KR102626137B1 - 3-차원 수직 nor 플래시 박막 트랜지스터 스트링들 - Google Patents

3-차원 수직 nor 플래시 박막 트랜지스터 스트링들 Download PDF

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Publication number
KR102626137B1
KR102626137B1 KR1020227033231A KR20227033231A KR102626137B1 KR 102626137 B1 KR102626137 B1 KR 102626137B1 KR 1020227033231 A KR1020227033231 A KR 1020227033231A KR 20227033231 A KR20227033231 A KR 20227033231A KR 102626137 B1 KR102626137 B1 KR 102626137B1
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KR
South Korea
Prior art keywords
memory
vertical
string
thin film
strings
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KR1020227033231A
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English (en)
Korean (ko)
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KR20220133333A (ko
Inventor
일리 하라리
티안홍 얀
Original Assignee
선라이즈 메모리 코포레이션
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Priority claimed from US16/107,732 external-priority patent/US10249370B2/en
Application filed by 선라이즈 메모리 코포레이션 filed Critical 선라이즈 메모리 코포레이션
Publication of KR20220133333A publication Critical patent/KR20220133333A/ko
Application granted granted Critical
Publication of KR102626137B1 publication Critical patent/KR102626137B1/ko

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B43/00EEPROM devices comprising charge-trapping gate insulators
    • H10B43/20EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B43/00EEPROM devices comprising charge-trapping gate insulators
    • H10B43/10EEPROM devices comprising charge-trapping gate insulators characterised by the top-view layout
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B43/00EEPROM devices comprising charge-trapping gate insulators
    • H10B43/30EEPROM devices comprising charge-trapping gate insulators characterised by the memory core region
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B43/00EEPROM devices comprising charge-trapping gate insulators
    • H10B43/50EEPROM devices comprising charge-trapping gate insulators characterised by the boundary region between the core and peripheral circuit regions

Landscapes

  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Thin Film Transistor (AREA)
KR1020227033231A 2018-02-02 2019-01-18 3-차원 수직 nor 플래시 박막 트랜지스터 스트링들 KR102626137B1 (ko)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US201862625818P 2018-02-02 2018-02-02
US62/625,818 2018-02-02
US201862630214P 2018-02-13 2018-02-13
US62/630,214 2018-02-13
US16/107,732 2018-08-21
US16/107,732 US10249370B2 (en) 2015-09-30 2018-08-21 Three-dimensional vertical NOR flash thing-film transistor strings
KR1020207025160A KR102448489B1 (ko) 2018-02-02 2019-01-18 3-차원 수직 nor 플래시 박막 트랜지스터 스트링들
PCT/US2019/014319 WO2019152226A1 (en) 2018-02-02 2019-01-18 Three-dimensional vertical nor flash thin-film transistor strings

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020207025160A Division KR102448489B1 (ko) 2018-02-02 2019-01-18 3-차원 수직 nor 플래시 박막 트랜지스터 스트링들

Publications (2)

Publication Number Publication Date
KR20220133333A KR20220133333A (ko) 2022-10-04
KR102626137B1 true KR102626137B1 (ko) 2024-01-18

Family

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Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020227033231A KR102626137B1 (ko) 2018-02-02 2019-01-18 3-차원 수직 nor 플래시 박막 트랜지스터 스트링들
KR1020207025160A KR102448489B1 (ko) 2018-02-02 2019-01-18 3-차원 수직 nor 플래시 박막 트랜지스터 스트링들

Family Applications After (1)

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KR1020207025160A KR102448489B1 (ko) 2018-02-02 2019-01-18 3-차원 수직 nor 플래시 박막 트랜지스터 스트링들

Country Status (4)

Country Link
JP (2) JP7141462B2 (zh)
KR (2) KR102626137B1 (zh)
CN (1) CN111937147A (zh)
WO (1) WO2019152226A1 (zh)

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KR102602494B1 (ko) * 2020-05-28 2023-11-14 타이완 세미콘덕터 매뉴팩쳐링 컴퍼니 리미티드 3차원 메모리 디바이스 및 방법
US11695073B2 (en) 2020-05-29 2023-07-04 Taiwan Semiconductor Manufacturing Co., Ltd. Memory array gate structures
US11710790B2 (en) 2020-05-29 2023-07-25 Taiwan Semiconductor Manufacturing Company, Ltd. Memory array channel regions
US11653500B2 (en) * 2020-06-25 2023-05-16 Taiwan Semiconductor Manufacturing Co., Ltd. Memory array contact structures
US11600520B2 (en) * 2020-06-26 2023-03-07 Taiwan Semiconductor Manufacturing Co., Ltd. Air gaps in memory array structures
US11444069B2 (en) * 2020-06-29 2022-09-13 Taiwan Semiconductor Manufacturing Co., Ltd. 3D semiconductor package including memory array
US11581337B2 (en) * 2020-06-29 2023-02-14 Taiwan Semiconductor Manufacturing Company, Ltd. Three-dimensional memory device and manufacturing method thereof
US11640974B2 (en) 2020-06-30 2023-05-02 Taiwan Semiconductor Manufacturing Co., Ltd. Memory array isolation structures
US11729987B2 (en) 2020-06-30 2023-08-15 Taiwan Semiconductor Manufacturing Company, Ltd. Memory array source/drain electrode structures
US11963363B2 (en) * 2020-07-14 2024-04-16 Taiwan Semiconductor Manufacturing Company, Ltd. Memory device and method for fabricating the same
US11903214B2 (en) 2020-07-16 2024-02-13 Taiwan Semiconductor Manufacturing Co., Ltd. Three-dimensional ferroelectric random access memory devices and methods of forming
US11527553B2 (en) 2020-07-30 2022-12-13 Taiwan Semiconductor Manufacturing Co., Ltd. Three-dimensional memory device and method
US11968833B2 (en) * 2021-01-15 2024-04-23 Macronix International Co., Ltd. Memory device with vertically separated channels
US11587931B2 (en) 2021-03-03 2023-02-21 Micron Technology, Inc. Multiplexor for a semiconductor device
US11716856B2 (en) 2021-03-05 2023-08-01 Taiwan Semiconductor Manufacturing Co., Ltd. Three-dimensional memory device and method
CN112909012B (zh) * 2021-03-08 2023-09-22 中国科学院微电子研究所 Nor型存储器件及其制造方法及包括存储器件的电子设备
CN117352490A (zh) * 2022-06-21 2024-01-05 长鑫存储技术有限公司 半导体结构及其制造方法、存储芯片、电子设备
CN114927527B (zh) * 2022-07-20 2022-11-04 合肥晶合集成电路股份有限公司 闪存器件、存储单元及其制造方法

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JP2010130016A (ja) 2008-11-25 2010-06-10 Samsung Electronics Co Ltd 3次元半導体装置及びその動作方法
US20120182801A1 (en) 2011-01-19 2012-07-19 Macronix International Co., Ltd. Memory Architecture of 3D NOR Array
US20160086970A1 (en) 2014-09-23 2016-03-24 Haibing Peng Three-dimensional non-volatile nor-type flash memory
US20170092371A1 (en) 2015-09-30 2017-03-30 Eli Harari Capacitive-coupled non-volatile thin-film transistor strings in three dimensional arrays
US20170148517A1 (en) 2015-11-25 2017-05-25 Eli Harari Three-dimensional vertical nor flash thin film transistor strings

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Publication number Priority date Publication date Assignee Title
JP2010130016A (ja) 2008-11-25 2010-06-10 Samsung Electronics Co Ltd 3次元半導体装置及びその動作方法
US20120182801A1 (en) 2011-01-19 2012-07-19 Macronix International Co., Ltd. Memory Architecture of 3D NOR Array
US20160086970A1 (en) 2014-09-23 2016-03-24 Haibing Peng Three-dimensional non-volatile nor-type flash memory
US20170092371A1 (en) 2015-09-30 2017-03-30 Eli Harari Capacitive-coupled non-volatile thin-film transistor strings in three dimensional arrays
US20170148517A1 (en) 2015-11-25 2017-05-25 Eli Harari Three-dimensional vertical nor flash thin film transistor strings

Also Published As

Publication number Publication date
JP2021512494A (ja) 2021-05-13
KR102448489B1 (ko) 2022-09-30
KR20200112976A (ko) 2020-10-05
JP2022172352A (ja) 2022-11-15
KR20220133333A (ko) 2022-10-04
CN111937147A (zh) 2020-11-13
JP7141462B2 (ja) 2022-09-22
WO2019152226A1 (en) 2019-08-08

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