KR20050075504A - 내장 메모리의 페일를 검출하기 위한 반도체 테스트 장치 - Google Patents
내장 메모리의 페일를 검출하기 위한 반도체 테스트 장치 Download PDFInfo
- Publication number
- KR20050075504A KR20050075504A KR1020040002998A KR20040002998A KR20050075504A KR 20050075504 A KR20050075504 A KR 20050075504A KR 1020040002998 A KR1020040002998 A KR 1020040002998A KR 20040002998 A KR20040002998 A KR 20040002998A KR 20050075504 A KR20050075504 A KR 20050075504A
- Authority
- KR
- South Korea
- Prior art keywords
- data
- memories
- gate
- fail
- output
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/14—Implementation of control logic, e.g. test mode decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/36—Data generation devices, e.g. data inverters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/10—Aspects relating to interfaces of memory device to external buses
- G11C2207/105—Aspects related to pads, pins or terminals
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020040002998A KR20050075504A (ko) | 2004-01-15 | 2004-01-15 | 내장 메모리의 페일를 검출하기 위한 반도체 테스트 장치 |
| JP2005004502A JP2005203085A (ja) | 2004-01-15 | 2005-01-11 | 内蔵メモリのフェイルを検出するための半導体テスト装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020040002998A KR20050075504A (ko) | 2004-01-15 | 2004-01-15 | 내장 메모리의 페일를 검출하기 위한 반도체 테스트 장치 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20050075504A true KR20050075504A (ko) | 2005-07-21 |
Family
ID=34825030
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020040002998A KR20050075504A (ko) | 2004-01-15 | 2004-01-15 | 내장 메모리의 페일를 검출하기 위한 반도체 테스트 장치 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP2005203085A (ja) |
| KR (1) | KR20050075504A (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101242602B1 (ko) * | 2006-02-08 | 2013-03-19 | 삼성전자주식회사 | 테스트 회로를 내장한 시스템 온 칩 |
-
2004
- 2004-01-15 KR KR1020040002998A patent/KR20050075504A/ko not_active Application Discontinuation
-
2005
- 2005-01-11 JP JP2005004502A patent/JP2005203085A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101242602B1 (ko) * | 2006-02-08 | 2013-03-19 | 삼성전자주식회사 | 테스트 회로를 내장한 시스템 온 칩 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2005203085A (ja) | 2005-07-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WITN | Withdrawal due to no request for examination |