KR102402214B1 - 워크피스를 클램핑하는 시스템 및 방법 - Google Patents
워크피스를 클램핑하는 시스템 및 방법 Download PDFInfo
- Publication number
- KR102402214B1 KR102402214B1 KR1020167024703A KR20167024703A KR102402214B1 KR 102402214 B1 KR102402214 B1 KR 102402214B1 KR 1020167024703 A KR1020167024703 A KR 1020167024703A KR 20167024703 A KR20167024703 A KR 20167024703A KR 102402214 B1 KR102402214 B1 KR 102402214B1
- Authority
- KR
- South Korea
- Prior art keywords
- workpiece
- platen
- hiv
- buried
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
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- H01L21/6833—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/72—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using electrostatic chucks
- H10P72/722—Details of electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G7/00—Capacitors in which the capacitance is varied by non-mechanical means; Processes of their manufacture
- H01G7/02—Electrets, i.e. having a permanently-polarised dielectric
-
- H01L21/6831—
-
- H01L21/6835—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/72—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using electrostatic chucks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
-
- H01L2924/3011—
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Jigs For Machine Tools (AREA)
- Machine Tool Sensing Apparatuses (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201461937050P | 2014-02-07 | 2014-02-07 | |
| US61/937,050 | 2014-02-07 | ||
| PCT/US2015/015078 WO2015120419A1 (en) | 2014-02-07 | 2015-02-09 | System and method for clamping a work piece |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20160118347A KR20160118347A (ko) | 2016-10-11 |
| KR102402214B1 true KR102402214B1 (ko) | 2022-05-26 |
Family
ID=53778527
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020167024703A Active KR102402214B1 (ko) | 2014-02-07 | 2015-02-09 | 워크피스를 클램핑하는 시스템 및 방법 |
Country Status (12)
| Country | Link |
|---|---|
| US (1) | US11282732B2 (https=) |
| EP (1) | EP3103127B1 (https=) |
| JP (1) | JP2017512378A (https=) |
| KR (1) | KR102402214B1 (https=) |
| CN (1) | CN106165039B (https=) |
| DE (1) | DE112015000700T5 (https=) |
| GB (1) | GB2540883B (https=) |
| HK (1) | HK1231629A1 (https=) |
| MY (1) | MY174723A (https=) |
| PH (1) | PH12016501425B1 (https=) |
| SG (1) | SG11201605836SA (https=) |
| WO (1) | WO2015120419A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL2022780A (en) * | 2018-04-12 | 2019-10-22 | Asml Netherlands Bv | Apparatus and method |
| US11073544B2 (en) | 2019-05-23 | 2021-07-27 | Advanced Energy Industries, Inc. | System and method to measure and adjust a charge of a workpiece |
| US12523690B2 (en) | 2021-03-17 | 2026-01-13 | Advanced Energy Industries, Inc. | Capacitance sensing systems and methods |
| US11610800B2 (en) * | 2021-03-22 | 2023-03-21 | Applied Materials, Inc. | Capacitive method of detecting wafer chucking and de-chucking |
| US11817340B2 (en) | 2021-04-28 | 2023-11-14 | Advanced Energy Industries, Inc. | System and method for improved electrostatic chuck clamping performance |
| KR102897148B1 (ko) * | 2024-06-04 | 2025-12-09 | 주식회사 이에스티 | 커패시턴스 측정 기능을 갖는 정전척 컨트롤러 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5261852B2 (ja) * | 2006-09-12 | 2013-08-14 | 独立行政法人産業技術総合研究所 | 分布量計測方法およびそのための分布量センサを用いた計測システム |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0491810A1 (en) | 1989-09-22 | 1992-07-01 | Blanchard Marketing Services Limited | Sensing method and device for aggregation control |
| JP2886934B2 (ja) | 1990-03-10 | 1999-04-26 | 株式会社クラレ | ジヒドロフラン系化合物の製造方法 |
| US5452177A (en) | 1990-06-08 | 1995-09-19 | Varian Associates, Inc. | Electrostatic wafer clamp |
| JPH04162443A (ja) | 1990-10-24 | 1992-06-05 | Japan Synthetic Rubber Co Ltd | 静電チャック装置 |
| JPH05299354A (ja) * | 1992-04-21 | 1993-11-12 | Kokusai Electric Co Ltd | プラズマ処理装置のウェーハ保持装置 |
| US5436790A (en) | 1993-01-15 | 1995-07-25 | Eaton Corporation | Wafer sensing and clamping monitor |
| JPH0786384A (ja) * | 1993-09-17 | 1995-03-31 | Sumitomo Metal Ind Ltd | 試料台、該試料台のモニタリングシステム及び半導体製造装置 |
| US5563798A (en) | 1994-04-05 | 1996-10-08 | Applied Materials, Inc. | Wafer positioning system |
| JP2976861B2 (ja) | 1994-09-30 | 1999-11-10 | 日本電気株式会社 | 静電チャック及びその製造方法 |
| KR960012283A (ko) * | 1994-09-30 | 1996-04-20 | 가네꼬 히사시 | 정전척 및 그 제조방법 |
| JP3847363B2 (ja) | 1996-02-02 | 2006-11-22 | 富士通株式会社 | 半導体ウェハ処理装置及び半導体ウェハ処理方法 |
| US5708250A (en) * | 1996-03-29 | 1998-01-13 | Lam Resarch Corporation | Voltage controller for electrostatic chuck of vacuum plasma processors |
| US5858099A (en) * | 1996-04-09 | 1999-01-12 | Sarnoff Corporation | Electrostatic chucks and a particle deposition apparatus therefor |
| CN1224544A (zh) * | 1996-04-09 | 1999-07-28 | 德尔西斯药品公司 | 静电吸盘 |
| US5793192A (en) | 1996-06-28 | 1998-08-11 | Lam Research Corporation | Methods and apparatuses for clamping and declamping a semiconductor wafer in a wafer processing system |
| US6075375A (en) | 1997-06-11 | 2000-06-13 | Applied Materials, Inc. | Apparatus for wafer detection |
| JPH1167885A (ja) | 1997-08-25 | 1999-03-09 | Nissin Electric Co Ltd | 基板保持装置 |
| US6198616B1 (en) | 1998-04-03 | 2001-03-06 | Applied Materials, Inc. | Method and apparatus for supplying a chucking voltage to an electrostatic chuck within a semiconductor wafer processing system |
| JP3058615B2 (ja) | 1998-04-10 | 2000-07-04 | 株式会社山武 | ウエハ検出装置 |
| JP3323135B2 (ja) | 1998-08-31 | 2002-09-09 | 京セラ株式会社 | 静電チャック |
| US6965506B2 (en) | 1998-09-30 | 2005-11-15 | Lam Research Corporation | System and method for dechucking a workpiece from an electrostatic chuck |
| US6267839B1 (en) * | 1999-01-12 | 2001-07-31 | Applied Materials, Inc. | Electrostatic chuck with improved RF power distribution |
| US6741446B2 (en) | 2001-03-30 | 2004-05-25 | Lam Research Corporation | Vacuum plasma processor and method of operating same |
| JP2002305237A (ja) * | 2001-04-05 | 2002-10-18 | Hitachi Ltd | 半導体製造方法および製造装置 |
| AU2003266610A1 (en) | 2002-09-27 | 2004-04-19 | Tsukuba Seiko Ltd. | Electrostatic holding device and electrostatic tweezers using same |
| US7072166B2 (en) | 2003-09-12 | 2006-07-04 | Axcelis Technologies, Inc. | Clamping and de-clamping semiconductor wafers on a J-R electrostatic chuck having a micromachined surface by using force delay in applying a single-phase square wave AC clamping voltage |
| KR20050056757A (ko) * | 2003-12-10 | 2005-06-16 | 삼성전자주식회사 | 이온화 공정 챔버 |
| JP4641290B2 (ja) | 2006-07-31 | 2011-03-02 | 富士通テン株式会社 | 運転情報記録装置 |
| JP2008047564A (ja) * | 2006-08-10 | 2008-02-28 | Tokyo Electron Ltd | 真空処理装置、静電チャックの診断方法及び記憶媒体 |
| US7813103B2 (en) * | 2007-10-11 | 2010-10-12 | Applied Materials, Inc. | Time-based wafer de-chucking from an electrostatic chuck having separate RF BIAS and DC chucking electrodes |
| KR20090068055A (ko) | 2007-12-22 | 2009-06-25 | 주식회사 동부하이텍 | 반도체 제조장비의 바이폴라형 정전척 |
| CN101872733B (zh) * | 2009-04-24 | 2012-06-27 | 中微半导体设备(上海)有限公司 | 感测和移除被加工半导体工艺件的残余电荷的系统和方法 |
| JP5399791B2 (ja) | 2009-06-30 | 2014-01-29 | コバレントマテリアル株式会社 | 静電チャック |
| US8514544B2 (en) * | 2009-08-07 | 2013-08-20 | Trek, Inc. | Electrostatic clamp optimizer |
| JP5358364B2 (ja) | 2009-09-11 | 2013-12-04 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
-
2015
- 2015-02-09 SG SG11201605836SA patent/SG11201605836SA/en unknown
- 2015-02-09 GB GB1613425.6A patent/GB2540883B/en active Active
- 2015-02-09 JP JP2016550747A patent/JP2017512378A/ja active Pending
- 2015-02-09 US US15/323,920 patent/US11282732B2/en active Active
- 2015-02-09 KR KR1020167024703A patent/KR102402214B1/ko active Active
- 2015-02-09 MY MYPI2016702574A patent/MY174723A/en unknown
- 2015-02-09 WO PCT/US2015/015078 patent/WO2015120419A1/en not_active Ceased
- 2015-02-09 HK HK17105201.5A patent/HK1231629A1/zh unknown
- 2015-02-09 EP EP15746323.3A patent/EP3103127B1/en active Active
- 2015-02-09 CN CN201580007757.6A patent/CN106165039B/zh active Active
- 2015-02-09 DE DE112015000700.8T patent/DE112015000700T5/de not_active Ceased
-
2016
- 2016-07-19 PH PH12016501425A patent/PH12016501425B1/en unknown
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5261852B2 (ja) * | 2006-09-12 | 2013-08-14 | 独立行政法人産業技術総合研究所 | 分布量計測方法およびそのための分布量センサを用いた計測システム |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3103127B1 (en) | 2021-03-24 |
| SG11201605836SA (en) | 2016-08-30 |
| US20170162415A1 (en) | 2017-06-08 |
| DE112015000700T5 (de) | 2016-11-24 |
| GB2540883A (en) | 2017-02-01 |
| GB2540883B (en) | 2018-12-26 |
| KR20160118347A (ko) | 2016-10-11 |
| EP3103127A4 (en) | 2017-06-28 |
| EP3103127A1 (en) | 2016-12-14 |
| GB201613425D0 (en) | 2017-01-04 |
| WO2015120419A1 (en) | 2015-08-13 |
| US11282732B2 (en) | 2022-03-22 |
| HK1231629A1 (zh) | 2017-12-22 |
| CN106165039A (zh) | 2016-11-23 |
| PH12016501425B1 (en) | 2020-01-31 |
| MY174723A (en) | 2020-05-10 |
| PH12016501425A1 (en) | 2017-02-06 |
| CN106165039B (zh) | 2019-06-07 |
| JP2017512378A (ja) | 2017-05-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| PA0201 | Request for examination |
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| T11-X000 | Administrative time limit extension requested |
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| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
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| P13-X000 | Application amended |
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| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
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| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
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| PR1002 | Payment of registration fee |
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| PG1601 | Publication of registration |
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| P22-X000 | Classification modified |
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