KR20010015630A - 결함있는 전자 장치 식별 시스템 - Google Patents
결함있는 전자 장치 식별 시스템 Download PDFInfo
- Publication number
- KR20010015630A KR20010015630A KR1020007003253A KR20007003253A KR20010015630A KR 20010015630 A KR20010015630 A KR 20010015630A KR 1020007003253 A KR1020007003253 A KR 1020007003253A KR 20007003253 A KR20007003253 A KR 20007003253A KR 20010015630 A KR20010015630 A KR 20010015630A
- Authority
- KR
- South Korea
- Prior art keywords
- defective
- contacts
- information
- machine
- inspection
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Wire Bonding (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/SG1997/000048 WO1999017354A1 (fr) | 1997-09-30 | 1997-09-30 | Systeme d'identification de dispositifs electroniques defectueux |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20010015630A true KR20010015630A (ko) | 2001-02-26 |
Family
ID=20429570
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020007003253A KR20010015630A (ko) | 1997-09-30 | 1997-09-30 | 결함있는 전자 장치 식별 시스템 |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP1029348A1 (fr) |
| JP (1) | JP2001518631A (fr) |
| KR (1) | KR20010015630A (fr) |
| AU (1) | AU4975397A (fr) |
| WO (1) | WO1999017354A1 (fr) |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4255851A (en) * | 1978-12-06 | 1981-03-17 | Western Electric Company, Inc. | Method and apparatus for indelibly marking articles during a manufacturing process |
| US4801869A (en) * | 1987-04-27 | 1989-01-31 | International Business Machines Corporation | Semiconductor defect monitor for diagnosing processing-induced defects |
| JPH0245734A (ja) * | 1988-08-05 | 1990-02-15 | Mitsubishi Heavy Ind Ltd | 自動組織解析処理装置 |
| US5504438A (en) * | 1991-09-10 | 1996-04-02 | Photon Dynamics, Inc. | Testing method for imaging defects in a liquid crystal display substrate |
| WO1995016923A1 (fr) * | 1993-12-16 | 1995-06-22 | Philips Electronics N.V. | Controle separe des courants de repos du trajet de signal et du trajet de polarisation dans un circuit integre |
| JPH07270335A (ja) * | 1994-03-29 | 1995-10-20 | Sekisui Chem Co Ltd | 撮像式検査方法および装置 |
| JPH08137093A (ja) * | 1994-09-16 | 1996-05-31 | Toshiba Corp | 欠陥検査装置 |
-
1997
- 1997-09-30 JP JP2000514321A patent/JP2001518631A/ja active Pending
- 1997-09-30 KR KR1020007003253A patent/KR20010015630A/ko not_active Application Discontinuation
- 1997-09-30 EP EP97912629A patent/EP1029348A1/fr not_active Withdrawn
- 1997-09-30 AU AU49753/97A patent/AU4975397A/en not_active Abandoned
- 1997-09-30 WO PCT/SG1997/000048 patent/WO1999017354A1/fr not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| JP2001518631A (ja) | 2001-10-16 |
| WO1999017354A1 (fr) | 1999-04-08 |
| AU4975397A (en) | 1999-04-23 |
| EP1029348A1 (fr) | 2000-08-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |