KR102557374B1 - 어댑터의 시간 매개 변수의 테스트 방법 및 시스템, 컴퓨터 저장 매체 - Google Patents

어댑터의 시간 매개 변수의 테스트 방법 및 시스템, 컴퓨터 저장 매체 Download PDF

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Publication number
KR102557374B1
KR102557374B1 KR1020217003905A KR20217003905A KR102557374B1 KR 102557374 B1 KR102557374 B1 KR 102557374B1 KR 1020217003905 A KR1020217003905 A KR 1020217003905A KR 20217003905 A KR20217003905 A KR 20217003905A KR 102557374 B1 KR102557374 B1 KR 102557374B1
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KR
South Korea
Prior art keywords
interrupt
adapter
falling edge
preset
result
Prior art date
Application number
KR1020217003905A
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English (en)
Korean (ko)
Other versions
KR20210030425A (ko
Inventor
천 톈
Original Assignee
광동 오포 모바일 텔레커뮤니케이션즈 코포레이션 리미티드
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Publication date
Application filed by 광동 오포 모바일 텔레커뮤니케이션즈 코포레이션 리미티드 filed Critical 광동 오포 모바일 텔레커뮤니케이션즈 코포레이션 리미티드
Publication of KR20210030425A publication Critical patent/KR20210030425A/ko
Application granted granted Critical
Publication of KR102557374B1 publication Critical patent/KR102557374B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
    • H02J7/00032—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries characterised by data exchange
    • H02J7/00036—Charger exchanging data with battery
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
    • H02J7/00032—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries characterised by data exchange
    • H02J7/00045—Authentication, i.e. circuits for checking compatibility between one component, e.g. a battery or a battery charger, and another component, e.g. a power source
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J2207/00—Indexing scheme relating to details of circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
    • H02J2207/30—Charge provided using DC bus or data bus of a computer

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Debugging And Monitoring (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Charge And Discharge Circuits For Batteries Or The Like (AREA)
  • Dc Digital Transmission (AREA)
KR1020217003905A 2018-09-30 2018-09-30 어댑터의 시간 매개 변수의 테스트 방법 및 시스템, 컴퓨터 저장 매체 KR102557374B1 (ko)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2018/109218 WO2020062306A1 (zh) 2018-09-30 2018-09-30 一种指令时间的测试方法和系统、及计算机存储介质

Publications (2)

Publication Number Publication Date
KR20210030425A KR20210030425A (ko) 2021-03-17
KR102557374B1 true KR102557374B1 (ko) 2023-07-20

Family

ID=69950978

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020217003905A KR102557374B1 (ko) 2018-09-30 2018-09-30 어댑터의 시간 매개 변수의 테스트 방법 및 시스템, 컴퓨터 저장 매체

Country Status (6)

Country Link
US (1) US11614484B2 (zh)
EP (1) EP3709036B1 (zh)
JP (1) JP7223835B2 (zh)
KR (1) KR102557374B1 (zh)
CN (1) CN111263891B (zh)
WO (1) WO2020062306A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115297026A (zh) * 2022-08-29 2022-11-04 广东美的智能科技有限公司 通信系统及其检测方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012119401A1 (zh) * 2011-08-19 2012-09-13 华为技术有限公司 一种信号时序的测试方法及装置
US20170194798A1 (en) * 2016-01-05 2017-07-06 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Quick charging method, mobile terminal, and power adapter

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02195448A (ja) * 1989-01-25 1990-08-02 Nec Corp 命令トレース装置
US6233205B1 (en) * 1996-09-17 2001-05-15 Xilinx, Inc. Built-in self test method for measuring clock to out delays
JP2000122749A (ja) * 1998-10-20 2000-04-28 Mitsubishi Electric Corp 発振停止検出装置
JP2006252015A (ja) * 2005-03-09 2006-09-21 Nec Engineering Ltd データ転送制御装置
CN201348647Y (zh) * 2009-01-16 2009-11-18 东莞市大忠电子有限公司 电源适配器测试定时报警器
CN102810003B (zh) * 2011-05-30 2015-02-18 索尼爱立信移动通讯有限公司 驱动强度的控制装置、方法及终端设备
US8996928B2 (en) 2012-04-17 2015-03-31 Qualcomm Incorporated Devices for indicating a physical layer error
JP2014050232A (ja) * 2012-08-31 2014-03-17 Nec Saitama Ltd 充電装置、充電方法及び充電プログラム
WO2016074159A1 (zh) 2014-11-11 2016-05-19 广东欧珀移动通信有限公司 通信方法、电源适配器和终端
CN106063073B (zh) * 2015-05-13 2018-09-28 广东欧珀移动通信有限公司 快速充电方法、电源适配器和移动终端
DK3142221T3 (en) 2015-05-13 2019-04-23 Guangdong Oppo Mobile Telecommunications Corp Ltd Quick charge method, power adapter and mobile terminal
CN105511581B (zh) * 2015-12-18 2018-06-29 中国人民解放军国防科学技术大学 一种基于国产飞腾处理器的电池状态控制方法
CN106537723B (zh) 2016-01-05 2019-01-25 Oppo广东移动通信有限公司 快速充电方法、移动终端和适配器
CN107508355B (zh) * 2017-09-07 2019-03-01 维沃移动通信有限公司 一种电压控制方法及充电设备
CN108521417B (zh) * 2018-03-30 2020-04-14 维沃移动通信有限公司 一种通信处理方法及移动终端

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012119401A1 (zh) * 2011-08-19 2012-09-13 华为技术有限公司 一种信号时序的测试方法及装置
US20170194798A1 (en) * 2016-01-05 2017-07-06 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Quick charging method, mobile terminal, and power adapter

Also Published As

Publication number Publication date
CN111263891B (zh) 2022-06-07
EP3709036A1 (en) 2020-09-16
JP7223835B2 (ja) 2023-02-16
US11614484B2 (en) 2023-03-28
JP2021533654A (ja) 2021-12-02
EP3709036B1 (en) 2022-11-02
KR20210030425A (ko) 2021-03-17
EP3709036A4 (en) 2021-03-17
WO2020062306A1 (zh) 2020-04-02
US20200132755A1 (en) 2020-04-30
CN111263891A (zh) 2020-06-09

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