KR102236103B1 - Electronic device test handler with test tray vision inspection - Google Patents

Abstract

In the present invention, an insert opening unit configured to open an insert of a test tray, a test tray loaded with a device from the insert opening unit is received, and An electronic component test handler including a vision inspection unit configured to photograph a test tray located in an inspection area on a path transferred to the buffer chamber may be provided.
The electronic component test handler according to the present invention has an effect of performing vision inspection while maximizing space efficiency.

Description

Electronic component test handler with test tray vision inspection function {ELECTRONIC DEVICE TEST HANDLER WITH TEST TRAY VISION INSPECTION}

The present invention relates to a test handler for an electronic component.

The electronic component test handler is a device that inspects a plurality of electronic components, for example, semiconductor devices, modules, and SSDs after being manufactured. The electronic component test handler is configured to connect electronic components to a test device and artificially create various environments to inspect whether the electronic components are operating normally, and to classify them into good, re-inspection, and defective products according to the inspection results.

The electronic component test handler performs logistics by exchanging a user tray loaded with a device to be tested or a device that has been tested with the outside, and logistics with the outside must be performed at an appropriate cycle so that the inspection can be continuously performed.

Korean Patent No. 1,734,397 (registered on May 02, 2017) is disclosed for such a test handler filed and registered by the present applicant.

However, such a conventional technology has a problem that is inefficient in operation through a separate path for vision inspection.

Korean Patent Registration No. 1,734,397 (2017. 05. 02. Registration)

An object of the present invention is to provide an electronic component test handler capable of efficient operation by maximizing space utilization during vision inspection for inspecting the state of a device loaded inside a test tray in the conventional electronic component test handler described above. have.

As a means of solving the above problems, an insert opening unit configured to open the insert of the test tray, a reverser configured to receive the test tray loaded with the device from the insert opening unit, and change the transport direction of the test tray. And an electronic component test handler including a vision inspection unit configured to photograph a test tray located in an inspection area on a path transferred from the inverter to the buffer chamber may be provided.

Meanwhile, the inverter may be disposed to be spaced apart from the buffer chamber by a predetermined distance so that the test tray may be exposed in a space between the buffer chamber.

In addition, the vision inspection unit may include an optical path switching unit configured to switch an optical path from the inspection area, and a vision camera configured to photograph the inspection area through the optical path switching unit.

Here, the predetermined distance may be configured to be smaller than the length of the test tray so that the inspection area may become a partial area on the test tray.

In addition, the vision inspection unit may take a plurality of photographs when one test tray is transferred so that all inserts passing through the inspection area can be photographed as the test tray is moved.

Meanwhile, the optical path switching unit may be configured to convert the optical path to 90 degrees.

On the other hand, the vision camera is disposed so as to photograph an upward direction, and the optical path switching unit is provided on the upper side of the vision camera, and may be formed to be spaced apart from the inspection area by a predetermined distance in the horizontal direction.

Furthermore, the vision inspection unit may be composed of a plurality, and each may be configured to photograph a part of the inspection area.

On the other hand, the inverter includes a test tray transfer unit configured to transfer the test tray loaded in the inverter to the buffer chamber, and the test tray transfer unit includes a position sensor configured to measure a relative position on the inverter. , It may further include a control unit configured to receive a position value of the test tray from the position sensor and a photographing signal from the vision camera.

Also. The control unit can operate the vision camera when the test tray transfer unit is operated after the direction of the inverter is switched to the upright position.

Meanwhile, the control unit may stop the operation of the vision camera when the test tray passes through the inspection area.

Meanwhile, the buffer chamber and the insert opening unit are disposed to be spaced apart from each other by a predetermined distance in the horizontal direction, and the vision camera and the optical path switching unit may be provided on the insert opening unit side.

Meanwhile, the vision inspection unit may further include an illumination unit configured to irradiate light to the inspection area side.

In addition, the vision inspection unit may be configured to photograph a test tray ID formed on the test tray and a loading groove in which the device is loaded.

The electronic component test handler according to the present invention has an effect of performing vision inspection while maximizing space efficiency.

1 is a conceptual diagram of an electronic component test handler according to the present invention divided into spaces according to functions.
FIG. 2 is a conceptual diagram of the test handler body of FIG. 1 divided according to functions on a plane.
3 is a conceptual diagram showing movement of a device and a test tray in a test handler body.
4 is a partial perspective view of a stacker of the electronic component test handler 1 according to the present invention.
5 is an enlarged perspective view of a portion adjacent to the inverter.
6 is a view between the insert opening unit and the vision inspection unit.
7 is an enlarged perspective view of a vision inspection unit.
8 is a conceptual diagram showing the operating concept of the vision inspection unit.
9 is an enlarged perspective view showing an enlarged inspection area.
10 is a perspective view of another embodiment according to the present invention.

Hereinafter, a stacker of an electronic component test handler and an electronic component test handler including the same according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. In addition, in the description of the following embodiments, the names of each component may be referred to as different names in the art. However, if they have functional similarities and identity, even if a modified embodiment is employed, it can be viewed as a uniform configuration. In addition, symbols added to each component are described for convenience of description. However, the content illustrated on the drawings in which these symbols are indicated does not limit each component to the range within the drawings. Likewise, even if an embodiment in which the configuration in the drawings is partially modified is employed, it can be viewed as an equivalent configuration if there is functional similarity and identity. In addition, in view of the level of a general technician in the relevant technical field, if it is recognized as a component that should be included of course, a description thereof will be omitted.

Hereinafter, a device will be described on the premise that it refers to a device that electrically functions, such as a semiconductor device, a semiconductor module, and an SSD. In addition, hereinafter, the user tray refers to a tray in which a plurality of loading grooves configured to load semiconductor elements are arranged in a certain arrangement, and the loading groove of the user tray is configured so that the device is fixed inside the groove by gravity without a separate fixing function. Explain on the premise that it can be.

Hereinafter, the overall configuration of the test handler according to the present invention will be described with reference to FIGS. 1 to 3.

1 is a perspective view of a test handler according to the present invention.

As shown in FIG. 1, the test handler 1 according to the present invention is configured to carry in the device 20 from the outside, perform a test, and selectively take it out according to the grade.

The test handler 1 moves the stacker and device 20 for carrying in or out of the user tray 10 from the outside according to spatially functional functions, and carries out a test, and then performs a test by grade. It may be classified into a test handler body 100, which is an area that is classified and loaded into the user tray 10.

The stacker 2 refers to an area in which the user tray 10 can be loaded in a large amount. The stacker may be classified into a loading stacker, an unloading stacker, and an empty stacker according to the loaded device 20.

The loading stacker is configured to load the user tray 10 in which the devices 20 that need to be tested and sorted are loaded. The loading stacker is configured to have a size in which a plurality of user trays 10 carried from the outside can be stacked in units of 1 lot. The unloading stacker is configured to load a plurality of user trays 10 loaded with a device 20 for carrying out to the outside among the devices 20 that have been tested and sorted before being taken out in units of one lot. The empty stacker is configured so that a plurality of empty user trays 10 can be loaded, and the empty user tray 10 is transferred from the loading stacker after the transfer of the device 20 is completed, or the empty user tray 10 is transferred to the unloading stacker. It may be configured to be able to transport the user tray 10.

On the other hand, the loading stacker, the unloading stacker, and the empty stacker may be classified according to logistics to the outside, logistics and loading purpose inside the test handler 1, but their configurations may be the same or similar to each other.

Each stacker module 500 may be configured to stack and stack a plurality of user trays 10 in a vertical direction for efficient use of space. In addition, each of the stacker modules 500 is configured to be opened and closed by moving horizontally in the y direction of FIG. 1, and distribution with the outside is performed at a position carried out to the outside. As an example, a plurality of user trays 10 may be transferred to a loading stacker from an automatic guided vehicle (AGV), or an unmanned vehicle may collect a plurality of user trays 10 from the unloading stacker.

In addition, the stacker 2 may be configured such that each of the loading stacker, the unloading stacker, and the empty stacker may be set in plural, and internal logistics can be continuously performed even while any one is logistics with the outside.

Hereinafter, the configuration and operation of the test handler body 100 will be schematically described with reference to FIGS. 2 and 3.

FIG. 2 is a conceptual diagram showing the test handler body 100 of FIG. 1 divided according to functions on a plane, and FIG. 3 is a conceptual diagram showing movement of the device 20 and the test tray 130 in the test handler body 100 .

The test handler body 100 tests a plurality of devices 20, classifies the devices 20 after the test, and transfers and loads the devices 20 before and after the test. The test handler body 100 may be functionally classified, including a loading site (L), a test site (T), and an unloading site (UL).

The loading site L is configured to pick up a plurality of devices 20 from the user tray 10 and place them on the test tray 130. The loading site L may be provided with a hand 110 for transferring the device 20 from the user tray 10 to the test tray 130, a loading shuttle 120, and a scanner (not shown) for inspection. .

The user trays 10 loaded in the loading stacker may be alternately supplied to the pickup position one by one, and the hand 110, which will be described later, removes only the plurality of devices 20 from the user tray 10 and transfers them. When all the devices 20 that were loaded are transferred, the empty user tray 10 and the user tray 10 in which the devices are loaded are replaced and positioned so that the device 20 can be continuously supplied. On the other hand, in the pickup position, a plurality of user trays 10 are provided so that the device 20 can be continuously supplied even when all the user trays 10 loaded in any one stacker module 500 are consumed or a failure occurs. It can be exposed. In this case, when the device 20 is being transferred from any one user tray 10, the other user tray 10 may be configured to wait in a standby state or be replaced with a new user tray 10.

The hand 110 is configured to pick up and transfer the plurality of devices 20 and then load them onto the test tray 130 or the loading shuttle 120. The hand 110 may be configured in plural and configured to take charge of logistics for each transport section. The hand 110 may be installed on a rail that can move in the horizontal direction on the upper side, and is configured so that the attachment can be viewed toward the lower side, and a linear actuator (not shown) is provided so that the length can be adjusted in the vertical direction. I can. As an example, the attachment may be configured to be provided with a plurality of vacuum ports to vacuum-adsorb the plurality of devices 20. In addition, the attachment may be configured to be replaceable in consideration of the type, size, and shape of the device 20.

On the other hand, the test tray 130 is provided with an insert for each loading groove in consideration of thermal deformation when the device 20 is fixed and the test is performed, and the spacing between the loading grooves may be different from that of the user tray 10. In general, the spacing between the loading grooves of the test tray 130 is configured to be larger than that of the user tray 10. Therefore, after picking up the plurality of devices 20 from the user tray 10 at the pickup position by using the hand 110, the space between the devices 20 is widened and then loaded onto the test tray 130. Specifically, two interval adjustments may be performed to increase the interval in two directions of xy, and for this purpose, a loading shuttle 120 is provided between the pickup position and the test tray 130, and a loading shuttle from the user tray 10 The distance in one direction can be adjusted while being transferred to 120, and the distance in the other direction can be adjusted while transferring from the loading shuttle 120 to the test tray 130.

The loading shuttle 120 is provided between the user tray 10 and the test tray 130, and the space between the loading grooves is the user tray 10 so that a plurality of devices 20 can be loaded in a state in which they are primarily aligned. It can be configured in an array that is widened in one direction. In addition, the loading shuttle 120 may be positioned in consideration of the locations of the user tray 10, the test tray 130, and the hand 110 for efficient logistics.

A scanner (not shown) is provided to identify if there is a barcode on the device 20 to be transferred. The scanner (not shown) may be configured to recognize a barcode on a path through which the hand 110 picks up and transfers the device 20. The scanner may be provided in various positions to facilitate the recognition of barcodes according to the shape, size, and type of the device 20.

In the place position, an empty test tray 130 is supplied, and the device 20 is transferred and stacked. When the loading of the device 20 is completed at the place position, the test tray 130 is transferred to the test site T afterwards, and a new empty test tray 130 is supplied.

On the other hand, an insert opening unit is provided in the place position. The insert opening unit may be provided with a mask and a preciser configured to selectively open an insert provided in the test tray. The test tray 130 is provided with an insert for each loading groove, and each insert is provided with a locking portion capable of preventing the device 20 from being separated. The basic position of each of the locking portions is set to a position to prevent separation of the device 20, and the locking portion is pressed by the mask to be switched to the open position.

The loading of the device 20 in the test tray 130 is performed by expanding the engaging portion of the insert with a mask while pressing the insert with a presizer, and the hand 110 transferring the device 20 to the loading groove.

The mask is configured in a shape corresponding to the test tray 130, and a plurality of protrusions 312 are provided to expand the locking portions of each insert when in close contact with the test tray 130.

As described above, the presizer is configured to temporarily fix the insert provided in the test tray 130 in a somewhat spaced state. The presizer is provided with a plurality of pressing pins corresponding to the position of each insert, and the presizer is in close contact with the test tray 130 to press the insert to temporarily fix it with the test tray 130. Therefore, it is possible to minimize the position error when the device 20 is seated on the insert.

However, although not shown, an elevating unit for independently elevating the mask and the presizer may be additionally provided.

The test site T is configured to perform a test on the plurality of devices 20 loaded on the test tray 130 in units of the test tray 130 and transmit the test results. In the test chamber 160, for example, a thermal load test may be performed in which the device 20 is changed to a temperature of -40°C to 130°C to check the function.

A test chamber 160 and a buffer chamber 150 provided before and after the test chamber 160 may be provided at the test site T. The buffer chamber 150 may be configured to be loaded with a plurality of test trays 130, and may be configured to perform preheating or post heat treatment before and after the heat load test is performed.

In the test site T, the test tray 130 may be configured to be transported and tested while the test tray 130 is upright, so that the overall size of the equipment may be reduced. Meanwhile, although the configuration is not shown in detail, an inverter 140 may be provided before and after the buffer chamber 150 to change the posture of the test tray 130 to an upright state.

The unloading site UL is configured to sort, transport, and load the device 20 according to the test result from the test tray 130 transferred from the test site T. The unloading site UL may be provided with elements similar to the configuration of the loading site L, and may be performed in an order opposite to the transfer of the device 20 at the loading site L. However, in the unloading site (UL), a plurality of sorting shuttles 170 may be provided to temporarily collect from the test tray 130 according to grades. In order to improve the efficiency of distribution, when a predetermined number of devices 20 of the same grade are loaded in the sorting shuttle 170, a plurality of devices may be simultaneously picked up and transferred to the user tray 10.

On the other hand, although not shown, the empty test tray 130 that has finished transferring the device 20 from the unloading site UL may be circulated while being transferred to the loading site L side.

Further, although not shown, a control unit for controlling driving of the above-described components may be separately provided.

Hereinafter, a stacker according to the present invention will be described in detail with reference to FIG. 4.

4 is a partial perspective view of a stacker of the electronic component test handler 1 according to the present invention.

As shown, the stacker according to the present invention may be configured to continuously supply or retrieve the device 20 from the lower side of the base 101 of the test handler body 100. The stacker may include a stacker module 500.

The stacker module 500 may be configured in plural, each independently opened and closed to exchange the user tray 10 with the outside. The stacker module 500 may be configured to be opened while moving in a horizontal direction. The stacker module 500 may include a frame 200, a loading part 510, a slider 530, a linear actuator 550, a guide 610, a sensor part 620, and a door 540. .

The frame 200 may be configured to constitute an overall skeleton.

The loading unit 510 refers to a space in which a plurality of user trays 10 can be stacked and loaded. The loading unit 510 may be loaded with an external user tray 10 transfer means, for example, 1 lot, which is a unit that is exchanged with a robot at a time. However, since the number of user trays 10 constituting one lot may vary according to the type of device 20, a detailed example will be omitted. Meanwhile, the space of the loading part 510 may be formed corresponding to the shape and size of the user tray 10.

The slider 530 may be provided under the stacker module 500 and may be configured such that the stacker module 500 is slid to move relative to the frame 200. The slider 530 may be configured to stably support the stacker module 500 by being configured in plural, and may also constrain the stacker module 500 to be moved to a predetermined reciprocating position.

The linear actuator 550 is configured to move the stacker module 500 in the horizontal direction. One side of the linear actuator 550 may be connected to the frame 200 and the other side may be connected to one side of the stacker module 500 to open and close the stacker module 500 according to an input. However, in the present embodiment, the linear actuator 550 has been described as an example, but may be modified and applied in various configurations for reciprocating movement of the stacker module 500.

The guide 610 is configured to prevent the user tray 10 from being separated from the loading unit 510 in a state in which the plurality of user trays 10 are stacked. The guide 610 is formed to extend in a vertical direction at a plurality of points along the periphery of the loading part 510. For example, two guides 610 adjacent to each corner of the user tray 10 may be provided, and a total of eight guides 610 may be provided.

The sensor unit 620 may be configured to determine the presence or absence of the user tray 10 in the loading unit 510 and whether loading is complete. The sensor unit 620 may be configured to determine the presence or absence of the user tray 10 positioned at the uppermost side and the lowermost side when the user tray 10 is loaded on the loading unit 510. When the uppermost sensor detects that the user tray 10 is present, it is determined that the loading of the user tray 10 in the loading unit 510 is completed, and subsequent operations may be controlled. On the other hand, when sensing that the user tray 10 is absent from the lowermost sensor, it is determined that the loading unit 510 is empty, and an operation thereafter may be controlled. On the other hand, in the case of loading from the outside in a unit of 1 lot, when the user tray 10 is measured by the sensor at the bottom, it can be determined that the user tray 10 is full in the loading unit 510, and conversely, the user tray ( If 10) is not measured, it can be determined that the loading portion 510 is exhausted and empty. Meanwhile, the above-described sensor unit 620 may be applied in various configurations capable of determining the presence or absence of the user tray 10 at a separated point such as a laser sensor, an infrared sensor, or an ultrasonic sensor.

The door 540 is configured to shield the outside when the stacker module 500 is moved to the inside of the stacker and is inserted into the stacker.

The transfer 410 is configured to grip and transport the user tray 10 inside the stacker 300. The transfer 410 is composed of a plurality, and may be configured to include one or more transfers 410 involved in loading and one or more transfers 410 involved in unloading, respectively. The transfer 410 may be provided with a plurality of actuators (not shown) to enable horizontal movement and vertical movement. The transfer 410 may be controlled so that the transfer of the user tray 10 is performed between any one of the loading units 510 and any one of the set plate 320. In addition, it may be controlled so that the distribution of the user tray 10 is performed between the loading units 510. The transfer 410 may be controlled to withdraw the user trays 10 one by one from the upper side of the loading unit 510, or to stack them one by one to the lower side.

The set plate 320 is configured to expose the transferred user tray 10 to the test handler body 100. The set plate 320 is configured to be raised and lowered while the user tray 10 is loaded, and when it is raised, the hand 110 of the test handler body 100 is moved to a position where the device 20 can be picked up. When descending, the transfer unit 410 may be moved to a position where the user tray 10 can be replaced. The set plate 320 may be provided in plural at the loading site L and the unloading site UL.

Hereinafter, a vision inspection unit according to the present invention will be described in detail with reference to FIGS. 5 to 10.

5 is an enlarged perspective view of a portion adjacent to the inverter 140, FIG. 6 is a view between the insert opening unit 180 and the vision inspection unit 700, and FIG. 7 is an enlarged perspective view of the vision inspection unit 700 .

As shown, the vision inspection unit 700 is configured to inspect the appearance of the test tray 130 transferred to the buffer chamber 150. The vision inspection unit 700 is configured to acquire information on at least one of a loading state of the device 20 loaded on the test tray 130, a state of an insert, an appearance of the device itself, and a test tray ID. When it is determined that there is an abnormality according to the inspection result of the vision inspection unit 700, the data of the corresponding location may be deleted or controlled to perform reloading and retesting. Specifically, the vision inspection unit 700 is configured to perform inspection by acquiring an image between the spaces between devices among the transfer paths of the test tray 130 even if a separate space for inspection of the test tray 130 is not provided.

The inspection area P, which is an object of image acquisition, becomes a space between the lower end of the inverter 140 and the buffer chamber 150 provided under the inverter 140 in the state in which the inverter 140 is erected. . The inverter 140 is designed to avoid interference by being spaced apart from the buffer chamber 150 provided at the lower side for the entire operation by a predetermined distance. Referring back to FIG. 5, the inverter 140 may be operated for efficient inversion of the test tray 130 and transport to the buffer chamber 150. For example, when the inverter 140 is erected, the inverter frame 141 is exposed toward the insert opening unit 180, and the test tray 130 is exposed by the inverter frame 141 exposed when photographing by the vision inspection unit 700. ), the field of view of some areas may be blocked. Accordingly, the vision inspection unit 700 sets a portion between the inverter 140 and the buffer chamber 150 where interference by the inverter 140 does not occur as an inspection area P and photographs.

Meanwhile, according to the present invention, the distance between the inverter 140 and the buffer chamber 150 may be configured to be shorter than the length of the test tray 130 so as not to be separated for photographing and to have a compact space as a whole. In other words, there is no need to intentionally form a lot of space for shooting.

The vision inspection unit 700 continuously photographs the inspection area P, and repeatedly photographs the test tray 130 when the test tray 130 moves from the inversion unit to the buffer chamber 150 to photograph the entire test tray 130. At this time, since the photographing region is formed on the transfer path of the test tray 130, the test tray 130 is configured to simultaneously photograph one or more rows disposed in the horizontal direction below the test region P.

The vision inspection unit 700 may include an optical path conversion unit 710, a vision camera 720, a vision inspection unit frame 740, and an illumination unit 730.

The optical path switching unit 710 is configured to switch a part of the optical path from the inspection area P to the vision camera 720 to be described later. An optical path may be formed in a horizontal direction from the inspection area P to the optical path switching unit 710, and may be configured to pass through the optical path switching unit 710 to switch the optical path in a vertical direction. For example, the optical path switching unit 710 may be a reflector inclined 45 degrees from the horizontal direction. In addition, the optical path switching unit 710 may be provided vertically above the vision camera 720.

The vision camera 720 is configured to acquire an image of the inspection area P. Here, image refers to visual information including video. The vision camera 720 converts visual information measured within the viewing angle including the inspection area P into an electrical signal and transmits it. Since the optical path of the vision camera 720 is formed through the optical path switching unit 710, a wider range of images can be obtained than when the inspection area P is directly photographed.

The vision camera 720 and the optical path switching unit 710 may correspond to each other in a 1:1 manner and may be configured as a plurality of pairs. As an example, in the present invention, there is shown an example configured and provided in three pairs. Each vision camera 720 may be configured to photograph an assigned inspection area P by dividing one row into three. When photographing one test tray 130, the vision camera 720 may photograph a plurality of times by performing photographing whenever each row passes through the inspection area P. However, when the predetermined distance between the inverter 140 and the buffer chamber 150 is formed somewhat larger, each vision camera 720 may be configured to simultaneously photograph a plurality of rows, for example, two or three columns. .

The vision inspection unit frame 740 functions as a structure in which the vision camera 720, the light path switching unit 710, and the lighting unit 730 can be installed. Since the inverter 140 rotates based on the center portion in the state where the test tray 130 is loaded, a test for the optimized operation of the inverter 140 between the insert opening unit 180 and the inspection area P A separation distance of about half of the tray 130 occurs. One side of the vision inspection unit frame 740 may be connected to the insert opening unit 180 so that the vision inspection unit frame 740 can perform vision inspection using a spaced apart space.

The vision inspection unit frame 740 may include a first vision inspection unit frame 741 and a second vision inspection unit frame 742. The first vision inspection unit frame 741 is disposed on the upper side, and is formed to extend in the longitudinal direction so that the light path switching unit 710 and the lighting unit 730 can be installed. The first vision inspection unit frame 741 may be formed to extend downward from three points so that the vision camera 720 may be installed. In the extended portion, the vision camera 720 is disposed toward the optical path switching unit 710 provided on the upper side, respectively. One side of the second vision inspection unit frame 742 is connected to the insert opening unit 180, and may be formed to extend a predetermined distance toward the inspection area P and then extend in the width direction. In addition, a lighting unit 730 may be provided at a portion extending in the width direction. Accordingly, the plurality of illumination units 730 may irradiate the irradiation light to the inspection area P together. As the irradiation light, light of various wavelengths may be used, and a wavelength in which an image is easily acquired by the vision camera 720 may be selected. However, the configuration of the vision inspection unit frame 740 is only an example, and may be modified and applied to various configurations in which the light path switching unit 710, the vision camera 720, and the lighting unit 730 may be installed.

8 is a conceptual diagram showing the operating concept of the vision inspection unit 700. As shown, the vision camera 720 is configured to recognize light reaching the lens from the inspection area P through the optical path switching unit 710. In addition, as described above, the inspection area P is composed of an area smaller than the area of the test tray 130, and is determined to be able to photograph one row, and a plurality of photographing is performed for the inspection of one test tray 130. Can be done.

9 is an enlarged perspective view showing an enlarged inspection area P. As illustrated, in the left and right direction of the inspection area P, a part to be photographed may be partially overlapped near the boundary of the acquired image between the vision cameras 720 so as to prevent a blank region from being generated in the image to be photographed. Each of the vision cameras 720 may be configured to be operated in conjunction with each other, and as the test tray 130 moves, it is configured to simultaneously photograph any one row of the same.

Meanwhile, although not shown, a control unit for controlling the operation of the inverter 140 and the operation of the vision inspection unit 700 may be provided.

The control unit may be configured to operate the vision camera 720 according to the position of the test tray 130. Meanwhile, a test tray transfer unit 142 for transferring the test tray 130 may be provided in the inverter 140, and a position sensor may be provided in the test tray transfer unit 142. Therefore, the control unit may control to perform photographing by operating the vision camera 720 whenever it passes a predetermined position by the position sensor. On the other hand, if the position sensor is not provided separately from this, the time at which one insert is placed in the inspection area P according to the speed at which the test tray 130 moves from the inverter 140 to the buffer chamber 150 may be calculated. I can. The controller may control the vision camera 720 to repeatedly operate according to a time interval at which the insert is positioned in the inspection area P. However, this example is only an example, and may be modified and applied in various interlocking methods for photographing all rows of the test tray 130.

Meanwhile, when the test tray 130 passes through the inspection area P and is completely transferred to the buffer chamber 150, the control unit may control to temporarily stop the vision inspection. At this time, the inverter 140 rotates 90 degrees and is disposed in the horizontal direction, and the test tray 130 is transferred in the horizontal direction from the insert opening unit 180 and rotates 90 degrees in the reverse direction to change the direction in the vertical direction. This is done. Therefore, the operation of the vision inspection unit 700 may be stopped in order to prevent power waste at this time. Meanwhile, the control unit may control the vision inspection unit 700 to be re-operated when the inverter 140 is rebuilt with the test tray 130 loaded thereon.

10 is a perspective view of another embodiment according to the present invention. In this embodiment, the same components as those of the above-described embodiment may be included, and descriptions of the same components will be omitted to avoid redundant descriptions, and only differences in components will be described.

As shown, in this embodiment, the arrangement of the optical path switching unit 710 and the arrangement of the vision camera 720 are configured differently from those of the above-described embodiment. In this embodiment, the vision camera 720 may be disposed at the same height as the optical path switching unit 710. In addition, the optical path switching unit 710 may be arranged to change the optical path to 90 degrees in the lateral direction. When configured in this way, the space in which the vision inspection unit 700 is to be provided can be further reduced, so that space utilization can be maximized.

1: test handler 2: stacker
10: user tray 20: device
100: test handler body 101: base
110: hand
120: loading shuttle 130: test tray
140: inverter
150: buffer chamber 160: test chamber
170: sorting shuttle
180: insert opening unit
L: loading site T: test site
UL: Unloading site
200: frame
320: set plate 410: transfer
500: stacker module
510: loading part
530: slider 540: door
610: guide 620: sensor unit
700: vision inspection unit
710: light path switching unit
720: vision camera
730: lighting unit
740: vision inspection unit frame
P: Inspection area

Claims (14)

An insert opening unit configured to open an insert of the test tray;
An inverter configured to receive a test tray loaded with a plurality of devices from the insert opening unit in a horizontal direction, and to switch a transfer direction of the test tray to a vertical direction; And
An electronic component test handler comprising a vision inspection unit configured to photograph a part of a test tray located in an inspection area on a path transferred from the inverter to the buffer chamber in a vertical direction. The method of claim 1,
And the inverter is disposed to be spaced apart from the buffer chamber by a predetermined distance so that the test tray can be exposed in a space between the buffer chamber. The method of claim 2,
The vision inspection unit,
An optical path switching unit configured to switch an optical path from the inspection area; And
And a vision camera configured to photograph the inspection area through the optical path switching unit. The method of claim 3,
The electronic component test handler, wherein the predetermined distance is configured to be smaller than a length of the test tray so that the inspection area becomes a partial area on the test tray. The method of claim 4,
The vision inspection unit,
An electronic component test handler, characterized in that a plurality of photographs are taken when one test tray is transferred so that all inserts passing through the inspection area can be photographed as the test tray is moved. The method of claim 3,
The optical path switching unit,
Electronic component test handler, characterized in that configured to be able to switch the optical path 90 degrees. The method of claim 6,
The vision camera is arranged to photograph the upward direction,
The optical path switching unit,
It is provided on the upper side of the vision camera,
Electronic component test handler, characterized in that formed to be spaced apart a predetermined distance in the horizontal direction from the inspection area. The method of claim 7,
The vision inspection unit is composed of a plurality,
Each electronic component test handler, characterized in that configured to photograph a portion of the inspection area. The method of claim 3,
The inverter,
And a test tray transfer unit configured to transfer the test tray loaded in the inverter to the buffer chamber,
The test tray transfer unit includes a position sensor configured to measure a relative position on the inverter,
An electronic component test handler further comprising a control unit configured to receive a position value of the test tray from the position sensor and a photographing signal from the vision camera. The method of claim 9,
The control unit,
The electronic component test handler, wherein the vision camera is operated when the test tray transfer unit is operated after the direction of the inverter is changed to an upright position. The method of claim 10,
The control unit,
When the test tray passes through the inspection area, the operation of the vision camera is stopped. The method of claim 3,
The buffer chamber and the insert opening unit are disposed to be spaced apart a predetermined distance in a horizontal direction,
The vision camera and the optical path switching unit, characterized in that provided in the insert opening unit side of the electronic component test handler. The method of claim 3,
The vision inspection unit,
Electronic component test handler, characterized in that it further comprises a lighting unit configured to irradiate light to the inspection area side. The method of claim 3,
The vision inspection unit,
Electronic component test handler, characterized in that configured to photograph a tray ID formed on the test tray and a loading groove in which the device is loaded.

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