KR20020070824A - 다점계측 두께 측정계 - Google Patents
다점계측 두께 측정계 Download PDFInfo
- Publication number
- KR20020070824A KR20020070824A KR1020020010420A KR20020010420A KR20020070824A KR 20020070824 A KR20020070824 A KR 20020070824A KR 1020020010420 A KR1020020010420 A KR 1020020010420A KR 20020010420 A KR20020010420 A KR 20020010420A KR 20020070824 A KR20020070824 A KR 20020070824A
- Authority
- KR
- South Korea
- Prior art keywords
- measured
- thickness
- ionizing
- measurement
- box
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/06—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring the deformation in a solid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/08—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims (9)
- 방사선원, 전리상자를 갖고, 상기 방사선원으로부터 방사되어 피측정물을 투과하여 입사된 방사선의 레벨에 관련된 출력신호를 얻는 검출수단 및 상기 검출수단의 출력신호로부터 상기 피측정물의 두께를 연산하는 연산수단을 구비하고, 상기 전리상자를 상기 피측정물의 흐름방향에 대해서 임의의 각도회전시켜 배열한 것을 특징으로 하는 다점계측 두께 측정계.
- 제 1 항에 있어서,상기 연산수단은 상기 피측정물의 폭을 측정하는 수단에 의해 측정된 폭값이 입력되고 상기 피측정물의 가장자리 위치, 또는 중심위치를 연산하고 상기 검출수단의 출력신호로부터 연산한 두께에 대한 상기 피측정물의 가장자리 위치, 또는 중심위치로부터의 위치를 특정할 수 있는 것을 특징으로 하는 다점계측 두께 측정계.
- 제 1 항에 있어서,상기 연산수단은 상기 피측정물의 가장자리를 검출하는 수단으로부터의 출력신호가 입력되고 상기 피측정물의 가장자리 위치를 연산하고 상기 검출수단의 출력신호로부터 연산한 두께에 대한 상기 피측정물의 가장자리 위치로부터의 위치를 특정할 수 있는 것을 특징으로 하는 다점계측 두께 측정계.
- 제 1 항에 있어서,상기 연산수단은 외부장치로부터의 중심 어긋남량이 입력되고, 상기 피측정물의 중심위치를 연산하고 상기 검출수단의 출력신호로부터 연산한 두께에 대한 상기 피측정물의 중심위치로부터의 위치를 특정할 수 있는 것을 특징으로 하는 다점계측 두께 측정계.
- 제 1 항에 있어서,상기 전리상자는 목표측정위치를 포함하는 소정범위의 위치에 배열되어 있으며, 상기 연산수단은 상기 피측정물의 폭을 측정하는 수단, 또는 상기 피측정물의 가장자리를 검출하는 수단, 또는 외부장치로부터의 출력신호가 입력되고, 상기 피측정물의 사행량을 구함과 동시에 복수의 측정위치의 두께값을 기초로 측정위치간의 두께값을 산출하기 위한 보간함수를 구하고, 상기 보간함수에 의해 상기 목표측정위치로부터 상기 사행량 어긋난 위치의 두께값을 연산하는 것을 특징으로 하는 다점계측 두께 측정계.
- 제 1 항에 있어서,상기 전리상자는 원통의 측면으로부터 방사선을 입사하는 구조의 것으로 하고, 상기 전리상자의 전체 길이와, 상기 전리상자측벽의 두께에 안전율을 곱하여 구한 불감대의 값을 사용하여, 상기 피측정물의 흐름방향에 대해서 상기 불감대가 없어지는 상기 전리상자의 회전각도를 결정하는 것을 특징으로 하는 다점계측 두께측정계.
- 제 1 항에 있어서,원통의 측면으로부터 방사선을 입사하는 구조의 것으로 하고, 상기 전리상자의 전체 길이와, 상기 전리상자의 내부직경 및 상기 전리상자 중심부에 대한 가스량비를 사용하여 구한 불감대의 값을 사용하여, 상기 피측정물의 흐름방향에 대해서 상기 불감대가 없어지는 상기 전리상자의 회전각도를 결정하는 것을 특징으로 하는 다점계측 두께 측정계.
- 제 1 항에 있어서,원통의 측면으로부터 방사선을 입사하는 구조의 것으로 하고, 상기 전리상자의 전체 길이와, 상기 전리상자의 외부직경 및 가스충만계수를 사용하여 구한 불감대의 값을 사용하여, 상기 피측정물의 흐름 방향에 대해서 상기 불감대가 없어지는 상기 전리상자의 회전각도를 결정하는 것을 특징으로 하는 다점계측 두께 측정계.
- 제 1 항 내지 제 8 항 중 어느 한 항에 있어서,인접하는 2개의 상기 전리상자간에 분리판을 삽입한 것을 특징으로 하는 다점계측두께 측정계.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2001-00056817 | 2001-03-01 | ||
JP2001056817 | 2001-03-01 | ||
JP2002013937A JP3948965B2 (ja) | 2001-03-01 | 2002-01-23 | 多点計測厚み計 |
JPJP-P-2002-00013937 | 2002-01-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020070824A true KR20020070824A (ko) | 2002-09-11 |
KR100491019B1 KR100491019B1 (ko) | 2005-05-24 |
Family
ID=26610434
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2002-0010420A Expired - Lifetime KR100491019B1 (ko) | 2001-03-01 | 2002-02-27 | 다점계측 두께 측정계 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP3948965B2 (ko) |
KR (1) | KR100491019B1 (ko) |
CN (1) | CN1223827C (ko) |
TW (1) | TWI272371B (ko) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10307356A1 (de) * | 2003-02-21 | 2004-09-16 | Sikora Ag | Verfahren und Vorrichtung zur Bestimmung der Dicke der Isolation eines Flachkabels in Bereichen der metallischen Leiterbahnen |
JP2006170883A (ja) * | 2004-12-17 | 2006-06-29 | Toshiba Corp | 厚さプロファイル測定装置 |
JP2009098095A (ja) * | 2007-10-19 | 2009-05-07 | Yasuto Ioka | 電離箱型x線異物検出装置および筒状電離箱 |
KR100921417B1 (ko) * | 2007-12-17 | 2009-10-14 | 한국원자력연구원 | 단일 지점 동위원소 방사선원을 이용한 다면적 두께 측정장치 및 측정 방법 |
JP5847674B2 (ja) * | 2012-09-10 | 2016-01-27 | 株式会社東芝 | X線厚さ計 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5890112A (ja) * | 1981-11-26 | 1983-05-28 | Toshiba Corp | 放射線厚さ計 |
JPS60230008A (ja) * | 1984-04-28 | 1985-11-15 | Toshiba Corp | 放射線厚さ計 |
FR2704643B1 (fr) * | 1993-04-26 | 1995-06-23 | Lorraine Laminage | Procede et dispositf d'etalonnage pour un ensemble de mesure du profil transversal d'epaisseur d'un produit plat. |
-
2002
- 2002-01-23 JP JP2002013937A patent/JP3948965B2/ja not_active Expired - Lifetime
- 2002-02-25 TW TW091103292A patent/TWI272371B/zh not_active IP Right Cessation
- 2002-02-27 KR KR10-2002-0010420A patent/KR100491019B1/ko not_active Expired - Lifetime
- 2002-02-28 CN CNB02119825XA patent/CN1223827C/zh not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP3948965B2 (ja) | 2007-07-25 |
JP2002328016A (ja) | 2002-11-15 |
TWI272371B (en) | 2007-02-01 |
KR100491019B1 (ko) | 2005-05-24 |
CN1378067A (zh) | 2002-11-06 |
CN1223827C (zh) | 2005-10-19 |
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