KR20000023048A - 반도체집적회로 및 그의 테스트방법 - Google Patents

반도체집적회로 및 그의 테스트방법 Download PDF

Info

Publication number
KR20000023048A
KR20000023048A KR1019990038512A KR19990038512A KR20000023048A KR 20000023048 A KR20000023048 A KR 20000023048A KR 1019990038512 A KR1019990038512 A KR 1019990038512A KR 19990038512 A KR19990038512 A KR 19990038512A KR 20000023048 A KR20000023048 A KR 20000023048A
Authority
KR
South Korea
Prior art keywords
signal
circuit
analog
output
digital
Prior art date
Application number
KR1019990038512A
Other languages
English (en)
Korean (ko)
Inventor
토미나가마사시
Original Assignee
가네꼬 히사시
닛본 덴기 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가네꼬 히사시, 닛본 덴기 가부시끼가이샤 filed Critical 가네꼬 히사시
Publication of KR20000023048A publication Critical patent/KR20000023048A/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
KR1019990038512A 1998-09-14 1999-09-10 반도체집적회로 및 그의 테스트방법 KR20000023048A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP10-259571 1998-09-14
JP25957198A JP3189802B2 (ja) 1998-09-14 1998-09-14 半導体集積回路

Publications (1)

Publication Number Publication Date
KR20000023048A true KR20000023048A (ko) 2000-04-25

Family

ID=17335981

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019990038512A KR20000023048A (ko) 1998-09-14 1999-09-10 반도체집적회로 및 그의 테스트방법

Country Status (3)

Country Link
JP (1) JP3189802B2 (zh)
KR (1) KR20000023048A (zh)
CN (1) CN1248101A (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6944808B2 (en) * 2001-05-12 2005-09-13 Advantest Corp. Method of evaluating core based system-on-a-chip
JP4760536B2 (ja) * 2006-05-29 2011-08-31 ミツミ電機株式会社 集積回路及びその試験方法
CN101903784A (zh) * 2007-12-21 2010-12-01 索尼公司 模拟扫描电路、模拟触发器和数据处理设备
CN102565681A (zh) * 2011-12-05 2012-07-11 北京创毅视讯科技有限公司 混合信号芯片中测试模拟电路的装置和方法
CN103901338B (zh) * 2014-03-31 2017-01-18 西安紫光国芯半导体有限公司 精确测量和报告芯片内两种信号的时序关系的方法及装置
CN115078968B (zh) * 2022-06-15 2024-06-25 上海类比半导体技术有限公司 芯片测试电路、自测试芯片及芯片测试系统

Also Published As

Publication number Publication date
CN1248101A (zh) 2000-03-22
JP3189802B2 (ja) 2001-07-16
JP2000088923A (ja) 2000-03-31

Similar Documents

Publication Publication Date Title
JP2003332443A (ja) 半導体集積回路とその設計支援装置およびテスト方法
KR20000023048A (ko) 반도체집적회로 및 그의 테스트방법
JP2002202348A (ja) 論理集積回路のテスト回路およびその方法
JP5167975B2 (ja) 半導体装置
US6813579B1 (en) Apparatus and method for test mode control
US7237168B2 (en) Design for test of analog module systems
US7279996B2 (en) Method of functionality testing for a ring oscillator
JP4610919B2 (ja) 半導体集積回路装置
JPH04221781A (ja) 検査方法及び回路
JP3003781B2 (ja) 検査容易化設計方法、バスエラー回避設計方法及び集積回路
KR100230411B1 (ko) 반도체 장치
US12135351B2 (en) DFT architecture for analog circuits
JPH09211076A (ja) 回路基板検査装置および半導体回路
JP2000338188A (ja) 半導体集積回路の試験回路
JP4351786B2 (ja) 集積回路
JPH1123660A (ja) 集積回路のテスト容易化回路
JP2004279348A (ja) テスト容易化回路、および検査方法
JP2001343432A (ja) バウンダリスキャン回路およびその方法
JP2008060819A (ja) 集積回路の試験方法
JP2006003108A (ja) 半導体検査装置
KR20060053978A (ko) 반도체 집적회로
JP2004191149A (ja) スキャンテスト回路およびテスト方法
JPH03116943A (ja) 検査機能を有する半導体集積回路
JPH10339762A (ja) ディジタル論理回路のテスト回路
JPH0949863A (ja) 半導体集積回路装置の故障検査方法

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E902 Notification of reason for refusal
E601 Decision to refuse application