KR20140047564A - 디스크 형상 아티클의 액체 처리를 위한 장치 및 그러한 장치에서 사용하기 위한 가열 시스템 - Google Patents
디스크 형상 아티클의 액체 처리를 위한 장치 및 그러한 장치에서 사용하기 위한 가열 시스템 Download PDFInfo
- Publication number
- KR20140047564A KR20140047564A KR1020130122274A KR20130122274A KR20140047564A KR 20140047564 A KR20140047564 A KR 20140047564A KR 1020130122274 A KR1020130122274 A KR 1020130122274A KR 20130122274 A KR20130122274 A KR 20130122274A KR 20140047564 A KR20140047564 A KR 20140047564A
- Authority
- KR
- South Korea
- Prior art keywords
- shaped
- arc
- heating elements
- emitter
- infrared
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0436—Apparatus for thermal treatment mainly by radiation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/0033—Heating devices using lamps
- H05B3/0038—Heating devices using lamps for industrial applications
- H05B3/0047—Heating devices using lamps for industrial applications for semiconductor manufacture
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0414—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7608—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7618—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating carrousel
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7624—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Weting (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Resistance Heating (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/650,916 | 2012-10-12 | ||
| US13/650,916 US9093482B2 (en) | 2012-10-12 | 2012-10-12 | Method and apparatus for liquid treatment of wafer shaped articles |
| US13/932,926 US9748120B2 (en) | 2013-07-01 | 2013-07-01 | Apparatus for liquid treatment of disc-shaped articles and heating system for use in such apparatus |
| US13/932,926 | 2013-07-01 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020210051917A Division KR20210049738A (ko) | 2012-10-12 | 2021-04-21 | 디스크 형상 아티클의 액체 처리를 위한 장치 및 그러한 장치에서 사용하기 위한 가열 시스템 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20140047564A true KR20140047564A (ko) | 2014-04-22 |
Family
ID=50654094
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020130122274A Ceased KR20140047564A (ko) | 2012-10-12 | 2013-10-14 | 디스크 형상 아티클의 액체 처리를 위한 장치 및 그러한 장치에서 사용하기 위한 가열 시스템 |
| KR1020210051917A Ceased KR20210049738A (ko) | 2012-10-12 | 2021-04-21 | 디스크 형상 아티클의 액체 처리를 위한 장치 및 그러한 장치에서 사용하기 위한 가열 시스템 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020210051917A Ceased KR20210049738A (ko) | 2012-10-12 | 2021-04-21 | 디스크 형상 아티클의 액체 처리를 위한 장치 및 그러한 장치에서 사용하기 위한 가열 시스템 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP6351948B2 (https=) |
| KR (2) | KR20140047564A (https=) |
| TW (1) | TWI602253B (https=) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20160008065A (ko) * | 2014-07-11 | 2016-01-21 | 세메스 주식회사 | 기판 처리 장치 |
| CN114730725A (zh) * | 2019-11-25 | 2022-07-08 | 索泰克公司 | 接合两个基板的方法 |
| US11765793B2 (en) | 2019-07-18 | 2023-09-19 | Semes Co., Ltd. | Substrate treating apparatus |
| US11798822B2 (en) | 2019-10-02 | 2023-10-24 | Semes Co., Ltd. | Support unit, substrate treating apparatus including the same, and substrate treating method |
| US11961748B2 (en) | 2020-07-24 | 2024-04-16 | Semes Co., Ltd. | Support unit and substrate treating apparatus including the same |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102069078B1 (ko) * | 2014-08-27 | 2020-01-23 | 주식회사 제우스 | 기판 처리장치 |
| JP6343100B2 (ja) * | 2014-10-10 | 2018-06-13 | ゼウス カンパニー リミテッド | 基板処理用ヒーター装置及びこれを備えた基板液処理装置 |
| KR102082151B1 (ko) * | 2014-10-10 | 2020-02-27 | 주식회사 제우스 | 기판 처리용 히터장치 및 이를 구비한 기판 액처리 장치 |
| KR102123563B1 (ko) * | 2014-10-20 | 2020-06-16 | 주식회사 제우스 | 기판지지장치 및 이를 구비한 기판 액처리 장치 |
| JP6658195B2 (ja) * | 2016-03-28 | 2020-03-04 | 大日本印刷株式会社 | エッチング方法およびエッチング装置 |
| JP6837481B2 (ja) * | 2016-05-26 | 2021-03-03 | 三益半導体工業株式会社 | 回転テーブル用ウェーハ加熱保持機構及び方法並びにウェーハ回転保持装置 |
| US10720343B2 (en) * | 2016-05-31 | 2020-07-21 | Lam Research Ag | Method and apparatus for processing wafer-shaped articles |
| US11500298B2 (en) * | 2018-12-21 | 2022-11-15 | Asml Holding N.V. | Reticle sub-field thermal control |
| CN111403316A (zh) * | 2020-03-18 | 2020-07-10 | 沈阳拓荆科技有限公司 | 一种提高硅片温度均匀性的加热系统 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000164555A (ja) * | 1998-11-30 | 2000-06-16 | Ebara Corp | 基板乾燥装置及び方法 |
| JP3659863B2 (ja) * | 2000-04-06 | 2005-06-15 | 大日本スクリーン製造株式会社 | 熱処理装置 |
| TW563196B (en) * | 2000-10-30 | 2003-11-21 | Dainippon Screen Mfg | Substrate processing apparatus |
| JP2005032933A (ja) * | 2003-07-10 | 2005-02-03 | Hitachi Kokusai Electric Inc | 基板処理装置 |
| JP4428717B2 (ja) * | 2006-11-14 | 2010-03-10 | 東京エレクトロン株式会社 | 基板処理方法及び基板処理システム |
| JP4548735B2 (ja) * | 2006-11-14 | 2010-09-22 | 東京エレクトロン株式会社 | 基板処理システム |
-
2013
- 2013-10-11 JP JP2013213420A patent/JP6351948B2/ja active Active
- 2013-10-11 TW TW102136810A patent/TWI602253B/zh active
- 2013-10-14 KR KR1020130122274A patent/KR20140047564A/ko not_active Ceased
-
2021
- 2021-04-21 KR KR1020210051917A patent/KR20210049738A/ko not_active Ceased
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20160008065A (ko) * | 2014-07-11 | 2016-01-21 | 세메스 주식회사 | 기판 처리 장치 |
| US10490427B2 (en) | 2014-07-11 | 2019-11-26 | Semes Co., Ltd. | Apparatus for treating substrate |
| US11765793B2 (en) | 2019-07-18 | 2023-09-19 | Semes Co., Ltd. | Substrate treating apparatus |
| US11798822B2 (en) | 2019-10-02 | 2023-10-24 | Semes Co., Ltd. | Support unit, substrate treating apparatus including the same, and substrate treating method |
| CN114730725A (zh) * | 2019-11-25 | 2022-07-08 | 索泰克公司 | 接合两个基板的方法 |
| US11961748B2 (en) | 2020-07-24 | 2024-04-16 | Semes Co., Ltd. | Support unit and substrate treating apparatus including the same |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI602253B (zh) | 2017-10-11 |
| JP2014090168A (ja) | 2014-05-15 |
| KR20210049738A (ko) | 2021-05-06 |
| JP6351948B2 (ja) | 2018-07-04 |
| TW201434101A (zh) | 2014-09-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR20140047564A (ko) | 디스크 형상 아티클의 액체 처리를 위한 장치 및 그러한 장치에서 사용하기 위한 가열 시스템 | |
| US9685358B2 (en) | Apparatus for liquid treatment of wafer shaped articles and heating system for use in such apparatus | |
| US9748120B2 (en) | Apparatus for liquid treatment of disc-shaped articles and heating system for use in such apparatus | |
| TWI625818B (zh) | 晶圓形物件之液體處理方法與設備 | |
| CN107452654B (zh) | 用于处理晶片状物品的方法和装置 | |
| US9093482B2 (en) | Method and apparatus for liquid treatment of wafer shaped articles | |
| KR102096672B1 (ko) | 웨이퍼 형상 물품의 액체 처리를 위한 방법 및 장치 | |
| TWI460807B (zh) | 晶圓狀物件之液體處理方法與設備 | |
| TWI771326B (zh) | 具有邊緣環的旋轉卡盤 | |
| US10312117B2 (en) | Apparatus and radiant heating plate for processing wafer-shaped articles | |
| KR102229786B1 (ko) | 기판 처리 장치 및 기판 처리 방법 | |
| TWI892345B (zh) | 安裝有發熱部的基板處理裝置 | |
| KR20200006801A (ko) | 기판처리장치 | |
| KR20160042688A (ko) | 기판 처리용 히터장치 및 이를 구비한 기판 액처리 장치 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| AMND | Amendment | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| A201 | Request for examination | ||
| AMND | Amendment | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| A302 | Request for accelerated examination | ||
| AMND | Amendment | ||
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0302 | Request for accelerated examination |
St.27 status event code: A-1-2-D10-D17-exm-PA0302 St.27 status event code: A-1-2-D10-D16-exm-PA0302 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| D13-X000 | Search requested |
St.27 status event code: A-1-2-D10-D13-srh-X000 |
|
| D14-X000 | Search report completed |
St.27 status event code: A-1-2-D10-D14-srh-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| R15-X000 | Change to inventor requested |
St.27 status event code: A-3-3-R10-R15-oth-X000 |
|
| R16-X000 | Change to inventor recorded |
St.27 status event code: A-3-3-R10-R16-oth-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| AMND | Amendment | ||
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E14-X000 | Pre-grant third party observation filed |
St.27 status event code: A-2-3-E10-E14-opp-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| AMND | Amendment | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
|
| X091 | Application refused [patent] | ||
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T13-X000 | Administrative time limit extension granted |
St.27 status event code: U-3-3-T10-T13-oth-X000 |
|
| AMND | Amendment | ||
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PX0901 | Re-examination |
St.27 status event code: A-2-3-E10-E12-rex-PX0901 |
|
| PX0601 | Decision of rejection after re-examination |
St.27 status event code: N-2-6-B10-B17-rex-PX0601 |
|
| X601 | Decision of rejection after re-examination | ||
| A107 | Divisional application of patent | ||
| J201 | Request for trial against refusal decision | ||
| PA0107 | Divisional application |
St.27 status event code: A-0-1-A10-A18-div-PA0107 St.27 status event code: A-0-1-A10-A16-div-PA0107 |
|
| PJ0201 | Trial against decision of rejection |
St.27 status event code: A-3-3-V10-V11-apl-PJ0201 |
|
| J301 | Trial decision |
Free format text: TRIAL NUMBER: 2021101001001; TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20210421 Effective date: 20220126 |
|
| PJ1301 | Trial decision |
St.27 status event code: A-3-3-V10-V15-crt-PJ1301 Decision date: 20220126 Appeal event data comment text: Appeal Kind Category : Appeal against decision to decline refusal, Appeal Ground Text : 2013 0122274 Appeal request date: 20210421 Appellate body name: Patent Examination Board Decision authority category: Office appeal board Decision identifier: 2021101001001 |
|
| J2X1 | Appeal (before the patent court) |
Free format text: TRIAL NUMBER: 2022201001872; APPEAL AGAINST DECISION TO DECLINE REFUSAL |
|
| PJ2001 | Appeal |
St.27 status event code: A-3-3-V10-V12-crt-PJ2001 |
|
| PJ1302 | Judgment (patent court) |
St.27 status event code: A-3-3-V10-V15-crt-PJ1302 Decision date: 20230203 Decision identifier: 2022201001872 Decision authority category: National patent court Appeal event data comment text: Appeal Kind Category : Appeal against decision to decline refusal, Appeal Ground Text : 20211001 (2013 0122274) Appeal request date: 20220225 Appellate body name: Patent Court Decision text: 1. . 2. . |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |