KR102536884B1 - 반도체 막들을 증착하기 위한 방법들 - Google Patents

반도체 막들을 증착하기 위한 방법들 Download PDF

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KR102536884B1
KR102536884B1 KR1020207003769A KR20207003769A KR102536884B1 KR 102536884 B1 KR102536884 B1 KR 102536884B1 KR 1020207003769 A KR1020207003769 A KR 1020207003769A KR 20207003769 A KR20207003769 A KR 20207003769A KR 102536884 B1 KR102536884 B1 KR 102536884B1
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substrate
layer
film
gas
forming
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KR20200019764A (ko
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이 수
타카시 쿠라토미
아브게리노스 브이. 젤라토스
비카쉬 반티아
메이 창
카즈야 다이토
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어플라이드 머티어리얼스, 인코포레이티드
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/42Silicides
    • H01L21/02274
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    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/01Manufacture or treatment
    • H10D64/011Manufacture or treatment of electrodes ohmically coupled to a semiconductor
    • H10D64/0111Manufacture or treatment of electrodes ohmically coupled to a semiconductor to Group IV semiconductors
    • H10D64/0112Manufacture or treatment of electrodes ohmically coupled to a semiconductor to Group IV semiconductors using conductive layers comprising silicides
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    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/63Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
    • H10P14/6326Deposition processes
    • H10P14/6328Deposition from the gas or vapour phase
    • H10P14/6334Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • H10P14/6336Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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    • C23C16/45525Atomic layer deposition [ALD]
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45527Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
    • C23C16/45529Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations specially adapted for making a layer stack of alternating different compositions or gradient compositions
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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    • C23C16/45523Pulsed gas flow or change of composition over time
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    • C23C16/45527Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
    • C23C16/45536Use of plasma, radiation or electromagnetic fields
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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    • C23C16/45523Pulsed gas flow or change of composition over time
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    • C23C16/45527Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
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  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Electromagnetism (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Formation Of Insulating Films (AREA)
KR1020207003769A 2017-07-13 2018-07-10 반도체 막들을 증착하기 위한 방법들 Active KR102536884B1 (ko)

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US201762532335P 2017-07-13 2017-07-13
US62/532,335 2017-07-13
US16/028,855 2018-07-06
US16/028,855 US10535527B2 (en) 2017-07-13 2018-07-06 Methods for depositing semiconductor films
PCT/US2018/041379 WO2019014170A1 (en) 2017-07-13 2018-07-10 METHODS OF DEPOSITING SEMICONDUCTOR FILMS

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KR102536884B1 true KR102536884B1 (ko) 2023-05-24

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US (1) US10535527B2 (https=)
JP (1) JP7414708B2 (https=)
KR (1) KR102536884B1 (https=)
CN (1) CN110998791B (https=)
TW (1) TWI791029B (https=)
WO (1) WO2019014170A1 (https=)

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US11081358B2 (en) * 2018-07-05 2021-08-03 Applied Materials, Inc. Silicide film nucleation
US11955381B2 (en) 2020-06-22 2024-04-09 Applied Materials, Inc. Low-temperature plasma pre-clean for selective gap fill
US12191151B2 (en) * 2021-03-26 2025-01-07 Taiwan Semiconductor Manufacturing Co., Ltd. Gate-all-around transistor with reduced source/drain contact resistance
JP7715466B2 (ja) 2021-09-27 2025-07-30 東京エレクトロン株式会社 基板処理方法及び基板処理システム

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000299295A (ja) 1999-04-15 2000-10-24 Nec Corp 半導体装置の製造方法
JP2004158828A (ja) 2002-10-17 2004-06-03 Tokyo Electron Ltd 成膜方法
JP2011100962A (ja) 2009-10-09 2011-05-19 Tokyo Electron Ltd 成膜方法及びプラズマ処理装置
JP2015510547A (ja) 2012-01-27 2015-04-09 東京エレクトロン株式会社 コンフォーマル金属ケイ化物フィルムを形成する方法
JP2015124397A (ja) 2013-12-25 2015-07-06 東京エレクトロン株式会社 コンタクト層の形成方法

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5104694A (en) * 1989-04-21 1992-04-14 Nippon Telephone & Telegraph Corporation Selective chemical vapor deposition of a metallic film on the silicon surface
JPH07249681A (ja) * 1994-03-10 1995-09-26 Fujitsu Ltd 半導体装置の製造方法
US5975912A (en) * 1994-06-03 1999-11-02 Materials Research Corporation Low temperature plasma-enhanced formation of integrated circuits
JPH1167688A (ja) * 1997-08-22 1999-03-09 Nec Corp シリサイド材料とその薄膜およびシリサイド薄膜の製造方法
US5856237A (en) 1997-10-20 1999-01-05 Industrial Technology Research Institute Insitu formation of TiSi2/TiN bi-layer structures using self-aligned nitridation treatment on underlying CVD-TiSi2 layer
US6451388B1 (en) 1997-12-24 2002-09-17 Tokyo Electron Limited Method of forming titanium film by chemical vapor deposition
US6841203B2 (en) 1997-12-24 2005-01-11 Tokyo Electron Limited Method of forming titanium film by CVD
JP2000243752A (ja) * 1999-02-17 2000-09-08 Sony Corp シリコン窒化酸化膜の形成方法及びp形半導体素子の製造方法
TW495887B (en) * 1999-11-15 2002-07-21 Hitachi Ltd Semiconductor device and manufacturing method of the same
JP2001156077A (ja) * 1999-11-26 2001-06-08 Nec Corp 半導体装置の製造方法
JP2003203867A (ja) * 2001-12-28 2003-07-18 Shin Etsu Handotai Co Ltd 気相成長方法及び気相成長装置
US6911391B2 (en) 2002-01-26 2005-06-28 Applied Materials, Inc. Integration of titanium and titanium nitride layers
JP4016419B2 (ja) * 2002-08-23 2007-12-05 Jsr株式会社 シリコン膜形成用組成物およびシリコン膜の形成方法
KR100476482B1 (ko) 2002-12-14 2005-03-21 동부전자 주식회사 반도체 소자의 장벽 금속층 형성 방법
KR100477816B1 (ko) 2002-12-30 2005-03-22 주식회사 하이닉스반도체 반도체 소자의 티타늄 실리사이드 콘택 형성 방법
KR100538806B1 (ko) * 2003-02-21 2005-12-26 주식회사 하이닉스반도체 에피택셜 c49상의 티타늄실리사이드막을 갖는 반도체소자 및 그 제조 방법
US8536492B2 (en) * 2003-10-27 2013-09-17 Applied Materials, Inc. Processing multilayer semiconductors with multiple heat sources
KR100578221B1 (ko) * 2004-05-06 2006-05-12 주식회사 하이닉스반도체 확산방지막을 구비하는 반도체소자의 제조 방법
JP4974815B2 (ja) * 2006-10-04 2012-07-11 東京エレクトロン株式会社 薄膜形成装置の洗浄方法、薄膜形成方法及び薄膜形成装置
CN101285189B (zh) * 2007-04-12 2010-05-19 上海宏力半导体制造有限公司 减少金属刻蚀工艺反应腔室产生沉积物的方法
CN102265400A (zh) * 2008-10-23 2011-11-30 桑迪士克3D有限责任公司 展示减少的分层的基于碳的存储器元件和形成其的方法
JP5492789B2 (ja) 2008-12-12 2014-05-14 東京エレクトロン株式会社 成膜方法および成膜装置
JP5872904B2 (ja) 2012-01-05 2016-03-01 東京エレクトロン株式会社 TiN膜の成膜方法および記憶媒体
JP6153401B2 (ja) * 2013-07-02 2017-06-28 株式会社ニューフレアテクノロジー 気相成長装置および気相成長方法
KR102403706B1 (ko) * 2013-09-27 2022-05-30 어플라이드 머티어리얼스, 인코포레이티드 심리스 코발트 갭-충전을 가능하게 하는 방법
JP2017022302A (ja) * 2015-07-14 2017-01-26 ルネサスエレクトロニクス株式会社 半導体装置の製造方法および半導体装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000299295A (ja) 1999-04-15 2000-10-24 Nec Corp 半導体装置の製造方法
JP2004158828A (ja) 2002-10-17 2004-06-03 Tokyo Electron Ltd 成膜方法
JP2011100962A (ja) 2009-10-09 2011-05-19 Tokyo Electron Ltd 成膜方法及びプラズマ処理装置
JP2015510547A (ja) 2012-01-27 2015-04-09 東京エレクトロン株式会社 コンフォーマル金属ケイ化物フィルムを形成する方法
JP2015124397A (ja) 2013-12-25 2015-07-06 東京エレクトロン株式会社 コンタクト層の形成方法

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