KR20060044386A - 측정기 - Google Patents

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Publication number
KR20060044386A
KR20060044386A KR1020050022595A KR20050022595A KR20060044386A KR 20060044386 A KR20060044386 A KR 20060044386A KR 1020050022595 A KR1020050022595 A KR 1020050022595A KR 20050022595 A KR20050022595 A KR 20050022595A KR 20060044386 A KR20060044386 A KR 20060044386A
Authority
KR
South Korea
Prior art keywords
data
serial
parallel
modules
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020050022595A
Other languages
English (en)
Korean (ko)
Inventor
다쿠야 오타니
Original Assignee
애질런트 테크놀로지스, 인크.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 애질런트 테크놀로지스, 인크. filed Critical 애질런트 테크놀로지스, 인크.
Publication of KR20060044386A publication Critical patent/KR20060044386A/ko
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G08—SIGNALLING
    • G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C19/00—Electric signal transmission systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
    • G06F13/4282—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus
    • G06F13/4295—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus using an embedded synchronisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020050022595A 2004-03-18 2005-03-18 측정기 Withdrawn KR20060044386A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2004-00079036 2004-03-18
JP2004079036A JP2005265630A (ja) 2004-03-18 2004-03-18 測定器

Publications (1)

Publication Number Publication Date
KR20060044386A true KR20060044386A (ko) 2006-05-16

Family

ID=34987678

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050022595A Withdrawn KR20060044386A (ko) 2004-03-18 2005-03-18 측정기

Country Status (5)

Country Link
US (1) US20050210170A1 (https=)
JP (1) JP2005265630A (https=)
KR (1) KR20060044386A (https=)
CN (1) CN1670782A (https=)
TW (1) TW200534188A (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070002893A1 (en) * 2005-07-01 2007-01-04 Neff Robert M R Input/output (I/O) interface for high-speed data converters
JP4835935B2 (ja) * 2007-01-05 2011-12-14 横河電機株式会社 データ転送回路および半導体試験装置
JP2010145271A (ja) * 2008-12-19 2010-07-01 Yokogawa Electric Corp 半導体試験装置
US8706439B2 (en) 2009-12-27 2014-04-22 Advantest Corporation Test apparatus and test method
CN110275851B (zh) * 2019-07-19 2020-02-07 广州波视信息科技股份有限公司 一种数据串并转换装置、延时器及数据处理方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4542420A (en) * 1984-01-24 1985-09-17 Honeywell Inc. Manchester decoder
US5134702A (en) * 1986-04-21 1992-07-28 Ncr Corporation Serial-to-parallel and parallel-to-serial converter
JP2880364B2 (ja) * 1993-02-25 1999-04-05 株式会社日立製作所 自動車用エンジン制御装置
US5493657A (en) * 1993-06-21 1996-02-20 Apple Computer, Inc. High speed dominant mode bus for differential signals
US5854591A (en) * 1996-09-13 1998-12-29 Sony Trans Com, Inc. System and method for processing passenger service system information
DE10082824T1 (de) * 1999-08-17 2002-02-28 Advantest Corp Adapter zum Steuern einer Meßvorrichtung, eine Meßvorrichtung, eine Steuervorrichtung für eine Meßvorrichtung, ein Verfahren zum Verarbeiten der Messung und ein Aufzeichnungsmedium

Also Published As

Publication number Publication date
CN1670782A (zh) 2005-09-21
TW200534188A (en) 2005-10-16
JP2005265630A (ja) 2005-09-29
US20050210170A1 (en) 2005-09-22

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20050318

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid