JP2005265630A - 測定器 - Google Patents

測定器 Download PDF

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Publication number
JP2005265630A
JP2005265630A JP2004079036A JP2004079036A JP2005265630A JP 2005265630 A JP2005265630 A JP 2005265630A JP 2004079036 A JP2004079036 A JP 2004079036A JP 2004079036 A JP2004079036 A JP 2004079036A JP 2005265630 A JP2005265630 A JP 2005265630A
Authority
JP
Japan
Prior art keywords
data
serial
parallel
signal
modules
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004079036A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005265630A5 (https=
Inventor
Takuya Otani
卓也 大谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Priority to JP2004079036A priority Critical patent/JP2005265630A/ja
Priority to TW093137455A priority patent/TW200534188A/zh
Priority to CNA2004101015570A priority patent/CN1670782A/zh
Priority to US11/076,739 priority patent/US20050210170A1/en
Priority to KR1020050022595A priority patent/KR20060044386A/ko
Publication of JP2005265630A publication Critical patent/JP2005265630A/ja
Publication of JP2005265630A5 publication Critical patent/JP2005265630A5/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
    • G06F13/4282—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus
    • G06F13/4295—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus using an embedded synchronisation
    • G—PHYSICS
    • G08—SIGNALLING
    • G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C19/00—Electric signal transmission systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2004079036A 2004-03-18 2004-03-18 測定器 Pending JP2005265630A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2004079036A JP2005265630A (ja) 2004-03-18 2004-03-18 測定器
TW093137455A TW200534188A (en) 2004-03-18 2004-12-03 A measuring apparatus with plural modules
CNA2004101015570A CN1670782A (zh) 2004-03-18 2004-12-23 测定器
US11/076,739 US20050210170A1 (en) 2004-03-18 2005-03-10 Measuring apparatus with plural modules
KR1020050022595A KR20060044386A (ko) 2004-03-18 2005-03-18 측정기

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004079036A JP2005265630A (ja) 2004-03-18 2004-03-18 測定器

Publications (2)

Publication Number Publication Date
JP2005265630A true JP2005265630A (ja) 2005-09-29
JP2005265630A5 JP2005265630A5 (https=) 2007-04-26

Family

ID=34987678

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004079036A Pending JP2005265630A (ja) 2004-03-18 2004-03-18 測定器

Country Status (5)

Country Link
US (1) US20050210170A1 (https=)
JP (1) JP2005265630A (https=)
KR (1) KR20060044386A (https=)
CN (1) CN1670782A (https=)
TW (1) TW200534188A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008164563A (ja) * 2007-01-05 2008-07-17 Yokogawa Electric Corp データ転送回路および半導体試験装置
JP2010145271A (ja) * 2008-12-19 2010-07-01 Yokogawa Electric Corp 半導体試験装置
US8706439B2 (en) 2009-12-27 2014-04-22 Advantest Corporation Test apparatus and test method

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070002893A1 (en) * 2005-07-01 2007-01-04 Neff Robert M R Input/output (I/O) interface for high-speed data converters
CN110275851B (zh) * 2019-07-19 2020-02-07 广州波视信息科技股份有限公司 一种数据串并转换装置、延时器及数据处理方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4542420A (en) * 1984-01-24 1985-09-17 Honeywell Inc. Manchester decoder
US5134702A (en) * 1986-04-21 1992-07-28 Ncr Corporation Serial-to-parallel and parallel-to-serial converter
JP2880364B2 (ja) * 1993-02-25 1999-04-05 株式会社日立製作所 自動車用エンジン制御装置
US5493657A (en) * 1993-06-21 1996-02-20 Apple Computer, Inc. High speed dominant mode bus for differential signals
US5854591A (en) * 1996-09-13 1998-12-29 Sony Trans Com, Inc. System and method for processing passenger service system information
DE10082824T1 (de) * 1999-08-17 2002-02-28 Advantest Corp Adapter zum Steuern einer Meßvorrichtung, eine Meßvorrichtung, eine Steuervorrichtung für eine Meßvorrichtung, ein Verfahren zum Verarbeiten der Messung und ein Aufzeichnungsmedium

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008164563A (ja) * 2007-01-05 2008-07-17 Yokogawa Electric Corp データ転送回路および半導体試験装置
JP2010145271A (ja) * 2008-12-19 2010-07-01 Yokogawa Electric Corp 半導体試験装置
US8706439B2 (en) 2009-12-27 2014-04-22 Advantest Corporation Test apparatus and test method

Also Published As

Publication number Publication date
CN1670782A (zh) 2005-09-21
TW200534188A (en) 2005-10-16
KR20060044386A (ko) 2006-05-16
US20050210170A1 (en) 2005-09-22

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