KR102473315B1 - 전자부품 테스트용 핸들러의 가압장치 - Google Patents

전자부품 테스트용 핸들러의 가압장치 Download PDF

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Publication number
KR102473315B1
KR102473315B1 KR1020160019708A KR20160019708A KR102473315B1 KR 102473315 B1 KR102473315 B1 KR 102473315B1 KR 1020160019708 A KR1020160019708 A KR 1020160019708A KR 20160019708 A KR20160019708 A KR 20160019708A KR 102473315 B1 KR102473315 B1 KR 102473315B1
Authority
KR
South Korea
Prior art keywords
pressure plate
tester
electronic component
driving source
handler
Prior art date
Application number
KR1020160019708A
Other languages
English (en)
Korean (ko)
Other versions
KR20170097960A (ko
Inventor
나윤성
노종기
김동일
Original Assignee
(주)테크윙
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by (주)테크윙 filed Critical (주)테크윙
Priority to KR1020160019708A priority Critical patent/KR102473315B1/ko
Priority to TW106104218A priority patent/TWI624675B/zh
Priority to CN201710084862.0A priority patent/CN107096731B/zh
Publication of KR20170097960A publication Critical patent/KR20170097960A/ko
Application granted granted Critical
Publication of KR102473315B1 publication Critical patent/KR102473315B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C2301/00—Sorting according to destination
    • B07C2301/0008—Electronic Devices, e.g. keyboard, displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020160019708A 2016-02-19 2016-02-19 전자부품 테스트용 핸들러의 가압장치 KR102473315B1 (ko)

Priority Applications (3)

Application Number Priority Date Filing Date Title
KR1020160019708A KR102473315B1 (ko) 2016-02-19 2016-02-19 전자부품 테스트용 핸들러의 가압장치
TW106104218A TWI624675B (zh) 2016-02-19 2017-02-09 用於測試電子部件的分選機的加壓裝置
CN201710084862.0A CN107096731B (zh) 2016-02-19 2017-02-16 用于测试电子部件的分选机的加压装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020160019708A KR102473315B1 (ko) 2016-02-19 2016-02-19 전자부품 테스트용 핸들러의 가압장치

Publications (2)

Publication Number Publication Date
KR20170097960A KR20170097960A (ko) 2017-08-29
KR102473315B1 true KR102473315B1 (ko) 2022-12-02

Family

ID=59674797

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020160019708A KR102473315B1 (ko) 2016-02-19 2016-02-19 전자부품 테스트용 핸들러의 가압장치

Country Status (3)

Country Link
KR (1) KR102473315B1 (zh)
CN (1) CN107096731B (zh)
TW (1) TWI624675B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102432981B1 (ko) * 2017-11-03 2022-08-18 (주)테크윙 전자부품의 테스트를 지원하는 핸들러용 픽킹장치
KR20200071357A (ko) * 2018-12-11 2020-06-19 (주)테크윙 전자부품 테스트용 핸들러
KR20230060187A (ko) * 2021-10-27 2023-05-04 (주)테크윙 전자부품 핸들러용 거치기

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101512357A (zh) 2006-09-15 2009-08-19 株式会社爱德万测试 电子元件测试装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1752778A3 (en) * 2005-08-09 2008-10-29 Mirae Corporation IC Sorter
US8496113B2 (en) * 2007-04-13 2013-07-30 Techwing Co., Ltd. Insert for carrier board of test handler
KR100993196B1 (ko) * 2007-10-31 2010-11-10 (주)테크윙 테스트핸들러의 캐리어보드 순환방법 및 테스트핸들러
CN201522544U (zh) * 2009-06-09 2010-07-07 常熟阿特斯阳光电力科技有限公司 一种用于接线盒内二极管的检测装置
KR101104413B1 (ko) * 2009-09-25 2012-01-16 세크론 주식회사 반도체 소자 테스트용 접속 장치 및 이를 포함하는 테스트 핸들러
JP5152379B2 (ja) * 2011-09-14 2013-02-27 セイコーエプソン株式会社 位置決め装置のメンテナンス方法及びｉｃハンドラの位置決め装置
KR101559416B1 (ko) * 2011-10-31 2015-10-13 (주)테크윙 테스트핸들러용 푸싱장치
KR102010275B1 (ko) * 2013-04-03 2019-08-13 (주)테크윙 반도체소자 테스트용 핸들러
KR102102830B1 (ko) * 2014-04-10 2020-04-23 (주)테크윙 테스트핸들러, 테스트핸들러용 푸싱장치 및 테스트트레이, 테스터용 인터페이스보드
CN105259413B (zh) * 2015-11-02 2018-01-05 天津卡锐智科技发展有限公司 手机微型电阻自动测试机

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101512357A (zh) 2006-09-15 2009-08-19 株式会社爱德万测试 电子元件测试装置

Also Published As

Publication number Publication date
CN107096731B (zh) 2019-07-19
CN107096731A (zh) 2017-08-29
KR20170097960A (ko) 2017-08-29
TW201732308A (zh) 2017-09-16
TWI624675B (zh) 2018-05-21

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