KR20000068510A - 슬루잉 제어 수단을 갖는 출력 스테이지 - Google Patents
슬루잉 제어 수단을 갖는 출력 스테이지 Download PDFInfo
- Publication number
- KR20000068510A KR20000068510A KR1019997001927A KR19997001927A KR20000068510A KR 20000068510 A KR20000068510 A KR 20000068510A KR 1019997001927 A KR1019997001927 A KR 1019997001927A KR 19997001927 A KR19997001927 A KR 19997001927A KR 20000068510 A KR20000068510 A KR 20000068510A
- Authority
- KR
- South Korea
- Prior art keywords
- field effect
- effect transistor
- gate
- terminal
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00346—Modifications for eliminating interference or parasitic voltages or currents
- H03K19/00361—Modifications for eliminating interference or parasitic voltages or currents in field effect transistor circuits
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
- H03K17/161—Modifications for eliminating interference voltages or currents in field-effect transistor switches
- H03K17/162—Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
- H03K17/163—Soft switching
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Electronic Switches (AREA)
- Logic Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP97401630 | 1997-07-08 | ||
| EP97401630.5 | 1997-07-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20000068510A true KR20000068510A (ko) | 2000-11-25 |
Family
ID=8229803
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019997001927A Ceased KR20000068510A (ko) | 1997-07-08 | 1998-05-18 | 슬루잉 제어 수단을 갖는 출력 스테이지 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6069509A (https=) |
| EP (1) | EP0925648B1 (https=) |
| JP (1) | JP4160127B2 (https=) |
| KR (1) | KR20000068510A (https=) |
| DE (1) | DE69827350T2 (https=) |
| WO (1) | WO1999003206A1 (https=) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69827368T2 (de) * | 1997-12-23 | 2005-10-27 | Koninklijke Philips Electronics N.V. | Ausgangsstufe mit selbstregelnder anstiegszeitsteuerung |
| US6420924B1 (en) * | 1998-09-09 | 2002-07-16 | Ip-First L.L.C. | Slew-controlled split-voltage output driver |
| US6255874B1 (en) * | 1999-07-28 | 2001-07-03 | National Semiconductor Corporation | Transistor channel width and slew rate correction circuit and method |
| US6535035B2 (en) * | 2000-11-17 | 2003-03-18 | Texas Instruments Incorporated | Driver and method for switching applications |
| US6489829B1 (en) * | 2001-04-12 | 2002-12-03 | Advanced Analogic Technologies, Inc. | Multiple-stage control circuit to control rush current in a MOSFET load switch |
| US7820030B2 (en) * | 2003-04-16 | 2010-10-26 | Handylab, Inc. | System and method for electrochemical detection of biological compounds |
| US7236021B2 (en) * | 2005-01-31 | 2007-06-26 | Texas Instruments Incorporated | Method of controlling slope and dead time in an integrated output buffer with inductive load |
| US8115508B2 (en) * | 2007-01-09 | 2012-02-14 | International Business Machines Corporation | Structure for time based driver output transition (slew) rate compensation |
| US7432730B2 (en) * | 2007-01-09 | 2008-10-07 | International Business Machines Corporation | Time based driver output transition (slew) rate compensation |
| US8768679B2 (en) * | 2010-09-30 | 2014-07-01 | International Business Machines Corporation | System and method for efficient modeling of NPskew effects on static timing tests |
| US8585110B2 (en) | 2011-12-31 | 2013-11-19 | National Oilwell Varco, L.P. | Internal pipe gripping tool |
| CN104471858B (zh) * | 2012-10-22 | 2018-02-27 | 大陆泰密克微电子有限责任公司 | 用于切换半导体开关的方法和电路装置 |
| FR3084540B1 (fr) * | 2018-07-24 | 2021-04-30 | Valeo Systemes De Controle Moteur | Bras de convertisseur de tension |
| US10848148B2 (en) * | 2018-11-14 | 2020-11-24 | Texas Instruments Incorporated | Motor drive switch control with adaptive slew rate monitoring |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3708499A1 (de) * | 1987-03-16 | 1988-10-20 | Sgs Halbleiterbauelemente Gmbh | Digitale gegentakt-treiberschaltung |
| US5013940A (en) * | 1989-11-03 | 1991-05-07 | Cypress Semiconductor Corporation | Multi stage slew control for an IC output circuit |
| JP3014164B2 (ja) * | 1991-05-15 | 2000-02-28 | 沖電気工業株式会社 | 出力バッファ回路 |
| JPH05242674A (ja) * | 1992-02-28 | 1993-09-21 | Hitachi Ltd | 半導体集積回路装置 |
| US5214320A (en) * | 1992-06-12 | 1993-05-25 | Smos Systems, Inc. | System and method for reducing ground bounce in integrated circuit output buffers |
| GB2289808A (en) * | 1994-05-19 | 1995-11-29 | Motorola Gmbh | CMOS driver with programmable switching speed |
| US5568081A (en) * | 1995-06-07 | 1996-10-22 | Cypress Semiconductor, Corporation | Variable slew control for output buffers |
| US5877647A (en) * | 1995-10-16 | 1999-03-02 | Texas Instruments Incorporated | CMOS output buffer with slew rate control |
-
1998
- 1998-05-18 KR KR1019997001927A patent/KR20000068510A/ko not_active Ceased
- 1998-05-18 JP JP54209898A patent/JP4160127B2/ja not_active Expired - Fee Related
- 1998-05-18 DE DE69827350T patent/DE69827350T2/de not_active Expired - Lifetime
- 1998-05-18 EP EP98917537A patent/EP0925648B1/en not_active Expired - Lifetime
- 1998-05-18 WO PCT/IB1998/000749 patent/WO1999003206A1/en not_active Ceased
- 1998-07-07 US US09/111,612 patent/US6069509A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP0925648B1 (en) | 2004-11-03 |
| DE69827350D1 (de) | 2004-12-09 |
| US6069509A (en) | 2000-05-30 |
| DE69827350T2 (de) | 2005-10-20 |
| JP4160127B2 (ja) | 2008-10-01 |
| JP2001500341A (ja) | 2001-01-09 |
| EP0925648A1 (en) | 1999-06-30 |
| WO1999003206A1 (en) | 1999-01-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| R18 | Changes to party contact information recorded |
Free format text: ST27 STATUS EVENT CODE: A-3-3-R10-R18-OTH-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |