KR20040079932A - 집적화된 신호 아이솔레이터용 자기장 스트랩 - Google Patents
집적화된 신호 아이솔레이터용 자기장 스트랩 Download PDFInfo
- Publication number
- KR20040079932A KR20040079932A KR10-2004-7010973A KR20047010973A KR20040079932A KR 20040079932 A KR20040079932 A KR 20040079932A KR 20047010973 A KR20047010973 A KR 20047010973A KR 20040079932 A KR20040079932 A KR 20040079932A
- Authority
- KR
- South Korea
- Prior art keywords
- input
- isolator
- magnetoresistances
- strap
- winding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000004044 response Effects 0.000 claims abstract description 32
- 238000004804 winding Methods 0.000 claims description 33
- 238000000034 method Methods 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims description 4
- 238000004519 manufacturing process Methods 0.000 claims description 3
- WYTGDNHDOZPMIW-RCBQFDQVSA-N alstonine Natural products C1=CC2=C3C=CC=CC3=NC2=C2N1C[C@H]1[C@H](C)OC=C(C(=O)OC)[C@H]1C2 WYTGDNHDOZPMIW-RCBQFDQVSA-N 0.000 claims description 2
- 230000008878 coupling Effects 0.000 claims 4
- 238000010168 coupling process Methods 0.000 claims 4
- 238000005859 coupling reaction Methods 0.000 claims 4
- 206010039740 Screaming Diseases 0.000 abstract 1
- 239000002184 metal Substances 0.000 description 15
- 239000010409 thin film Substances 0.000 description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 230000008859 change Effects 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 229910000889 permalloy Inorganic materials 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000005415 magnetization Effects 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/096—Magnetoresistive devices anisotropic magnetoresistance sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N59/00—Integrated devices, or assemblies of multiple devices, comprising at least one galvanomagnetic or Hall-effect element covered by groups H10N50/00 - H10N52/00
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measuring Magnetic Variables (AREA)
- Hall/Mr Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/047,207 US7046117B2 (en) | 2002-01-15 | 2002-01-15 | Integrated magnetic field strap for signal isolator |
| US10/047,207 | 2002-01-15 | ||
| PCT/US2003/001213 WO2003060538A1 (en) | 2002-01-15 | 2003-01-15 | Integrated magnetic field strap for signal isolator |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20040079932A true KR20040079932A (ko) | 2004-09-16 |
Family
ID=21947648
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-2004-7010973A Withdrawn KR20040079932A (ko) | 2002-01-15 | 2003-01-15 | 집적화된 신호 아이솔레이터용 자기장 스트랩 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7046117B2 (https=) |
| EP (1) | EP1466187A1 (https=) |
| JP (1) | JP2005515667A (https=) |
| KR (1) | KR20040079932A (https=) |
| AU (1) | AU2003235600A1 (https=) |
| CA (1) | CA2473547A1 (https=) |
| WO (1) | WO2003060538A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100593895B1 (ko) * | 2004-12-21 | 2006-06-28 | 삼성전기주식회사 | 레플리카 렌즈를 구비하는 카메라 모듈 |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7808062B2 (en) | 2005-12-16 | 2010-10-05 | Nve Corporation | Signal isolator linear receiver |
| JP4194110B2 (ja) | 2007-03-12 | 2008-12-10 | オムロン株式会社 | 磁気カプラ素子および磁気結合型アイソレータ |
| CN101652671A (zh) * | 2007-03-30 | 2010-02-17 | Nxp股份有限公司 | 磁阻传感器 |
| JP4458149B2 (ja) * | 2007-10-31 | 2010-04-28 | Tdk株式会社 | 磁気カプラ |
| JP2009192429A (ja) | 2008-02-15 | 2009-08-27 | Tdk Corp | 磁気センサ及び磁場強度測定方法 |
| WO2010032823A1 (ja) * | 2008-09-22 | 2010-03-25 | アルプス電気株式会社 | 磁気結合型アイソレータ |
| WO2010032824A1 (ja) * | 2008-09-22 | 2010-03-25 | アルプス電気株式会社 | 磁気結合型アイソレータ |
| JP5440837B2 (ja) * | 2009-03-26 | 2014-03-12 | Tdk株式会社 | 信号伝達装置 |
| US8395383B2 (en) | 2010-03-11 | 2013-03-12 | Alps Green Devices Co., Ltd. | Current sensor including magnetic detecting element |
| US8525514B2 (en) * | 2010-03-19 | 2013-09-03 | Memsic, Inc. | Magnetometer |
| JP5964299B2 (ja) * | 2010-07-30 | 2016-08-03 | コミッサリア ア レネルジー アトミーク エ オ ゼネルジ ザルタナテイヴ | 磁気抵抗に基づき電圧又は電流を測定する集積化センサ |
| CN103091649A (zh) * | 2011-10-28 | 2013-05-08 | 爱盛科技股份有限公司 | 磁感测装置 |
| CN103091647A (zh) * | 2011-10-28 | 2013-05-08 | 爱盛科技股份有限公司 | 磁感测装置 |
| CN103091648A (zh) * | 2011-10-28 | 2013-05-08 | 爱盛科技股份有限公司 | 磁感测装置 |
| US9588194B2 (en) * | 2012-02-01 | 2017-03-07 | MCube Inc. | Method and device for magnetoresistive sensor |
| US9104922B2 (en) * | 2012-06-15 | 2015-08-11 | Honeywell International Inc. | Anisotropic magneto-resistance (AMR) gradiometer/magnetometer to read a magnetic track |
| US8885302B1 (en) * | 2013-10-01 | 2014-11-11 | Allegro Microsystems, Llc | Anisotropic magnetoresistive (AMR) sensors and techniques for fabricating same |
| US8848320B1 (en) * | 2013-10-01 | 2014-09-30 | Allegro Microsystems, Llc | Anisotropic magnetoresistive (AMR) sensors and techniques for fabricating same |
| US9013838B1 (en) * | 2013-10-01 | 2015-04-21 | Allegro Microsystems, Llc | Anisotropic magnetoresistive (AMR) sensors and techniques for fabricating same |
| RU2659877C1 (ru) * | 2017-08-16 | 2018-07-04 | Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" (Госкорпорация "Росатом") | Способ изготовления магниторезистивного датчика |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH651701A5 (de) * | 1980-12-24 | 1985-09-30 | Landis & Gyr Ag | Kompensierter messwandler. |
| US4504787A (en) * | 1982-04-05 | 1985-03-12 | Honeywell Inc. | Electronic watthour meter |
| US4441072A (en) * | 1982-07-12 | 1984-04-03 | Honeywell Inc. | Multiple input output electrical isolation for use with electronic integrated circuits |
| US5247278A (en) * | 1991-11-26 | 1993-09-21 | Honeywell Inc. | Magnetic field sensing device |
| JP3089828B2 (ja) * | 1992-05-27 | 2000-09-18 | 株式会社村田製作所 | 強磁性磁気抵抗素子 |
| DE4319146C2 (de) * | 1993-06-09 | 1999-02-04 | Inst Mikrostrukturtechnologie | Magnetfeldsensor, aufgebaut aus einer Ummagnetisierungsleitung und einem oder mehreren magnetoresistiven Widerständen |
| JPH08511873A (ja) * | 1994-04-15 | 1996-12-10 | フィリップス エレクトロニクス ネムローゼ フェンノートシャップ | 磁界センサ、そんなセンサを具えた装置及びそんなセンサを製造する方法 |
| US5500590A (en) * | 1994-07-20 | 1996-03-19 | Honeywell Inc. | Apparatus for sensing magnetic fields using a coupled film magnetoresistive transducer |
| DE4436876A1 (de) * | 1994-10-15 | 1996-04-18 | Lust Antriebstechnik Gmbh | Sensorchip |
| US5929636A (en) * | 1996-05-02 | 1999-07-27 | Integrated Magnetoelectronics | All-metal giant magnetoresistive solid-state component |
| US5831426A (en) * | 1996-08-16 | 1998-11-03 | Nonvolatile Electronics, Incorporated | Magnetic current sensor |
| JP2000504430A (ja) * | 1996-12-04 | 2000-04-11 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 磁界検出装置 |
| US5952825A (en) * | 1997-08-14 | 1999-09-14 | Honeywell Inc. | Magnetic field sensing device having integral coils for producing magnetic fields |
| US6054780A (en) * | 1997-10-23 | 2000-04-25 | Analog Devices, Inc. | Magnetically coupled signal isolator using a Faraday shielded MR or GMR receiving element |
| US5982178A (en) * | 1997-12-18 | 1999-11-09 | Honewell Inc. | Method and apparatus for sensing a desired component of an incident magnetic field using magneto resistive elements biased in different directions |
| US6300617B1 (en) * | 1998-03-04 | 2001-10-09 | Nonvolatile Electronics, Incorporated | Magnetic digital signal coupler having selected/reversal directions of magnetization |
| US6529114B1 (en) * | 1998-05-27 | 2003-03-04 | Honeywell International Inc. | Magnetic field sensing device |
| US6376933B1 (en) | 1999-12-31 | 2002-04-23 | Honeywell International Inc. | Magneto-resistive signal isolator |
-
2002
- 2002-01-15 US US10/047,207 patent/US7046117B2/en not_active Expired - Fee Related
-
2003
- 2003-01-15 AU AU2003235600A patent/AU2003235600A1/en not_active Abandoned
- 2003-01-15 EP EP03729671A patent/EP1466187A1/en not_active Withdrawn
- 2003-01-15 CA CA002473547A patent/CA2473547A1/en not_active Abandoned
- 2003-01-15 KR KR10-2004-7010973A patent/KR20040079932A/ko not_active Withdrawn
- 2003-01-15 JP JP2003560580A patent/JP2005515667A/ja active Pending
- 2003-01-15 WO PCT/US2003/001213 patent/WO2003060538A1/en not_active Ceased
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100593895B1 (ko) * | 2004-12-21 | 2006-06-28 | 삼성전기주식회사 | 레플리카 렌즈를 구비하는 카메라 모듈 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1466187A1 (en) | 2004-10-13 |
| CA2473547A1 (en) | 2003-07-24 |
| JP2005515667A (ja) | 2005-05-26 |
| AU2003235600A1 (en) | 2003-07-30 |
| US20030132826A1 (en) | 2003-07-17 |
| US7046117B2 (en) | 2006-05-16 |
| WO2003060538A1 (en) | 2003-07-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20040715 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| PC1203 | Withdrawal of no request for examination | ||
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |