CN101065680B - 集成电路自测试结构 - Google Patents
集成电路自测试结构 Download PDFInfo
- Publication number
- CN101065680B CN101065680B CN2005800405399A CN200580040539A CN101065680B CN 101065680 B CN101065680 B CN 101065680B CN 2005800405399 A CN2005800405399 A CN 2005800405399A CN 200580040539 A CN200580040539 A CN 200580040539A CN 101065680 B CN101065680 B CN 101065680B
- Authority
- CN
- China
- Prior art keywords
- shift register
- monitor
- output
- integrated circuit
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (4)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP04106128 | 2004-11-29 | ||
EP04106128.4 | 2004-11-29 | ||
PCT/IB2005/053883 WO2006056951A1 (en) | 2004-11-29 | 2005-11-23 | Integrated circuit self-test architecture |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101065680A CN101065680A (zh) | 2007-10-31 |
CN101065680B true CN101065680B (zh) | 2011-08-31 |
Family
ID=36165377
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2005800405399A Expired - Fee Related CN101065680B (zh) | 2004-11-29 | 2005-11-23 | 集成电路自测试结构 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7710136B2 (zh) |
EP (1) | EP1820037B1 (zh) |
JP (1) | JP2008522148A (zh) |
CN (1) | CN101065680B (zh) |
AT (1) | ATE422676T1 (zh) |
DE (1) | DE602005012723D1 (zh) |
WO (1) | WO2006056951A1 (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8281158B2 (en) * | 2007-05-30 | 2012-10-02 | Lapis Semiconductor Co., Ltd. | Semiconductor integrated circuit |
EP2286256B1 (en) | 2008-05-29 | 2012-05-16 | Nxp B.V. | Dll for period jitter measurement |
JP2010066019A (ja) * | 2008-09-08 | 2010-03-25 | Nec Electronics Corp | テスト回路およびテスト方法 |
US10145882B2 (en) * | 2010-09-24 | 2018-12-04 | Infineon Technologies Ag | Sensor self-diagnostics using multiple signal paths |
US9346441B2 (en) * | 2010-09-24 | 2016-05-24 | Infineon Technologies Ag | Sensor self-diagnostics using multiple signal paths |
CN103335597B (zh) * | 2013-07-02 | 2015-12-02 | 中国科学院长春光学精密机械与物理研究所 | 光栅尺光电传感器 |
CN104701299A (zh) * | 2013-12-06 | 2015-06-10 | 上海北京大学微电子研究院 | Qfn封装-高速ic协同设计信号完整性分析方法 |
CN108872830A (zh) * | 2018-06-07 | 2018-11-23 | 苏州纳芯微电子股份有限公司 | 一种用于传感器调理芯片的单线测试方法 |
CN111025132B (zh) * | 2018-10-09 | 2022-02-15 | 瑞昱半导体股份有限公司 | 系统芯片、以及其内建自我测试电路与自我测试方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0657815A1 (en) * | 1993-12-10 | 1995-06-14 | International Business Machines Corporation | Boundary scan test system and method for testing a circuit network having analog and digital devices |
CN1519575A (zh) * | 2003-01-30 | 2004-08-11 | ������������ʽ���� | 测试电路、集成电路及测试方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5563524A (en) * | 1989-05-19 | 1996-10-08 | A.T.E. Solutions, Inc. | Apparatus for testing electric circuits |
US5528600A (en) * | 1991-01-28 | 1996-06-18 | Actel Corporation | Testability circuits for logic arrays |
US5285152A (en) * | 1992-03-23 | 1994-02-08 | Ministar Peripherals International Limited | Apparatus and methods for testing circuit board interconnect integrity |
US6556021B1 (en) * | 2000-11-29 | 2003-04-29 | Lsi Logic Corporation | Device frequency measurement system |
US7285948B2 (en) * | 2002-12-17 | 2007-10-23 | Tektronix, Inc. | Method and apparatus providing single cable bi-directional triggering between instruments |
KR20050089889A (ko) * | 2003-01-28 | 2005-09-08 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 물리적 동작 파라미터 감지용 집적 센서를 갖는 집적 회로장치와 이러한 장치를 갖는 전자 시스템의 테스트 방법 및이를 포함하는 전자 장치 |
JP2008538863A (ja) * | 2005-04-25 | 2008-11-06 | エヌエックスピー ビー ヴィ | 電源電圧の監視 |
-
2005
- 2005-11-23 JP JP2007542470A patent/JP2008522148A/ja not_active Withdrawn
- 2005-11-23 AT AT05807208T patent/ATE422676T1/de not_active IP Right Cessation
- 2005-11-23 WO PCT/IB2005/053883 patent/WO2006056951A1/en active Application Filing
- 2005-11-23 DE DE602005012723T patent/DE602005012723D1/de active Active
- 2005-11-23 EP EP05807208A patent/EP1820037B1/en not_active Not-in-force
- 2005-11-23 CN CN2005800405399A patent/CN101065680B/zh not_active Expired - Fee Related
- 2005-11-23 US US11/720,317 patent/US7710136B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0657815A1 (en) * | 1993-12-10 | 1995-06-14 | International Business Machines Corporation | Boundary scan test system and method for testing a circuit network having analog and digital devices |
CN1519575A (zh) * | 2003-01-30 | 2004-08-11 | ������������ʽ���� | 测试电路、集成电路及测试方法 |
Also Published As
Publication number | Publication date |
---|---|
CN101065680A (zh) | 2007-10-31 |
ATE422676T1 (de) | 2009-02-15 |
WO2006056951A1 (en) | 2006-06-01 |
EP1820037B1 (en) | 2009-02-11 |
EP1820037A1 (en) | 2007-08-22 |
DE602005012723D1 (de) | 2009-03-26 |
US20080272797A1 (en) | 2008-11-06 |
US7710136B2 (en) | 2010-05-04 |
JP2008522148A (ja) | 2008-06-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: NXP CO., LTD. Free format text: FORMER OWNER: KONINKLIJKE PHILIPS ELECTRONICS N.V. Effective date: 20080411 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20080411 Address after: Holland Ian Deho Finn Applicant after: Koninkl Philips Electronics NV Address before: Holland Ian Deho Finn Applicant before: Koninklijke Philips Electronics N.V. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110831 Termination date: 20131123 |