KR20120003376A - 현미경 및 영역 판정 방법 - Google Patents

현미경 및 영역 판정 방법 Download PDF

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Publication number
KR20120003376A
KR20120003376A KR1020110061821A KR20110061821A KR20120003376A KR 20120003376 A KR20120003376 A KR 20120003376A KR 1020110061821 A KR1020110061821 A KR 1020110061821A KR 20110061821 A KR20110061821 A KR 20110061821A KR 20120003376 A KR20120003376 A KR 20120003376A
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South Korea
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image
dark field
field image
preparat
region
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KR1020110061821A
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English (en)
Korean (ko)
Inventor
고 마쯔노부
다까미찌 야마꼬시
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소니 주식회사
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Publication of KR20120003376A publication Critical patent/KR20120003376A/ko
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/04Measuring microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • G02B21/08Condensers
    • G02B21/12Condensers affording bright-field illumination
    • G02B21/125Condensers affording bright-field illumination affording both dark- and bright-field illumination
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V20/00Scenes; Scene-specific elements
    • G06V20/60Type of objects
    • G06V20/69Microscopic objects, e.g. biological cells or cellular parts
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/26Stages; Adjusting means therefor
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/20Image preprocessing
    • G06V10/24Aligning, centring, orientation detection or correction of the image
    • G06V10/245Aligning, centring, orientation detection or correction of the image by locating a pattern; Special marks for positioning

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Microscoopes, Condenser (AREA)
  • Studio Devices (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020110061821A 2010-07-02 2011-06-24 현미경 및 영역 판정 방법 Withdrawn KR20120003376A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2010-152367 2010-07-02
JP2010152367A JP5703609B2 (ja) 2010-07-02 2010-07-02 顕微鏡及び領域判定方法

Publications (1)

Publication Number Publication Date
KR20120003376A true KR20120003376A (ko) 2012-01-10

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Family Applications (1)

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KR1020110061821A Withdrawn KR20120003376A (ko) 2010-07-02 2011-06-24 현미경 및 영역 판정 방법

Country Status (5)

Country Link
US (1) US9013570B2 (enExample)
EP (1) EP2402813B1 (enExample)
JP (1) JP5703609B2 (enExample)
KR (1) KR20120003376A (enExample)
CN (1) CN102313982B (enExample)

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JP6120675B2 (ja) * 2013-05-23 2017-04-26 オリンパス株式会社 顕微鏡システム、画像生成方法及びプログラム
US9562860B1 (en) 2013-06-19 2017-02-07 Theranos, Inc. Methods and devices for sample analysis
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JP6315655B2 (ja) * 2013-11-19 2018-04-25 浜松ホトニクス株式会社 細胞画像処理方法、細胞画像処理装置及び細胞画像処理プログラム
JP2016052116A (ja) * 2014-08-28 2016-04-11 パナソニックIpマネジメント株式会社 画像処理装置、画像処理方法およびコンピュータプログラム
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CN113514945B (zh) * 2015-03-13 2024-04-09 格尼亚Ip控股私人有限公司 用于显微技术的方法与装置
US10510143B1 (en) * 2015-09-21 2019-12-17 Ares Trading S.A. Systems and methods for generating a mask for automated assessment of embryo quality
US10551608B2 (en) * 2016-03-24 2020-02-04 Molecular Devices, Llc Imaging system with ancillary image detector for sample location
CN109073517A (zh) 2016-04-27 2018-12-21 文塔纳医疗系统公司 用于实时体积控制的系统和方法
CN110383038B (zh) * 2016-10-21 2022-09-23 第一前沿有限公司 用于对空气样本进行自动分析的系统和方法
DE102016122528A1 (de) 2016-11-22 2018-05-24 Carl Zeiss Microscopy Gmbh Verfahren zum Steuern oder Regeln einer Mikroskopbeleuchtung
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CN106973258B (zh) * 2017-02-08 2020-05-22 上海交通大学 病理切片信息快速获取装置
JP7009619B2 (ja) * 2017-09-29 2022-01-25 ライカ バイオシステムズ イメージング インコーポレイテッド 2回通過式マクロ画像
JP7195269B2 (ja) * 2017-11-22 2022-12-23 富士フイルム株式会社 観察装置、観察装置の作動方法、及び観察制御プログラム
JP7458328B2 (ja) 2018-05-21 2024-03-29 コリスタ・エルエルシー マルチ分解能登録を介したマルチサンプル全体スライド画像処理
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EP3839596B1 (de) * 2019-12-20 2023-08-23 Euroimmun Medizinische Labordiagnostika AG Vorrichtung und verfahren zur identifikation von deckglasbereichen eines objektträgers
FR3109159B1 (fr) * 2020-04-09 2023-06-23 Interscience Procédé de traitement d’images appliqué aux compteurs de colonies en microbiologie
CN112363309B (zh) * 2020-11-13 2023-02-17 杭州医派智能科技有限公司 一种用于显微镜下病理图像的自动寻焦方法和系统
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Also Published As

Publication number Publication date
CN102313982A (zh) 2012-01-11
JP2012014078A (ja) 2012-01-19
EP2402813A2 (en) 2012-01-04
CN102313982B (zh) 2017-05-24
US9013570B2 (en) 2015-04-21
EP2402813A3 (en) 2012-03-07
JP5703609B2 (ja) 2015-04-22
US20120002034A1 (en) 2012-01-05
EP2402813B1 (en) 2016-03-30

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PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20110624

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid