KR20020063576A - 탁도계 어레이 시스템 - Google Patents

탁도계 어레이 시스템 Download PDF

Info

Publication number
KR20020063576A
KR20020063576A KR1020027006296A KR20027006296A KR20020063576A KR 20020063576 A KR20020063576 A KR 20020063576A KR 1020027006296 A KR1020027006296 A KR 1020027006296A KR 20027006296 A KR20027006296 A KR 20027006296A KR 20020063576 A KR20020063576 A KR 20020063576A
Authority
KR
South Korea
Prior art keywords
light
light source
array system
sample
optical fiber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1020027006296A
Other languages
English (en)
Korean (ko)
Inventor
배네지아심케이.
Original Assignee
하크 컴퍼니
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 하크 컴퍼니 filed Critical 하크 컴퍼니
Publication of KR20020063576A publication Critical patent/KR20020063576A/ko
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
KR1020027006296A 1999-11-19 2000-11-13 탁도계 어레이 시스템 Ceased KR20020063576A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/444,061 1999-11-19
US09/444,061 US6307630B1 (en) 1999-11-19 1999-11-19 Turbidimeter array system
PCT/US2000/031153 WO2001036940A2 (en) 1999-11-19 2000-11-13 Turbidimeter array system

Publications (1)

Publication Number Publication Date
KR20020063576A true KR20020063576A (ko) 2002-08-03

Family

ID=23763327

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020027006296A Ceased KR20020063576A (ko) 1999-11-19 2000-11-13 탁도계 어레이 시스템

Country Status (7)

Country Link
US (2) US6307630B1 (enExample)
EP (1) EP1230534A2 (enExample)
JP (1) JP2003515124A (enExample)
KR (1) KR20020063576A (enExample)
AU (1) AU772363B2 (enExample)
CA (1) CA2391979C (enExample)
WO (1) WO2001036940A2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100903133B1 (ko) * 2007-12-17 2009-06-16 한국전자통신연구원 광공동을 이용한 고감도 혼탁도 센서 및 센싱 방법

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7530877B1 (en) 1999-06-03 2009-05-12 Micron Technology, Inc. Semiconductor processor systems, a system configured to provide a semiconductor workpiece process fluid
US7180591B1 (en) * 1999-06-03 2007-02-20 Micron Technology, Inc Semiconductor processors, sensors, semiconductor processing systems, semiconductor workpiece processing methods, and turbidity monitoring methods
US6290576B1 (en) 1999-06-03 2001-09-18 Micron Technology, Inc. Semiconductor processors, sensors, and semiconductor processing systems
US6894778B2 (en) * 2002-04-23 2005-05-17 Hach Company Low detection limit turbidimeter
DE10225842A1 (de) * 2002-06-04 2003-12-24 Zeiss Carl Smt Ag Verfahren und Vorrichtung zur Bestimmung der Strahlungsbeständigkeit eines optischen Materials
CA2391641A1 (fr) * 2002-06-28 2003-12-28 Robert Longin Plateforme robotisee de cultures cellulaires en batteries de reacteurs miniaturises, equipee d'un systeme de mesure en temps reel de la turbidite cellulaire ou toutes autres proprietes optiques
AU2003264805A1 (en) * 2002-10-18 2004-05-04 Brian David Bissett Automated kinetci solubility assay apparatus and method
US20040083798A1 (en) * 2002-11-05 2004-05-06 Sadar Michael J. Detection of filter breakthrough
US7099012B1 (en) * 2003-03-13 2006-08-29 Turner Designs, Inc. In-line spectrometer
US20060055927A1 (en) * 2004-09-16 2006-03-16 Rosemount Analytical Inc. Turbidity sensor
US20060061765A1 (en) * 2004-09-16 2006-03-23 Behzad Rezvani Turbidity sensor with improved noise rejection
US7470917B1 (en) 2004-12-15 2008-12-30 Turner Designs, Inc. Submersible apparatus for measuring active fluorescence
US7301158B1 (en) 2004-12-15 2007-11-27 Turner Designs, Inc. Method and apparatus for measuring active fluorescence
US8703492B2 (en) 2007-04-06 2014-04-22 Qiagen Gaithersburg, Inc. Open platform hybrid manual-automated sample processing system
US8355132B2 (en) * 2007-04-06 2013-01-15 Qiagen Gaithersburg, Inc. Sample adequacy measurement system having a plurality of sample tubes and using turbidity light scattering techniques
US8877507B2 (en) 2007-04-06 2014-11-04 Qiagen Gaithersburg, Inc. Ensuring sample adequacy using turbidity light scattering techniques
CN101809430A (zh) 2007-09-12 2010-08-18 哈赫公司 标准介质悬浮体、光学颗粒测量仪器、以及用于光学颗粒测量仪器的检定方法
JP5152803B2 (ja) * 2008-09-24 2013-02-27 倉敷紡績株式会社 液体濃度計
US7659980B1 (en) 2008-11-24 2010-02-09 Herbert Leckie Mitchell Nephelometric turbidity sensor device
US20100220315A1 (en) * 2009-02-27 2010-09-02 Beckman Coulter, Inc. Stabilized Optical System for Flow Cytometry
AU2010237532B2 (en) * 2009-04-15 2014-11-20 Biocartis Nv Optical detection system for monitoring rtPCR reaction
RU2442973C2 (ru) * 2009-10-02 2012-02-20 Закрытое акционерное общество "ИММУНОСКРИН" (ЗАО "ИММУНОСКРИН") Иммунотурбидиметрический планшетный анализатор
JP4948624B2 (ja) * 2010-05-06 2012-06-06 シャープ株式会社 濁度検知器
KR101832074B1 (ko) * 2013-09-30 2018-02-23 하흐 랑에 게엠베하 네펠로메트릭 탁도계 및 네펠로메트릭 탁도계의 시료 큐벳의 오염을 탐지하기 위한 방법
US20160370287A1 (en) * 2015-06-17 2016-12-22 Flodesign Sonics, Inc. Turbidity sensor with improved flow path

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2323991A1 (fr) * 1975-09-11 1977-04-08 Inst Nat Sante Rech Med Perfectionnements aux appareils de mesure d'absorption du rayonnement notamment les photometres
JPS5389484A (en) * 1977-01-18 1978-08-07 Toshiba Electric Equip Photo detector
JPS5960323A (ja) * 1982-09-30 1984-04-06 Toshiba Corp 測光装置
JPS5970946A (ja) * 1982-10-15 1984-04-21 Toshiba Corp 吸光度測定装置
US4509856A (en) * 1982-11-16 1985-04-09 The United States Of America As Represented By The United States Department Of Energy Rotor for centrifugal fast analyzers
JPS59178337A (ja) * 1983-03-29 1984-10-09 Toshiba Corp 自動化学分析装置
FR2558610B1 (fr) * 1984-01-23 1986-05-09 Labo Electronique Physique Procede et appareillage pour determiner l'instant d'arret d'un processus de renouvellement de liquide
US4762413A (en) * 1984-09-07 1988-08-09 Olympus Optical Co., Ltd. Method and apparatus for measuring immunological reaction with the aid of fluctuation in intensity of scattered light
US4888484A (en) * 1986-02-20 1989-12-19 Automatik Machinery Corporation Apparatus and method for spectrophotometric analysis of a material in a moving process stream
JPH02259451A (ja) * 1989-03-30 1990-10-22 Shimadzu Corp 濁度計
JPH063266A (ja) * 1992-06-24 1994-01-11 Seki Electron Kk オゾン濃度測定方法および２光路セルを用いた光吸収式オゾン濃度計
US5506679A (en) * 1994-09-08 1996-04-09 Hach Company Nephelometer instrument
JPH0915144A (ja) * 1995-07-03 1997-01-17 Toa Denpa Kogyo Kk 吸光光度計およびこの吸光光度計の温度補償方法
JPH10325797A (ja) * 1997-05-26 1998-12-08 Dainippon Screen Mfg Co Ltd 流体濃度測定装置
JPH11118715A (ja) * 1997-10-20 1999-04-30 Suido Kiko Kaisha Ltd 水質計および水質測定方法
US6111636A (en) * 1998-04-17 2000-08-29 Labsystems Oy Device for measuring optical density
ATE271422T1 (de) * 1998-05-01 2004-08-15 Hoffmann La Roche Vorrichtung zur gleichzeitigen überwachung von reaktionen, die in einer vielzahl von reaktionsgefässen stattfinden
US5912737A (en) * 1998-06-01 1999-06-15 Hach Company System for verifying the calibration of a turbidimeter

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100903133B1 (ko) * 2007-12-17 2009-06-16 한국전자통신연구원 광공동을 이용한 고감도 혼탁도 센서 및 센싱 방법

Also Published As

Publication number Publication date
JP2003515124A (ja) 2003-04-22
EP1230534A2 (en) 2002-08-14
CA2391979A1 (en) 2001-05-25
AU772363B2 (en) 2004-04-22
US20010046051A1 (en) 2001-11-29
AU1603901A (en) 2001-05-30
WO2001036940A3 (en) 2002-01-10
US6307630B1 (en) 2001-10-23
WO2001036940A2 (en) 2001-05-25
CA2391979C (en) 2006-12-19

Similar Documents

Publication Publication Date Title
KR20020063576A (ko) 탁도계 어레이 시스템
US4669878A (en) Automatic monochromator-testing system
US7332128B2 (en) Fiber-optic dissolution systems devices, and methods
US9448161B2 (en) Optical device, particularly a polarimeter, for detecting inhomogeneities in a sample
CA2322895C (en) Spectrophotometric and nephelometric detection unit
KR100288313B1 (ko) 물체 검사 방법 및 장치
SU1743371A3 (ru) Устройство дл оптического определени размеров и числа взвешенных частиц
US20090185187A1 (en) Fiber optic probe and related apparatus, systems and methods for making optics-based measurements of liquid samples
US6894778B2 (en) Low detection limit turbidimeter
JP2003515124A5 (enExample)
JPH04503864A (ja) マルチチャンネル光学モニタシステム
JPH0120371B2 (enExample)
TW200307120A (en) Multipoint measurement system and method
Naismith Membrane integrity—Direct turbidity measurement of filtrate from mf membrane modules at an operating potable water treatment plant
CA1247398A (en) Automatic monochromator-testing system
US11747200B2 (en) Optical process sensor, measuring head, measuring system comprising the two and method for calibration and/or validation
JP3045566B2 (ja) 細菌検査装置
US20050264803A1 (en) Optical apparatus for measuring absorption and fluorescence or scattering properties of a sample
JP4486805B2 (ja) 分光分析装置
JP2006266868A (ja) 吸光分析装置および吸光分析方法
SU1435953A1 (ru) Фотометр
US20040083798A1 (en) Detection of filter breakthrough
WO2023225116A1 (en) Multimonochromatic light source system for slope spectroscopy
SU1239523A1 (ru) Устройство дл анализа многокомпонентных систем
EP4172594A1 (en) A method to produce a matched pair of polarizing filters and a method and apparatus to determine the concentration of birefringent particles using a pair of polarizing filters

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20020516

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20030102

Comment text: Request for Examination of Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20040930

Patent event code: PE09021S01D

E601 Decision to refuse application
PE0601 Decision on rejection of patent

Patent event date: 20050627

Comment text: Decision to Refuse Application

Patent event code: PE06012S01D

Patent event date: 20040930

Comment text: Notification of reason for refusal

Patent event code: PE06011S01I