KR20070118164A - 다광자 감광 시스템 - Google Patents
다광자 감광 시스템 Download PDFInfo
- Publication number
- KR20070118164A KR20070118164A KR1020077025222A KR20077025222A KR20070118164A KR 20070118164 A KR20070118164 A KR 20070118164A KR 1020077025222 A KR1020077025222 A KR 1020077025222A KR 20077025222 A KR20077025222 A KR 20077025222A KR 20070118164 A KR20070118164 A KR 20070118164A
- Authority
- KR
- South Korea
- Prior art keywords
- multiphoton
- photosensitizer
- composition
- electron donor
- photoinitiator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 0 CC(*)CCc1ccc(C(*c(ccc(N(*)*)c2)c2S2)C(c3ccccc3)=O)c2c1 Chemical compound CC(*)CCc1ccc(C(*c(ccc(N(*)*)c2)c2S2)C(c3ccccc3)=O)c2c1 0.000 description 4
- NJILEMILSKGFRL-UHFFFAOYSA-N Cs(cc1)ccc1N(c1ccccc1)c1ccccc1 Chemical compound Cs(cc1)ccc1N(c1ccccc1)c1ccccc1 NJILEMILSKGFRL-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F2/00—Processes of polymerisation
- C08F2/46—Polymerisation initiated by wave energy or particle radiation
- C08F2/48—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light
- C08F2/50—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light with sensitising agents
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F2/00—Processes of polymerisation
- C08F2/46—Polymerisation initiated by wave energy or particle radiation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0042—Photosensitive materials with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0382—Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Polymerisation Methods In General (AREA)
- Glass Compositions (AREA)
- Heterocyclic Carbon Compounds Containing A Hetero Ring Having Oxygen Or Sulfur (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US21170300P | 2000-06-15 | 2000-06-15 | |
| US60/211,703 | 2000-06-15 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020027017095A Division KR100813320B1 (ko) | 2000-06-15 | 2001-06-14 | 다광자 감광 시스템 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20070118164A true KR20070118164A (ko) | 2007-12-13 |
Family
ID=22788007
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020077025222A Ceased KR20070118164A (ko) | 2000-06-15 | 2001-06-14 | 다광자 감광 시스템 |
| KR1020027017095A Expired - Fee Related KR100813320B1 (ko) | 2000-06-15 | 2001-06-14 | 다광자 감광 시스템 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020027017095A Expired - Fee Related KR100813320B1 (ko) | 2000-06-15 | 2001-06-14 | 다광자 감광 시스템 |
Country Status (7)
| Country | Link |
|---|---|
| EP (1) | EP1297021B1 (enExample) |
| JP (1) | JP5059273B2 (enExample) |
| KR (2) | KR20070118164A (enExample) |
| AT (1) | ATE425993T1 (enExample) |
| AU (1) | AU2001268443A1 (enExample) |
| DE (1) | DE60138021D1 (enExample) |
| WO (1) | WO2001096409A2 (enExample) |
Families Citing this family (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100795759B1 (ko) * | 2000-06-15 | 2008-01-21 | 쓰리엠 이노베이티브 프로퍼티즈 캄파니 | 미세유체 물품의 제조 방법 |
| US7265161B2 (en) | 2002-10-02 | 2007-09-04 | 3M Innovative Properties Company | Multi-photon reactive compositions with inorganic particles and method for fabricating structures |
| US7005229B2 (en) * | 2002-10-02 | 2006-02-28 | 3M Innovative Properties Company | Multiphoton photosensitization method |
| US7381516B2 (en) | 2002-10-02 | 2008-06-03 | 3M Innovative Properties Company | Multiphoton photosensitization system |
| US7118845B2 (en) | 2000-06-15 | 2006-10-10 | 3M Innovative Properties Company | Multiphoton photochemical process and articles preparable thereby |
| US6716995B2 (en) | 2000-08-17 | 2004-04-06 | Lumera Corporation | Design and synthesis of advanced NLO materials for electro-optic applications |
| US6750266B2 (en) | 2001-12-28 | 2004-06-15 | 3M Innovative Properties Company | Multiphoton photosensitization system |
| US7232650B2 (en) | 2002-10-02 | 2007-06-19 | 3M Innovative Properties Company | Planar inorganic device |
| JP4001118B2 (ja) | 2003-03-24 | 2007-10-31 | ソニー株式会社 | 有機電界発光素子及びアミノモノスチリルナフタレン化合物 |
| US20050046915A1 (en) * | 2003-08-22 | 2005-03-03 | Fuji Photo Film Co., Ltd. | Hologram recording material composition, hologram recording material and hologram recording method |
| EP1510862A3 (en) | 2003-08-25 | 2006-08-09 | Fuji Photo Film Co., Ltd. | Hologram recording method and hologram recording material |
| JP4556531B2 (ja) * | 2003-09-09 | 2010-10-06 | 三菱化学株式会社 | 青紫色レーザー感光性組成物、並びにそれを用いた画像形成材料、感光性画像形成材及び画像形成方法 |
| JP2008181143A (ja) * | 2003-09-09 | 2008-08-07 | Mitsubishi Chemicals Corp | 青紫色レーザー感光性組成物、並びにそれを用いた画像形成材料、感光性画像形成材及び画像形成方法 |
| EP1723455B1 (en) | 2003-12-05 | 2009-08-12 | 3M Innovative Properties Company | Process for producing photonic crystals |
| DE602004018483D1 (de) * | 2004-07-30 | 2009-01-29 | Agfa Graphics Nv | Fotopolymerisierbare Zusammensetzung. |
| DE102004055733B3 (de) * | 2004-11-18 | 2006-05-04 | Kodak Polychrome Graphics Gmbh | Lithographie-Druckplattenvorläufer mit oligomeren oder polymeren Sensibilisatoren |
| US7297374B1 (en) | 2004-12-29 | 2007-11-20 | 3M Innovative Properties Company | Single- and multi-photon polymerizable pre-ceramic polymeric compositions |
| EP1846527B1 (en) | 2004-12-29 | 2008-08-06 | 3M Innovative Properties Company | Multi-photon polymerizable pre-ceramic polymeric compositions |
| JP2006289613A (ja) * | 2005-04-05 | 2006-10-26 | Fuji Photo Film Co Ltd | 2光子吸収光記録材料、2光子吸収光記録媒体及びその記録再生方法、並びに2光子吸収光記録再生装置 |
| JP2007078894A (ja) * | 2005-09-12 | 2007-03-29 | Fujifilm Corp | 感光性組成物、パターン形成材料、感光性積層体、並びにパターン形成装置及びパターン形成方法 |
| EP1998844A4 (en) * | 2006-03-24 | 2017-03-01 | 3M Innovative Properties Company | Process for making microneedles, microneedle arrays, masters, and replication tools |
| JP5229521B2 (ja) * | 2006-09-15 | 2013-07-03 | 株式会社リコー | π共役系化合物とその用途、およびそれらを用いた素子、装置 |
| JP5162511B2 (ja) * | 2009-03-25 | 2013-03-13 | 富士フイルム株式会社 | 非共鳴2光子吸収重合用組成物及びそれを用いた3次元光記録媒体 |
| KR101710319B1 (ko) * | 2011-03-07 | 2017-02-24 | 산요가세이고교 가부시키가이샤 | 감광성 조성물, 경화물, 및, 활성 광선 경화물의 제조 방법 |
| WO2012145282A2 (en) * | 2011-04-22 | 2012-10-26 | 3M Innovative Properties Company | Enhanced multi-photon imaging resolution method |
| CN102768466A (zh) * | 2011-05-05 | 2012-11-07 | 中国科学院理化技术研究所 | 化学增幅型正性光刻胶、制备方法及其在双光子精细加工中的应用 |
| TWI475321B (zh) * | 2013-03-06 | 2015-03-01 | Chi Mei Corp | 感光性樹脂組成物及其應用 |
| WO2015084735A2 (en) * | 2013-12-06 | 2015-06-11 | 3M Innovative Properties Company | Liquid photoreactive composition and method of fabricating structures |
| JP6722672B2 (ja) * | 2014-12-19 | 2020-07-15 | コベストロ、ドイチュラント、アクチエンゲゼルシャフトCovestro Deutschland Ag | 水分に安定なホログラフィック媒体 |
| KR20170002937U (ko) | 2016-02-12 | 2017-08-22 | 주식회사 오엠티 | 수납장용 레일 조립체 |
| CN110240615A (zh) * | 2018-03-09 | 2019-09-17 | 首都师范大学 | 新型有机小分子材料的合成方法、微晶的制备方法及其应用 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0675374A (ja) * | 1992-07-02 | 1994-03-18 | Showa Denko Kk | 光硬化性材料及び硬化方法 |
| US5747550A (en) * | 1995-06-05 | 1998-05-05 | Kimberly-Clark Worldwide, Inc. | Method of generating a reactive species and polymerizing an unsaturated polymerizable material |
| JPH09160238A (ja) * | 1995-12-05 | 1997-06-20 | Toyobo Co Ltd | 光重合性組成物、それを用いた感光性原版およびその露光方法 |
| WO1998021521A1 (en) * | 1996-11-12 | 1998-05-22 | California Institute Of Technology | Two-photon or higher-order absorbing optical materials and methods of use |
| JPH11116611A (ja) * | 1997-10-13 | 1999-04-27 | Tokuyama Sekiyu Kagaku Kk | 光重合性組成物 |
| JP3674336B2 (ja) * | 1998-10-02 | 2005-07-20 | 凸版印刷株式会社 | 可視光重合性組成物 |
-
2001
- 2001-06-14 KR KR1020077025222A patent/KR20070118164A/ko not_active Ceased
- 2001-06-14 KR KR1020027017095A patent/KR100813320B1/ko not_active Expired - Fee Related
- 2001-06-14 EP EP01946384A patent/EP1297021B1/en not_active Expired - Lifetime
- 2001-06-14 AU AU2001268443A patent/AU2001268443A1/en not_active Abandoned
- 2001-06-14 JP JP2002510544A patent/JP5059273B2/ja not_active Expired - Fee Related
- 2001-06-14 AT AT01946384T patent/ATE425993T1/de not_active IP Right Cessation
- 2001-06-14 WO PCT/US2001/019164 patent/WO2001096409A2/en not_active Ceased
- 2001-06-14 DE DE60138021T patent/DE60138021D1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| WO2001096409A3 (en) | 2002-04-04 |
| WO2001096409A2 (en) | 2001-12-20 |
| EP1297021A2 (en) | 2003-04-02 |
| KR20030011354A (ko) | 2003-02-07 |
| JP5059273B2 (ja) | 2012-10-24 |
| AU2001268443A1 (en) | 2001-12-24 |
| EP1297021B1 (en) | 2009-03-18 |
| DE60138021D1 (enExample) | 2009-04-30 |
| KR100813320B1 (ko) | 2008-03-12 |
| ATE425993T1 (de) | 2009-04-15 |
| JP2004503616A (ja) | 2004-02-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A107 | Divisional application of patent | ||
| PA0104 | Divisional application for international application |
Comment text: Divisional Application for International Patent Patent event code: PA01041R01D Patent event date: 20071031 |
|
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20071128 Comment text: Request for Examination of Application |
|
| PG1501 | Laying open of application | ||
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20080212 Patent event code: PE09021S01D |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
Patent event date: 20080618 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20080212 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |