assigned to a loading stacker.

Hereinafter, an electronic component test handler according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. In addition, in the description of the following embodiments, the names of each component may be referred to as different names in the art. However, if they have functional similarities and identity, even if a modified embodiment is employed, it can be viewed as a uniform configuration. In addition, symbols added to each component are described for convenience of description. However, the content illustrated on the drawings in which these symbols are indicated does not limit each component to the range within the drawings. Likewise, even if an embodiment in which the configuration in the drawings is partially modified is employed, it can be viewed as an equivalent configuration if there is functional similarity and identity. In addition, in view of the level of a general technician in the relevant technical field, if it is recognized as a component that should be included of course, a description thereof will be omitted.

Hereinafter, a device will be described on the premise that it refers to a device that electrically functions, such as a semiconductor device, a semiconductor module, and an SSD. In addition, hereinafter, the user tray refers to a tray in which a plurality of loading grooves configured to load semiconductor elements are arranged in a certain arrangement, and the loading groove of the user tray is configured so that the device is fixed inside the groove by gravity without a separate fixing function. It should be explained on the premise that it can be done.

Hereinafter, the overall configuration of the test handler according to the present invention will be described with reference to FIGS. 1 to 4.

1 is a perspective view of a test handler according to the present invention.

As shown in FIG. 1, the test handler 1 according to the present invention is configured to carry in the device 20 from the outside, perform a test, and selectively take it out according to the grade.

The test handler 1 moves the stacker and device 20 for carrying in or out of the user tray 10 from the outside according to spatially functional functions, and carries out a test, and then performs a test by grade. It may be classified into a test handler body 100, which is an area that is classified and loaded into the user tray 10.

The stacker 2 refers to an area in which the user tray 10 can be loaded in a large amount. The stacker may be classified into a loading stacker, an unloading stacker, and an empty stacker according to the loaded device 20.

The loading stacker is configured to load the user tray 10 in which the devices 20 that need to be tested and sorted are loaded. The loading stacker is configured to have a size in which a plurality of user trays 10 carried from the outside can be stacked in units of 1 lot. The unloading stacker is configured to load a plurality of user trays 10 loaded with a device 20 for carrying out to the outside among the devices 20 that have been tested and sorted before being taken out in units of one lot. The empty stacker is configured so that a plurality of empty user trays 10 can be loaded, and the empty user tray 10 is transferred from the loading stacker after the transfer of the device 20 is completed, or the empty user tray 10 is transferred to the unloading stacker. It may be configured to be able to transport the user tray 10.

On the other hand, the loading stacker, the unloading stacker, and the empty stacker may be classified according to logistics to the outside, logistics and loading purpose inside the test handler 1, but their configurations may be the same or similar to each other.

Each stacker module 400 may be configured to stack and stack a plurality of user trays 10 in a vertical direction for efficient use of space. In addition, each of the stacker modules 400 is configured to be opened and closed by moving horizontally in the y direction of FIG. 1, and distribution with the outside is performed at a position carried out to the outside. As an example, a plurality of user trays 10 may be transferred to a loading stacker from an automatic guided vehicle (AGV), or an unmanned vehicle may collect a plurality of user trays 10 from the unloading stacker.

In addition, the stacker 2 may be configured such that each of the loading stacker, the unloading stacker, and the empty stacker may be set in plural, and internal logistics can be continuously performed even while any one is logistics with the outside.

Hereinafter, the configuration and operation of the test handler body 100 will be schematically described with reference to FIGS. 2 and 3.

FIG. 2 is a conceptual diagram of the test handler body 100 of FIG. 1 divided according to functions on a plane, FIG. 3 is a conceptual diagram showing movement of a device and a test tray at a loading site, and FIG. 4 is a device at an unloading site. It is a conceptual diagram showing the transfer of.

The test handler body 100 tests a plurality of devices 20, classifies the devices 20 after the test, and transfers and loads the devices 20 before and after the test. The test handler body 100 may be functionally classified, including a loading site (L), a test site (T), and an unloading site (UL).

The loading site L is configured to pick up a plurality of devices 20 from the user tray 10 and place them on the test tray 130. The loading site L may be provided with a hand 110 for transferring the device 20 from the user tray 10 to the test tray 130, a loading shuttle 120, and a scanner (not shown) for inspection. .

The user trays 10 loaded in the loading stacker may be alternately supplied to the pickup position one by one, and the hand 110, which will be described later, removes only the plurality of devices 20 from the user tray 10 and transfers them. When all the devices 20 that were loaded are transferred, the empty user tray 10 and the user tray 10 in which the devices are loaded are replaced and positioned so that the device 20 can be continuously supplied. On the other hand, in the pickup position, a plurality of user trays 10 are provided so that the device 20 can be continuously supplied even when all the user trays 10 loaded in any one stacker module 400 are consumed or a failure occurs. It can be exposed. In this case, when the device 20 is being transferred from any one user tray 10, the other user tray 10 may be configured to wait in a standby state or be replaced with a new user tray 10.

The hand 110 is configured to pick up and transfer the plurality of devices 20 and then load them onto the test tray 130 or the loading shuttle 120. The hand 110 may be configured in plural and configured to take charge of logistics for each transport section. The hand 110 may be installed on a rail that can move in the horizontal direction on the upper side, and is configured so that the attachment can be viewed toward the lower side, and a linear actuator (not shown) is provided so that the length can be adjusted in the vertical direction. I can. As an example, the attachment may be configured to be provided with a plurality of vacuum ports to vacuum-adsorb the plurality of devices 20. In addition, the attachment may be configured to be replaceable in consideration of the type, size, and shape of the device 20.

On the other hand, the test tray 130 is provided with an insert for each loading groove in consideration of thermal deformation when the device 20 is fixed and the test is performed, and the spacing between the loading grooves may be different from that of the user tray 10. In general, the spacing between the loading grooves of the test tray 130 is configured to be larger than that of the user tray 10. Therefore, after picking up the plurality of devices 20 from the user tray 10 at the pickup position by using the hand 110, the space between the devices 20 is widened and then loaded onto the test tray 130. Specifically, two interval adjustments may be performed to increase the interval in two directions of xy, and for this purpose, a loading shuttle 120 is provided between the pickup position and the test tray 130, and a loading shuttle from the user tray 10 The distance in one direction can be adjusted while being transferred to 120, and the distance in the other direction can be adjusted while transferring from the loading shuttle 120 to the test tray 130.

The loading shuttle 120 is provided between the user tray 10 and the test tray 130, and the space between the loading grooves is the user tray 10 so that a plurality of devices 20 can be loaded in a state in which they are primarily aligned. It can be configured in an array that is widened in one direction. In addition, the loading shuttle 120 may be positioned in consideration of the locations of the user tray 10, the test tray 130, and the hand 110 for efficient logistics.

A scanner (not shown) is provided to identify if there is a barcode on the device 20 to be transferred. The scanner (not shown) may be configured to recognize a barcode on a path through which the hand 110 picks up and transfers the device 20. The scanner may be provided in various positions to facilitate the recognition of barcodes according to the shape, size, and type of the device 20.

In the place position, an empty test tray 130 is supplied, and the device 20 is transferred and stacked. When the loading of the device 20 is completed at the place position, the test tray 130 is transferred to the test site T afterwards, and a new empty test tray 130 is supplied.

Meanwhile, although not shown, a mask and a preciser configured to prevent separation of the device 20 after the device 20 is seated on the test tray 130 may be provided at the place position. . As described above, the test tray 130 is provided with an insert for each loading groove, and each insert is provided with a locking portion capable of preventing the device 20 from being detached. The basic position of each of the locking portions is set to a position that prevents the device 20 from being detached.

The loading of the device 20 in the test tray 130 is performed by expanding the engaging portion of the insert with a mask while pressing the insert with a presizer, and the hand 110 transferring the device 20 to the loading groove.

The mask is configured in a shape corresponding to the test tray 130, and a plurality of protrusions 421 are provided to expand the locking portions of each insert when in close contact with the test tray 130.

As described above, the presizer is configured to temporarily fix the insert provided in the test tray 130 in a somewhat spaced state. The presizer is provided with a plurality of pressing pins corresponding to the position of each insert, and the presizer is in close contact with the test tray 130 to press the insert to temporarily fix it with the test tray 130. Therefore, it is possible to minimize the position error when the device 20 is seated on the insert.

However, although not shown, an elevating unit for independently elevating the mask and the presizer may be additionally provided.

The test site T is configured to perform a test on the plurality of devices 20 loaded on the test tray 130 in units of the test tray 130 and transmit the test results. In the test chamber 160, for example, a thermal load test may be performed in which the device 20 is changed to a temperature of -40°C to 130°C to check the function.

A test chamber 160 and a buffer chamber 150 provided before and after the test chamber 160 may be provided at the test site T. The buffer chamber 150 may be configured to be loaded with a plurality of test trays 130, and may be configured to perform preheating or post heat treatment before and after the heat load test is performed.

In the test site T, the test tray 130 may be configured to be transported and tested while the test tray 130 is upright, so that the overall size of the equipment may be reduced. Meanwhile, although the configuration is not shown in detail, an inverter 140 may be provided before and after the buffer chamber 150 to change the posture of the test tray 130 to an upright state.

The unloading site UL is configured to sort, transport, and load the device 20 according to the test result from the test tray 130 transferred from the test site T. The unloading site UL may be provided with elements similar to the configuration of the loading site L, and may be performed in an order opposite to the transfer of the device 20 at the loading site L. However, at the unloading site UL, a buffer table 170 may be provided to temporarily collect from the test tray 130 according to grades. In order to improve the efficiency of logistics, after loading a predetermined number of devices 20 of the same grade in the buffer table 170, it can be controlled to pick up a plurality of devices at the same time using a hand and transfer them to the user tray 10. .

On the other hand, although not shown, the empty test tray 130 that has finished transferring the device 20 from the unloading site UL may be circulated while being transferred to the loading site L side.

Further, although not shown, a control unit for controlling driving of the above-described components may be separately provided.

Hereinafter, the stacker according to the present invention will be described in detail with reference to FIGS. 5 to 8.

5 is a partial perspective view of a stacker of the electronic component test handler 1 according to the present invention, and FIG. 6 is an enlarged perspective view showing a partial configuration of FIG. 5.

As shown, the stacker according to the present invention may be configured to continuously supply or retrieve the device 20 from the lower side of the base 101 of the test handler body 100. The stacker may include a lower stacker 500 and a lower stacker 500.

The upper stacker 300 is configured so that a plurality of user trays 10 received from the outside can be loaded, and the user tray 10 can be transferred by the transfer 310 from the inside. The upper stacker 300 is configured to supply the user tray 10 to the base 101 of the main body 100 toward the upper side, or to exchange the lower stacker 500 and the user tray 10 toward the lower side. The upper stacker 300 may include a transfer 310, a set plate 320, and a stacker module 400.

The transfer 310 is configured to grip and transport the user tray 10 inside the upper stacker 300. The transfer 310 may be configured in plural, and may include one or more transfers 310 involved in loading and one or more transfers 310 involved in unloading. The transfer 310 may be provided with a plurality of actuators (not shown) to enable horizontal movement and vertical movement. The transfer 310 may be controlled so that the transfer of the user tray 10 is performed between any one of the first loading units 410 and any one of the set plate 320 to be described later. In addition, it may be controlled to perform the distribution of the user tray 10 between the first loading unit 410. The transfer 310 may be controlled to load the user trays 10 one by one from the upper side of the first loading unit 410, or stack them one by one to the lower side.

The set plate 320 is configured to expose the transferred user tray 10 to the test handler body 100. The set plate 320 is configured to be raised and lowered while the user tray 10 is loaded, and when it is raised, the hand 110 of the test handler body 100 is moved to a position where the device 20 can be picked up. , When descending, the transfer unit 310 may be moved to a position where the user tray 10 can be replaced. The set plate 320 may be provided in plural at the loading site L and the unloading site UL.

The stacker module 400 may be configured in a plurality, each independently opened and closed to exchange the user tray 10 with the outside. The plurality of stacker modules 400 may be provided in a number corresponding to 1:1 with the second loading part 510 inside the lower stacker 500 to be described later. The stacker module 400 may be configured to be opened while moving in the horizontal direction, which is the y direction in FIG. 5. The stacker module 400 includes a frame 200, a first loading part 410, a holder 420, a slider 430, a linear actuator 450, a guide 610, a sensor part 620, and a door 440. It can be configured to include.

The frame 200 may be configured to constitute an overall skeleton.

The first loading unit 410 refers to a space in which a plurality of user trays 10 can be stacked in a stacked state. The first loading unit 410 may be loaded with an external user tray 10 transfer means, for example, 1 lot, which is a unit that is exchanged with a robot at a time. However, since the number of user trays 10 constituting one lot may vary according to the type of device 20, a detailed example will be omitted. Meanwhile, the space of the first loading part 410 may be formed corresponding to the shape and size of the user tray 10.

The holder 420 may be configured to selectively pass or support the user tray 10 between the first loading portion 410 and the second loading portion 510 to be described later. The holders 420 may be provided in a pair on each of the first loading portions 410, and each holder 420 may include a protruding portion 421. The protrusion 421 may be configured asymmetrically along the rotation direction so as to selectively interfere with the movement path of the user tray 10 when the holder 420 is rotated. The protrusion 421 may be configured to substantially support the lower surface of the user tray 10. The lower side of the first loading unit 410 is configured to allow the user tray 10 to pass through the frame 200 so that the user tray 10 can enter and exit, and when the holder 420 is opened, the user tray 10 can pass therethrough. The holder 420 may include a protrusion 421 protruding on a moving path of the user tray 10 between the second loading portion 510 and the first loading portion 410 when closed. When the holder 420 is opened, the protrusion 421 may be rotated so that interference does not occur on the moving path of the user tray 10.

The slider 430 may be provided under the stacker module 400 so that the stacker module 400 is slid and moves relative to the frame 200. The slider 430 may be configured to stably support the stacker module 400 from the lower side, and may be constrained to move the stacker module 400 to a predetermined reciprocating position.

The linear actuator 450 is configured to move the stacker module 400 in the horizontal direction. One side of the linear actuator 450 may be connected to the frame 200 and the other side may be connected to one side of the stacker module 400 to open and close the stacker module 400 according to an input. However, in the present embodiment, the linear actuator 450 has been described as an example, but may be modified and applied in various configurations for reciprocating movement of the stacker module 400.

The guide 610 is configured to prevent the user tray 10 from being separated from the first loading unit 410 in a state in which the plurality of user trays 10 are stacked. The guide 610 is formed to extend in a vertical direction at a plurality of points along the circumference of the first loading portion 410. For example, two guides 610 adjacent to each corner of the user tray 10 may be provided, and a total of eight guides 610 may be provided. The length of the guide 610 may be formed to extend to a length such that it does not deviate laterally when the second loading portion 510 and the user tray 10 are exchanged. That is, a separation distance between the upper end of the guide 610 of the second loading portion 510 and the first loading portion 410 of the upper side may be formed to be shorter than the thickness of the user tray 10.

The sensor unit 620 may be configured to determine whether the user tray 10 is present in the first loading unit 410 and whether loading is completed. The sensor unit 620 may be configured to determine the presence or absence of the user tray 10 positioned at the uppermost side and the lowermost side when the user tray 10 is loaded on the first loading unit 410. When the uppermost sensor detects that the user tray 10 is present, it is determined that the loading of the user tray 10 in the first loading unit 410 is completed, and the subsequent operation may be controlled. On the other hand, when sensing that the user tray 10 is absent from the lowermost sensor, it is determined that the first loading unit 410 is empty, and an operation thereafter may be controlled. On the other hand, in the case of loading from the outside in a unit of 1 lot, when the user tray 10 is measured by the sensor at the lowermost side, it can be determined that the user tray 10 is full in the first loading unit 410. Conversely, the user When the tray 10 is not measured, it can be determined that the first loading portion 410 is exhausted and empty. Meanwhile, the above-described sensor unit 620 may be applied in various configurations capable of determining the presence or absence of the user tray 10 at a separated point such as a laser sensor, an infrared sensor, or an ultrasonic sensor.

The door 440 is configured to shield the outside when the stacker module 400 is moved to the inside of the stacker and is inserted into the stacker.

The lower stacker 500 is provided under the upper stacker 300. The lower stacker 500 may be an additional loading space for the user tray 10 that can be used in the upper stacker 500. The lower stacker 500 may include a second loading part 510, a second loading part lifting part 520, a guide 610, and a sensor part 620.

Like the first loading unit 410, the second loading unit 510 may be defined as a space in which the user tray 10 can be loaded. The second loading part 510 is configured to exchange the first loading part 410 and the user tray 10 upward. The second loading portion 510 is configured in the same number as the number of the stacker modules 400 described above and is provided in parallel under the stacker module 400, and the first loading portion 410 and the second loading portion 510 May be configured to correspond to 1:1.

The second loading part lifting part 520 is configured to lift the plurality of user trays 10 in the vertical direction. The second loading part lifting part 520 may include a support plate 521, a support part 522, and a lifting drive part 523. The support plate 521 is configured to support the user tray 10 loaded on the second loading part 510 to the upper surface. The support plate 521 has a size that does not cause interference due to the protrusion 421 when moving between the second loading portion 510 and the first loading portion 410 even when the protruding portion 421 of the holder 420 is closed. Can be configured. The support part 522 is provided on the frame side and is connected to the support plate 521. The elevating driving part 523 is connected to the support part 522 to move the support part 522 in the vertical direction. The elevating driver 523 may be configured such that the support plate 521 is capable of adjusting the height from the lower side of the second loading portion 510 to the lower side of the first loading portion 410.

Meanwhile, the guide 610 and the sensor unit 620 may be provided on the second loading portion 510 in the same manner as the configuration of the first loading portion 410 described above. However, the guide 610 may be provided with a length similar to the height in which one lot is loaded.

Hereinafter, the operation of the stacker according to the present invention will be described with reference to FIGS. 7 and 8.

7 is a conceptual diagram showing an operation concept of the stacker during distribution between the first loading unit and the outside.

As shown in FIG. 7, when the first loading part 410 is empty, the user tray 10 can be supplied from the outside. At this time, the stacker module 400 can transfer the user tray 10 to the second loading unit 510, so when an external robot passes to an adjacent position, the first loading unit 410 is emptied and additionally the user Stacking of the tray 10 is possible. On the other hand, when the supply cycle of the user tray 10 from the outside is prolonged, the first loading unit 410 and the second loading unit 510 for supply are arranged in two or more rows, so that the user tray 10 is stored in one row. When all are exhausted, the user tray 10 loaded in another row can be used. In this case, when the user tray 10 is supplied from the outside, a plurality of stacker modules 400 may be simultaneously loaded.

8 is an operational state diagram showing the transfer of the user tray between the first loading unit and the second loading unit.

8 is an operational state diagram showing the transfer of the user tray 10 between the first loading portion 410 and the second loading portion 510. As shown, in the case of transferring the user tray 10 from the second loading portion 510 to the first loading portion 410, the upper side while supporting the stacked user trays 10 from the second loading portion 510 side Will be transferred.

Looking at the operation of the second loading unit lifting unit 520 and the holder 420, the stacker module 400 is opened to load 1 lot of the user tray 10 from the outside in the first loading unit 410, and the stacker module 400 is inserted into the original position (Fig. 6(a)). When it is necessary to transfer the user tray 10 to the second loading part 510, the second loading part lifting part 520 is raised to support the lower surface of the stacked user trays 10 (b). At this time, the support plate 521 of the second loading unit lifting unit 520 may be configured to have a size smaller than that of the user tray 10, so that even when the holder 420 is closed, the user tray 10 is prevented from interference with the holder 420. I can support the lower side of it. At this time, the lifting height of the second loading part lifting part 520 is such that the height of the bottom of the lowermost user tray 10 of the first loading part 410 is higher than the support height of the holder 420. Can be determined. When the user tray in the first loading part 410 is supported by the second loading part lifting part 520, the holder 420 is opened (c). Thereafter, since the user tray 10 is supported by the second loading part lifting part 520, when the second loading part lifting part 520 is lowered, the user tray 10 is also lowered toward the second loading part 520. Becomes (d). When the user tray 10 is completely moved toward the second loading unit 520, the holder 420 is closed again (e). Thereafter, the stacker module 400 is opened so that the user tray 10 can be reloaded (f).

On the other hand, although not shown, when the user tray 10 that has been tested on the unloading side is to be taken out, the control is performed in the opposite order of the above-described procedure, so that the plurality of user trays 10 are transferred from the second loading unit 510. It can be transferred to the first loading unit 410.

Hereinafter, with reference to Figs. 9 to 14 will be described in detail with respect to the loading and transport of the classified user tray 10 according to the present invention. Hereinafter, a case in which the number of rows constituting the unloading stacker is smaller than the class of the devices 20 to be classified will be described as an example. Specifically, the case where the stacker and the set plate of the unloading site L are composed of three rows, and the grade of the device 20 is five or more will be described as an example. On the other hand, when the user tray 10, which has been sorted by grade, is taken out to the outside, the user trays 10 loaded in each stacker are taken out at once. Therefore, it will be described on the premise that it is preferable that only the devices 20 of the same grade are loaded in each stacker.

9 shows a concept of transferring the device 20 according to the grade in the unloading site.

As described above, the unloading site (UL) is configured so that the hand picks up the device 20 from the test tray 130, transfers it, and places it. Meanwhile, before the test tray 130 is transferred to the unloading site, the test result, which is the grade information, is transmitted inside the test chamber, and the control unit determines the transfer path of each device 20 based on this.

First, when the test starts, the control unit sets three of the initial default settings, for example, ranks 1, 2, and 3, which are statistically determined as the largest number, and assigns them to the upper unloading stackers (302, 303, 304) of each row. Put it. Set plates 321, 322, 323 corresponding to each unloading stacker are provided on the upper side of each of the upper unloading stackers 302, 303, and 304, and each of the set plates 321, 322, 323 is provided with an adjacent unloading stacker. Set to the same grade as the loading stacker.

Here, when it is determined that the amount of retesting, that is, the test again is necessary, the quantity of the device 20 is transferred to the buffer table 170 under the premise that the quantity of the device 20 is somewhat less than the quantity of the devices 20 judged as other grades. Set the path. In this case, after the quantity of one cycle test (for example, in 1 LOT unit) is finished, the retest grade devices 20 are finally withdrawn from the buffer table 170 until the test is performed again. It waits in the state of being loaded on 170, and after the whole test is finished, only the device of the Retets class is loaded and transferred back to the user tray 10.

When the device 20 starts sorting, the controller transfers to the first path G1 in the case of the first class and loads it into the user tray 10 loaded on the first set plate 321, and in the case of the second class. The user tray 10 is transferred to the second path G2 and loaded onto the user tray 10 loaded on the second set plate 322, and in the case of the third grade, the user tray 10 loaded on the third set plate 323 The hand is controlled so that it can be loaded with. Meanwhile, as described above, the retest grade device 20 is transferred to the fourth path G4 and loaded on the buffer table 170.

10A and 10B are conceptual diagrams of loading the user tray 10 into a stacker according to grade information.

As shown in FIG. 10A, the device 20 is continuously transferred according to the rating information, and when the device 20 is fully loaded in any one user tray 10, the user tray 10 is transferred to the stacker by transfer. Is loaded. At this time, when the number of loaded user trays 10 reaches the loading capacity of the first upper unloading stacker 302, the control unit transfers the rating information of the first lower unloading stacker 502 to the first upper unloading stacker 302. In the same way, it is set as the first grade. Then, as shown in FIG. 10B, the plurality of user trays 10 loaded in the first upper unloading stacker 302 are lowered and moved to the first lower unloading stacker 502. Thereafter, the first upper unloading stacker 302 is continuously loaded with the user tray 10 in which the device 20 of the first class is loaded.

Hereinafter, a case in which a new grade to be loaded is generated will be described with reference to FIG. 11.

11A and 11B are conceptual diagrams illustrating the concept of loading the user tray 10 when a new grade is assigned according to the grade information.

As shown in FIG. 11A, the devices 20 classified into the fourth grade are temporarily stored in the buffer table 170 because there is no matching grade on the currently set set plates 321, 322, and 323. When the number of devices 20 classified into the fourth grade is sufficiently acceptable in the buffer table 170 until the number of one cycle test is completed, it is sufficient not to directly transfer to the user tray 10 during the classification. However, when the amount of the devices 20 classified in the fourth class exceeds the limit acceptable in the buffer table 170, it is preferable to load them into the user tray 10 and load them into a stacker. In the case of FIG. 11B, the judgment rate of the devices 20 assigned the fourth grade, that is, the number of devices 20 judged as the fourth grade per unit time is expected to increase and exceed the loading capacity of the buffer table 170. The operation is shown in the case. The control unit transfers the user tray 10 loaded in any one of the upper unloading stackers 302, 303, 304 to the lower unloading stacker when the judgment rate of the fourth grade exceeds a predetermined range, (20) Set up the stacker to load. The selection of the stacker may be, for example, a stacker in which the user tray 10 is loaded in the smallest number so far. In FIG. 11B, since the user tray 10 loaded in the second upper unloading stacker 303 is the least, the control unit assigns second grade information to the second lower unloading stacker 503 and performs the second upper unloading. The user tray 10 may be moved from the stacker 303 to the second lower unloading stacker 503. Thereafter, the control unit sets the grade of the second upper unloading stacker 303 and the second set plate 322 to the fourth grade, and transfers the second grade transfer route to the buffer table 170. ) Can be switched. Meanwhile, the predetermined range can be statistically determined by analyzing data according to operation. In addition, each grade may be displayed on the display unit 700 provided at the number and position corresponding to each stacker on the upper side of the stacker so that the user can recognize it.

12A and 12B are conceptual diagrams showing a concept of a change in a transfer position of a device 20 classified as a retest grade and a change in a loading position of a user tray.

As illustrated, the control unit may be divided into a first mode and a second mode according to a determination rate of a retest grade, and control may be performed. Specifically, in the first mode, as shown in FIG. 12A, the control unit predicts that the quantity is sufficiently acceptable in the buffer table 170 when the determination rate of the retest grade is less than a predetermined range, and the device 20 in need of retest is placed in the buffer table. It can be controlled to transfer to 170.

Meanwhile, as shown in FIG. 12B, when the determination rate of the retest grade exceeds a predetermined range, the controller predicts that it will exceed the number acceptable in the buffer tray 170, and the second mode is performed, and the upper unloading stacker 302, 303, 304), and move the user tray 10 to the lower unloading stacker 502, 503, 504, and retest grade device 20 in the upper unloading stacker 302, 303, 304. Prepares for loading the user tray (R) loaded with ). In the second mode, the retest grade device 20 is transferred to the second path G2 through which the device 20 is transferred to the user tray 10 mounted on the second set plate 322. On the other hand, the device 20 given as the existing second grade may be transferred to the fourth path G4 so that it can be temporarily loaded in the buffer table 170. On the other hand, when the rate of determination of each grade is changed and thus the update of grade information is required for two or more stackers, the control described in FIGS. 11 to 12 may be simultaneously performed.

13 illustrates the concept of conveying the user tray 10 to the outside by grade after completing the one cycle test process.

As shown, the user tray can be transferred between the loading site stacker (LS), the buffer stacker (BS) and the unloading site stacker (ULS), and loading the user tray from the unloading site stacker (ULS) site stacker (LS) It can be transferred directly to and loaded, and then retested. In addition, although not shown, an empty tray or a user tray cover may be temporarily loaded on the buffer stacker BS.

Referring back to FIG. 13, each stacker is filled for each grade after completing the one-time test process in units of 1 lot. When carrying out the user tray 10 to the outside, first, the user tray 10 loaded for each upper unloading stacker is carried out together. First, when the user tray 10 is unloaded from the upper unloading stacker, the user tray 10 loaded on the lower unloading stacker rises, moves to the upper unloading stacker, and is finally carried out to the outside. Here, the stacker in which the device 20 classified in the retest grade is loaded can be placed on standby without carrying it out.

14 shows the concept of directly transferring the device 20 to which the retest grade has been assigned to the loading stacker. In this drawing, an example in which the user tray 10 in which the retest grade device 20 is accommodated is loaded in the second upper unloading stacker 303 and the second lower unloading stacker. First, as shown in FIG. 14(a), the retest user trays R loaded in the second upper unloading stacker 303 are moved to the first upper loading stacker 301 one by one by a transfer (not shown).

Thereafter, as shown in FIG. 14B, all of the retest user trays R loaded in the second upper unloading stacker 303 are completely moved to the second upper loading stacker 301.

Thereafter, as shown in FIG. 14(c), the entire retest user tray R from the first upper loading stacker 301 is lowered to the first lower loading stacker 501 at once, and in the second lower unloading stacker 503 The second upper unloading stacker 303 raises the retest user tray R at a time.

Thereafter, as shown in FIG. 14(d), the user trays 10 are transferred one by one by transfer from the second upper unloading stacker 303 to the first upper loading stacker 301 again.

Eventually, if the device assigned to the retest grade exceeds the predetermined range, it is directly loaded into the user tray, and the retest grade device is loaded together in the stacker, and immediately after the inspection for one lot is completed, the device of the retest grade is You will be able to perform a retest.

As described above, the electronic component test handler according to the present invention loads the user tray according to the rating information for each unloading stacker, and the user tray can be transferred between the unloading stackers. It has the effect of being able to operate flexibly. In addition, if the judgment rate of a retest-grade device increases, it can be loaded directly into the user tray, stored in a stacker, and transferred directly to the loading site for retesting, so it has the effect of quickly processing retest-grade devices. have.

302: first upper unloading stacker
502: first lower unloading stacker
303: second upper unloading stacker
503: second lower unloading stacker
304: third upper unloading stacker
504: third lower unloading stacker
301: first top loading stacker
501: first lower loading stacker
321: first set plate
322: second set plate
323: third set plate
G1: first route
G2: second route
G3: third route
G4: Route 4
R: Retest user tray
LS: loading stacker
BS: Buffer Stacker
ULS: Unloading Stacker

Claims (10)

A stacker configured to accommodate a plurality of user trays and including a plurality of loading stacker modules and a plurality of unloading stacker modules;
A plurality of hands configured to pick up or place devices loaded in the user tray, the test tray, and the buffer tray on the base;
A test chamber configured to perform a test of the device in a state in which the test tray is accommodated to give a rating;
A set plate in which the user tray is configured to be seated and configured to be elevating so that the user tray can be exposed on a base; And
A control unit for giving the unloading stacker module rating information of a device to be loaded, and controlling the device classified into a plurality of grades as a result of the test to be loaded into the unloading stacker module according to each of the rating information. Includes,
The control unit,
Assigns rating information of devices loaded in a plurality of unloading stacker modules,
The electronic component test handler, characterized in that, during the test, switching rating information of the plurality of unloading stacker modules, and controlling to move a plurality of user trays loaded between the unloading stackers according to the rating information. The method of claim 1,
The control unit,
In the first mode, a device requiring retest is loaded from the test tray to the buffer tray,
In the second mode, the retest grade information is assigned to any one of the unloading stacker modules, and the device requiring the retest is controlled to be loaded in the unloading stacker module to which the retest grade information is assigned. Part test handler. The method of claim 2,
The control unit,
And controlling to switch between the first mode and the second mode according to a judgment rate of a device determined as a retest grade as a result of a test result of the plurality of devices. The method of claim 3,
The control unit,
And controlling to switch to the second mode when the first mode is preferentially selected and the determination rate exceeds a predetermined value. The method of claim 4,
The unloading stacker module is configured to include an upper unloading stacker and a lower unloading stacker, and the upper unloading stacker and the lower unloading stacker are configured to exchange user trays in a vertical direction. Electronic component test handler. The method of claim 5,
The control unit, in the first mode, assigns rating information excluding the retest rating to each of the upper unloading stackers, and loads the user tray into the upper unloading stacker according to the rating of the device. Part test handler. The method of claim 6,
The control unit,
In the second mode, a user tray loaded on any of the upper unloading stackers is moved to the lower unloading stacker,
Electronic component test handler, characterized in that to give retest grade information to the empty upper unloading stacker. The method of claim 7,
The control unit,
In the second mode, the hand is controlled to directly transfer the device determined as the retest grade from the test handler to a set plate located above the upper unloading stacker to which the retest grade information is assigned. Electronic component test handler. The method of claim 4,
The control unit in the second mode,
When the test is finished for the loaded device,
The device to which the retest grade information is assigned is loaded, and the user tray loaded in the upper unloading stacker is transferred to the loading stacker,
An electronic component test handler, characterized in that controlling to re-perform a test on a device to which the retest grade information has been assigned. The method of claim 5,
The upper unloading stacker is configured to be drawn out in a horizontal direction so that the user tray can be exchanged with the outside,
Wherein the lower unloading stacker includes a guide rod in an up-down direction to exchange the user tray in a vertical direction with the upper unloading stacker.

Images