KR20010089494A - 에블레이션된 레이저 피쳐 형상 재생 제어 - Google Patents

에블레이션된 레이저 피쳐 형상 재생 제어 Download PDF

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Publication number
KR20010089494A
KR20010089494A KR1020017006468A KR20017006468A KR20010089494A KR 20010089494 A KR20010089494 A KR 20010089494A KR 1020017006468 A KR1020017006468 A KR 1020017006468A KR 20017006468 A KR20017006468 A KR 20017006468A KR 20010089494 A KR20010089494 A KR 20010089494A
Authority
KR
South Korea
Prior art keywords
laser
plate
feature
substrate
ablation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020017006468A
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English (en)
Korean (ko)
Inventor
케르티스 엘 슈메이커
다니엘 제이. 트레이드웰
버쓰오울드 버개드트
세르게이 브이. 고버코브
Original Assignee
스프레이그 로버트 월터
미네소타 마이닝 앤드 매뉴팩춰링 캄파니
추후보충
마이크로라스 레이저 시스템즈 게엠베하
람브다 피지크 게엠베하
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 스프레이그 로버트 월터, 미네소타 마이닝 앤드 매뉴팩춰링 캄파니, 추후보충, 마이크로라스 레이저 시스템즈 게엠베하, 람브다 피지크 게엠베하 filed Critical 스프레이그 로버트 월터
Publication of KR20010089494A publication Critical patent/KR20010089494A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/064Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
    • B23K26/066Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms by using masks

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Electromagnetism (AREA)
  • Laser Beam Processing (AREA)
  • Particle Formation And Scattering Control In Inkjet Printers (AREA)
  • Treatments Of Macromolecular Shaped Articles (AREA)
KR1020017006468A 1998-11-23 1999-03-31 에블레이션된 레이저 피쳐 형상 재생 제어 Withdrawn KR20010089494A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/198,160 US6172329B1 (en) 1998-11-23 1998-11-23 Ablated laser feature shape reproduction control
US09/198,160 1998-11-23
PCT/US1999/007066 WO2000030801A1 (en) 1998-11-23 1999-03-31 Ablated laser feature shape reproduction control

Publications (1)

Publication Number Publication Date
KR20010089494A true KR20010089494A (ko) 2001-10-06

Family

ID=22732228

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020017006468A Withdrawn KR20010089494A (ko) 1998-11-23 1999-03-31 에블레이션된 레이저 피쳐 형상 재생 제어

Country Status (9)

Country Link
US (1) US6172329B1 (enExample)
EP (1) EP1131184B1 (enExample)
JP (1) JP2002530206A (enExample)
KR (1) KR20010089494A (enExample)
CN (1) CN1326393A (enExample)
AU (1) AU3374199A (enExample)
CA (1) CA2348277C (enExample)
DE (1) DE69903973T2 (enExample)
WO (1) WO2000030801A1 (enExample)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19905571C1 (de) * 1999-02-11 2000-11-16 Bosch Gmbh Robert Verfahren zur Erzeugung definiert konischer Löcher mittels eines Laserstrahls
JP2001071168A (ja) * 1999-06-30 2001-03-21 Canon Inc レーザ加工方法、該レーザ加工方法を用いたインクジェット記録ヘッドの製造方法、該製造方法で製造されたインクジェット記録ヘッド
US6433303B1 (en) * 2000-03-31 2002-08-13 Matsushita Electric Industrial Co., Ltd. Method and apparatus using laser pulses to make an array of microcavity holes
JP4659300B2 (ja) * 2000-09-13 2011-03-30 浜松ホトニクス株式会社 レーザ加工方法及び半導体チップの製造方法
US6621044B2 (en) * 2001-01-18 2003-09-16 Anvik Corporation Dual-beam materials-processing system
US6627844B2 (en) * 2001-11-30 2003-09-30 Matsushita Electric Industrial Co., Ltd. Method of laser milling
US6816316B2 (en) * 2002-02-12 2004-11-09 Visx, Incorporated Smoothing laser beam integration using optical element motion
ES2285634T3 (es) 2002-03-12 2007-11-16 Hamamatsu Photonics K. K. Metodo para dividir un siustrato.
EP2272618B1 (en) 2002-03-12 2015-10-07 Hamamatsu Photonics K.K. Method of cutting object to be processed
TWI326626B (en) * 2002-03-12 2010-07-01 Hamamatsu Photonics Kk Laser processing method
US20040076376A1 (en) * 2002-10-17 2004-04-22 Pate Michael A. Optical fiber coupler and method of fabrication
TWI520269B (zh) * 2002-12-03 2016-02-01 濱松赫德尼古斯股份有限公司 Cutting method of semiconductor substrate
US7846152B2 (en) 2004-03-24 2010-12-07 Amo Manufacturing Usa, Llc. Calibrating laser beam position and shape using an image capture device
FR2852250B1 (fr) * 2003-03-11 2009-07-24 Jean Luc Jouvin Fourreau de protection pour canule, un ensemble d'injection comportant un tel fourreau et aiguille equipee d'un tel fourreau
EP1609559B1 (en) * 2003-03-12 2007-08-08 Hamamatsu Photonics K. K. Laser beam machining method
US20040199199A1 (en) * 2003-04-02 2004-10-07 Scimed Life Systems, Inc. Filter and method of making a filter
US7115211B2 (en) * 2003-08-13 2006-10-03 Tokyo Electron Limited Endpoint detection using laser interferometry
US20050047892A1 (en) * 2003-08-29 2005-03-03 Bremner Ronald Dean Laser cut apertures for thread forming fasteners
US7291805B2 (en) * 2003-10-30 2007-11-06 The Regents Of The University Of California Target isolation system, high power laser and laser peening method and system using same
EP1528645B1 (en) * 2003-10-30 2011-02-16 Metal Improvement Company, LLC. Relay telescope, laser amplifier, and laser peening method and system using same
US7110171B2 (en) * 2003-10-30 2006-09-19 Metal Improvement Company, Llc Relay telescope including baffle, and high power laser amplifier utilizing the same
US20060011617A1 (en) * 2004-07-13 2006-01-19 Ricardo Covarrubias Automated laser cutting of optical lenses
US7668364B2 (en) * 2005-04-26 2010-02-23 Hitachi Via Mechanics, Ltd. Inspection method and apparatus for partially drilled microvias
JP2007118585A (ja) * 2005-09-30 2007-05-17 Brother Ind Ltd ノズルプレートの製造方法及び液滴噴射装置の製造方法
US8624157B2 (en) 2006-05-25 2014-01-07 Electro Scientific Industries, Inc. Ultrashort laser pulse wafer scribing
US20070282312A1 (en) * 2006-05-31 2007-12-06 Sie Ag Surgical Instrument Engineering Ophthalmologic apparatus
US20080013182A1 (en) * 2006-07-17 2008-01-17 Joerg Ferber Two-stage laser-beam homogenizer
US7615722B2 (en) 2006-07-17 2009-11-10 Coherent, Inc. Amorphous silicon crystallization using combined beams from optically pumped semiconductor lasers
KR102209964B1 (ko) * 2013-03-13 2021-02-02 삼성디스플레이 주식회사 피코초 레이저 가공 장치
JP6324151B2 (ja) * 2014-03-26 2018-05-16 住友重機械工業株式会社 レーザ加工装置及びレーザ加工方法
JP5923132B2 (ja) * 2014-04-30 2016-05-24 住友電気工業株式会社 レーザ加工装置用の偏光状態変換素子
WO2021168213A1 (en) * 2020-02-19 2021-08-26 Elemental Scientific Lasers, Llc Variable beam size via homqgenizer movement
JP7707125B2 (ja) * 2022-05-02 2025-07-14 三菱重工業株式会社 レーザ加工装置

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4491383A (en) * 1982-09-20 1985-01-01 Centro Ricerche Fiat S.P.A. Device for modifying and uniforming the distribution of the intensity of a power laser beam
DE3317022A1 (de) * 1983-05-10 1984-11-15 W.C. Heraeus Gmbh, 6450 Hanau Materialbearbeitungsanlage
US4734558A (en) * 1983-05-16 1988-03-29 Nec Corporation Laser machining apparatus with controllable mask
US4626652A (en) * 1985-03-21 1986-12-02 Honeywell Inc. Method and means of removing claddings from optical fibers
US4733944A (en) 1986-01-24 1988-03-29 Xmr, Inc. Optical beam integration system
US4923772A (en) 1986-10-29 1990-05-08 Kirch Steven J High energy laser mask and method of making same
US4908493A (en) * 1988-05-31 1990-03-13 Midwest Research Institute Method and apparatus for optimizing the efficiency and quality of laser material processing
US4940881A (en) 1989-09-28 1990-07-10 Tamarack Scientific Co., Inc. Method and apparatus for effecting selective ablation of a coating from a substrate, and controlling the wall angle of coating edge portions
US5057664A (en) * 1989-10-20 1991-10-15 Electro Scientific Industries, Inc. Method and apparatus for laser processing a target material to provide a uniformly smooth, continuous trim profile
US5091626A (en) * 1990-02-02 1992-02-25 Hadassah Medical Organization Method for the ablative reshaping of material surfaces
JP2599513B2 (ja) 1990-06-25 1997-04-09 インターナショナル・ビジネス・マシーンズ・コーポレイション アブレーション・マスク
JPH04270091A (ja) * 1991-01-18 1992-09-25 Nissan Motor Co Ltd レーザ加工装置
JPH05185254A (ja) * 1991-11-20 1993-07-27 Nikon Corp レーザ加工装置
DE4220705C2 (de) 1992-06-24 2003-03-13 Lambda Physik Ag Vorrichtung zum Aufteilen eines Lichtstrahles in homogene Teilstrahlen
JPH06182574A (ja) * 1992-12-22 1994-07-05 Hoya Corp レーザ加工機
US5378137A (en) 1993-05-10 1995-01-03 Hewlett-Packard Company Mask design for forming tapered inkjet nozzles
US5610733A (en) 1994-02-28 1997-03-11 Digital Optics Corporation Beam-homogenizer
WO1997006462A1 (en) * 1995-08-09 1997-02-20 Minnesota Mining And Manufacturing Company Rotating optical system for laser machining apparatus

Also Published As

Publication number Publication date
EP1131184A1 (en) 2001-09-12
WO2000030801A1 (en) 2000-06-02
US6172329B1 (en) 2001-01-09
DE69903973T2 (de) 2003-07-17
AU3374199A (en) 2000-06-13
EP1131184B1 (en) 2002-11-13
JP2002530206A (ja) 2002-09-17
CA2348277C (en) 2007-10-16
CA2348277A1 (en) 2000-06-02
DE69903973D1 (de) 2002-12-19
CN1326393A (zh) 2001-12-12

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20010523

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid